Heterodyne interferometer

• US 4,834,111 A
• Filed: 01/12/1987
• Issued: 05/30/1989
• Est. Priority Date: 01/12/1987
• Status: Expired due to Fees

• Current Assignee: Trustees Of Columbia University In The City Of New York (Columbia University)
• Original Assignee: Trustees Of Columbia University In The City Of New York (Columbia University)
• Inventors: Willemin, J. F., Khanna, S. M., Dandliker, R.
• Primary Examiner(s): HINDENBURG, MAX F
• Application Number:
  US07/002,149
• Time in Patent Office: 869 Days
• Field of Search: 128/774, 128/782, 73/655, 73/657, 356/350, 356/351, 356/357
• US Class Current: 600/587
• CPC Class Codes: A61B 5/1126 using a particular sensing technique
• CPC Class Codes: G01H 9/00 Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means

Abstract

This invention concerns a heterodyne interferometer for measuring the amplitude of vibration of a vibrating object. The invention is particularly useful for measuring the amplitude of vibrations of objects having reflectivities below about 0.02% or for measuring vibrations amplitudes below about 10^-17 cm.

The invention comprises a laser and a beam splitter for producing an object light wave and a reference light wave; at least one modulator for changing the frequencies of the object light wave and the reference light wave thereby producing a predetermined offset; means for directing the object light wave onto the vibrating object; and a photodetector for producing, at a frequency equal to the predetrmined offset, a beat signal which varies according to variations in the interference resulting from combining the reflected object light wave and the reference light wave.

Claims

1. A heterodyne interferometer for measuring the amplitude of vibration of a vibrating object which comprises:

(a) a laser for emitting a monochromatic light wave;

(b) a beam splitter for splitting the light wave into an object light wave and a reference light wave, each having the same frequency;

(c) a modulator for changing the frequency of the object light wave and the reference light wave so as to produce a predetermined offset between the frequency of the object light wave and the frequency of the reference light wave, said modulator being so positioned with respect to the beam splitter that the object light wave and the reference light wave pass through the modulator thereby changing their frequencies;

(d) means for directing the object light wave onto the vibrating object, said means so positioned between the object and the modulator that at least a portion of the object light wave is directed onto and reflected off of the object;

(e) a photodetector for producing, at a frequency equal to the predetermined offset, a beat signal varying in accordance with variations in the interference resulting from combining at least a portion of the reflected object light wave and the reference light wave wherein the power of the reference light wave is greater than the power of the portion of the reflected object light wave, the photodetector being so positioned with respect to the object and the beam splitter that it detects and measures the interference; and

(f) means for processing the beat signal to measure variations in its phase or amplitude, said means being electrically connected to the photodetector in order to receive the beat signal.

2. The interferometer of claim 1, wherein the modulator comprises a first modulator on the object light wave and a second modulator on the reference light wave.

3. An interferometer of claim 2, wherein the first modulator and the second modulator each comprises an acousto-optical modulator.

4. An interferometer of claim 3, wherein the two modulators are driven by predetermined frequencies which differ by the predetermined offset.

5. An interferometer of claim 1, wherein the modulator comprises an acousto-optical modulator.

6. An interferometer of claim 1, wherein the means of directing the object light wave onto the object comprises an optical instrument.

7. An interferometer of claim 1, wherein the photodetector comprises a PN junction photodiode.

8. An interferometer of claim 7, wherein the photodiode is a silicon photodiode.

9. An interferometer of claim 1, wherein the photodetector comprises a photomultiplier tube.

10. An interferometer of claim 1, wherein the photodetector comprises a photoconductive device.

11. An interferometer of claim 1, wherein the means of processing the beat signal comprises a phase tracking system.

12. An interferometer of claim 1, wherein the means of processing the beat signal comprises a frequency demodulator.

13. An interferometer of claim 12, wherein the demodulator is an FM-demodulator.

14. An interferometer of claim 13, wherein the FM-demodulator comprises an FM-receiver.