Scanning differential phase contrast microscope

• US 4,845,352 A
• Filed: 12/08/1987
• Issued: 07/04/1989
• Est. Priority Date: 12/08/1986
• Status: Expired due to Fees

• Current Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Benschop, Jozef P. H.
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Oen, William L.
• Application Number:
  US07/130,363
• Time in Patent Office: 574 Days
• Field of Search: 250/201 DF, 250/201 R, 250/216, 369/44, 369/45, 369/46, 350/507
• US Class Current: 250/201.7
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 21/14 affording illumination for phase-contrast observation
• CPC Class Codes: G02B 27/283 used for beam splitting or combining

Abstract

An objective system (20) focusses the radiation from a radiation source (10) to a diffraction-limited spot (A) which is imaged on two point detectors (61, 62) by an imaging system (40) and a beam divider (60). By using this confocal principle, a differential phase contrast microscope is obtained having a low sensitivity to details which are out of focus, an increased resolution in the object plane and little crosstalk between the two detectors.

Claims

1. A scanning microscope for observing an object placed in an object plane, comprising a coherent radiation source, an objective system for focussing radiation emitted by the radiation source to a radiation spot in the object plane and a radiation-sensitive detection system comprising two radiation detectors which are arranged in such a way that radiation from the two discrete halves of the radiation beam originating from the radiation spot is detected by different respective detectors, characterized in that the detectors are point detectors separated from each other, in that a beam divider is arranged in the radiation path from the object plane to the radiation detectors and in that an imaging system with which the object plane is imaged on the detector is arranged between the object plane and each detector.

2. A microscope as claimed in claim 1, characterized in that the beam divider is constituted by a double optical wedge.

3. A microscope as claimed in claim 1, in which the radiation reflected by the object is detected, characterized in that a beam splitter is arranged in the radiation path from the radiation source to the object plane.

4. A microscope as claimed in claim 3, characterized in that the radiation source is suitable for emitting a linearly polarized beam, in that the beam splitter is a polarization-sensitive beam splitter and in that a λ

/4 plate is arranged between the beam splitter and the object plane, in which λ

is the wavelength of the radiation used.

5. A microscope as claimed in claim 3, characterized in that the objective system and the imaging system have at least one optical element in common.

6. A microscope as claimed in claim 3, characterized in that beam-deflecting means are arranged between the beam splitter and the object plane.

7. A microscope as in claim 1 wherein each point detector comprises a pin hole diaphragm and a radiation sensitive element.