Test system and method using artificial intelligence control

• US 4,841,456 A
• Filed: 09/09/1986
• Issued: 06/20/1989
• Est. Priority Date: 09/09/1986
• Status: Expired due to Fees

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Anderson, Donald R., Kersh, Douglas W., Kasprick, Jon J., Hogan, Thomas J. Jr.
• Primary Examiner(s): Lall, P. S.
• Assistant Examiner(s): Black, Thomas G.
• Application Number:
  US06/906,104
• Time in Patent Office: 1,015 Days
• Field of Search: 364/550, 364/551, 364/513, 364/200 MS File, 364/900 MS File, 364/300, 324/73 AT, 324/73 R, 324/73 PC, 371/15, 371/20, 371/25, 371/26
• US Class Current: 702/119
• CPC Class Codes: G01R 31/31903 tester configuration
• CPC Class Codes: G06F 11/2257 using expert systems
• CPC Class Codes: G06F 2201/865 Monitoring of software
• CPC Class Codes: Y10S 706/916 Electronic or computer, internal or network, circuit

Abstract

A testing arrangement in which an AI system is interfaced directly to an automatic test system (ATS) such that from the point of view of the ATS, the actions of the AI system are indistinguishable from the actions of an intelligent human operator. A testing apparatus comprises an automatic test system, communication means, and an AI system. The automatic test system comprises an automatic test equipment (ATE) controller, at least one test instrument connectable to the ATE controller and to the unit under test (UUT), and storage means for storing a functional test procedure (FTP) for the UUT. The ATE controller includes an I/O port and ATE data processing means for executing the FTP in response to a start FTP command, and for providing an FTP data set at the I/O port. The FTP data set comprises data indicating the results obtained by executing the FTP. The communication means is connected to the I/O port. The AI system comprises an AI data processor having an I/O port through which the AI data processor is connected to the communication means. The AI system also comprises means for receiving the FTP data set via its I/O port, and expert system means for processing the FTP data set when the FTP data set indicates that a failure has occurred to identify, if possible, the defective UUT portion that may have caused the failure. The expert system means also includes means for producing output data identifying the defective UUT portion. The automatic test system may also comprise a diagnostic test procedure (DTP) for the UUT which may run in response to a DTP request provided by the expert system means when the expert system means determines that further testing should be performed.

Claims

1. An apparatus for testing an electronic unit under test (UUT), comprising:

(a) an automatic test system comprising an automatic test equipment (ATE) controller, at least one test instrument connectable to the ATE controller and to the UUT, and storage means for storing a functional test procedure (FTP) for the UUT, the ATE controller including an ATE port, and ATE data processing means for executing the FTP in response to a start FTP command and for providing an FTP data set at the ATE port, the FTP data set comprising data indicating the results obtained by executing the FTP;

(b) communication means connected to the ATE port; and

(c) an artificial intelligence (AI) system comprising an AI data processor having an AI port through which the AI data processor is connected to the communication means, means for receiving the FTP data set via the AI port, and expert system means for processing the FTP data set when the FTP data set indicates that a failure has occurred to identify, if possible, the defective UUT portion that may have caused the failure, and for producing output data that identifies the defective UUT portion.

2. The apparatus of claim 1, wherein the expert system means includes means for producing output data indicating that further testing should be performed.

3. The apparatus of claim 2, wherein the storage means of the automatic test system further stores a diagnostic test procedure (DTP) for the UUT, wherein the ATE data processing means executes the DTP in reponse to a start DTP command and provides a DTP data set at the ATE port, the DTP data set comprising data indicating the results obtained by executing the DTP, wherein the AI data processor includes means for receiving the DTP data set via the AI port, and wherein the expert system means includes means for processing the DTP port set when the DTP data set indicates that a failure has occurred to identify, if possible, the defective UUT portion that may have caused the failure, and for producing output data that indentifies the defective UUT portion.

4. The apparatus of claim 3, wherein the expert system means comprises means for producing a DTP request message indicating that the DTP should be executed, and wherein the AI data processor includes means reponsive to the DTP request message for issuing the start DTP command at that AI port, and wherein the ATE data processing means includes means for receiving the start DTP command at the ATE port.

5. A method of testing an electronic unit under test (UUT) comprising the steps of:

(a) connecting the UUT to a testing apparatus comprising an automatic test system connected via communication means to an artificial intelligence (AI) system, the automatic system comprising an automatic test equipment (ATE) controller, at least one test instrument connectable to the ATE controller and to the UUT, and storage means for storing a functional test procedure (FTP) for the UUT, the AI system comprising an AI data processor and expert system means;

(b) causing the ATE controller to execute the FTP, such that the ATE controller produces an FTP data set;

(c) transmitting the FTP dat set to the AI system via the communication means; and

(d) causing the expert system to process the FTP data set when the FTP data set indicates that a failure has occurred to identify, if possible, the defective UUT portion that may have caused the failure.