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Programmable apparatus and method for testing computer peripherals

  • US 4,837,764 A
  • Filed: 03/26/1987
  • Issued: 06/06/1989
  • Est. Priority Date: 03/26/1987
  • Status: Expired due to Fees
First Claim
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1. Apparatus for conducting testing of the condition of computer peripherals, said apparatus being portable and enclosed in a housing and comprising:

  • (a) a microprocessor for controlling the testing of said peripherals by sending excitation signals to said peripherals in accordance with a test protocol and receiving response signals therefrom;

    (b) nonvolatile memory means having stored therein an operating system routine for said microprocessor;

    (c) at least one working memory means for said microprocessor, said working memory means for storing an instruction set defining said test protocol for said microprocessor;

    (d) at least one peripheral connector means for operatively connecting said apparatus with a peripheral to be tested in accordance with said protocol, said peripheral connector means connecting said microprocessor to said peripheral to enable said microprocessor to send said excitation signals in accordance with said protocol and receive said response signals;

    (e) at least one data source connector means for operatively connecting an external data source to said apparatus, said external data source being distinct from said apparatus;

    (f) a keyboard, mounted in said housing and accessible to a user, being operatively connected to said microprocessor for receiving user commands for controlling the operation of said microprocessor and sending said user commands to said microprocessor;

    (g) a display mounted in said housing for providing an indication to the user of the status of the protocol and the condition of the peripheral; and

    (h) a debugger routine stored in said nonvolatile memory means and accessible by the user through the keyboard, said debugger routine for responding to user commands input through the keyboard to instruct the mircoprocessor to modify said instruction set in working memory as defined by data input from said external data source and test said peripheral in accordance with a modified protocol set forth in a modified instruction set;

    whereby said external data source can provide a modified protocol for testing said peripheral.

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