Apparatus for generating and transporting a charged particle beam

• US 4,845,371 A
• Filed: 03/29/1988
• Issued: 07/04/1989
• Est. Priority Date: 03/29/1988
• Status: Expired due to Term

• Current Assignee: Siemens Medical Laboratories, Inc.
• Original Assignee: Siemens Medical Laboratories, Inc.
• Inventors: Stieber, Volker
• Primary Examiner(s): Anderson, Bruce C.
• Application Number:
  US07/174,575
• Time in Patent Office: 462 Days
• Field of Search: 250/396 R, 250/396 ML, 250/492.3, 250/505.1, 378/65, 378/137, 378/138, 378/12
• US Class Current: 250/505.1
• CPC Class Codes: G21K 1/02 using diaphragms, collimators
• CPC Class Codes: G21K 1/10 Scattering devices; Absorbing devices; Ionising radiation filters

Abstract

An apparatus for generating and transporting a charged particle beam. The apparatus has a source which generates the charged particle beam at two current levels, and a magnet system for bending the beam. Particles of different energies are bent along different paths, whereby at a specific height within the magnet system the radial displacement from the beam axis is a monotone function of the difference between the energy and the nominal energy. At this height there is provided an energy selection filter having at least one bimetallic element. This element projects into the beam and, thus, intercepts beam particles; it is designed such that its interception distance decreases with increasing beam current. As a result, the energy range of particles passing the filter is broader at the higher current level broader than at the lower current level.

Claims

1. An apparatus for generating and transporting a beam of charged particles, comprising:

(a) a beam source for generating said beam of charged particles at two different current levels, said charged particles being energetically dispersed around a preset energy value;

(b) a magnet system for transporting said beam of charged particles through a passageway, said charged particles being spatially dispersed around a beam axis such that along a selected direction in a specific plane across the beam axis the spatial dispersion of said charged particles is at least approximately a monotone function of their energy dispersion; and

(c) an energy selection filter disposed in said specific plane within the passageway, said filter including a first bimetallic element projecting along said selected direction into the beam by a given interception distance which defines the energy range of the charged particles passing the electron selection filter, said bimetallic element being adapted such that at the lower of the two different current levels the interception distance is longer and thereby said energy range smaller than at the higher of the two current levels.

2. An apparatus according to claim 1, wherein the energy selection filter includes a second bimetallic element, the first and second bimetallic elements forming a first pair of bimetallic elements projecting from opposite sides into the beam.

3. An apparatus according to claim 1, wherein the bimetallic element is formed as a tongue.

4. An apparatus according to claim 1, wherein the bimetallic element is formed as a bellows and part of the passageway.

5. An apparatus according to claim 1, wherein a third bimetallic element is disposed downstream of the first bimetallic element, said third bimetallic element projecting from the same side into the beam by a given intercepting distance which is longer than the intercepting distance of the first bimetallic element.

6. An apparatus according to claim 5, including third and fourth bimetallic elements which form a second pair of bimetallic elements projecting from opposite sides into the beam, each bimetallic element of the second pair being disposed downstream behind one of the bimetallic elements of the first pair and projecting into the beam by a given intercepting distance which is longer than the intercepting distance of the bimetallic element upstream in front of it.

7. An apparatus according to claim 1, including a metallic plate disposed upstream of the first bimetallic element and projecting from the same side into a beam by a given intercepting distance which is shorter than the intercepting distance of the first bimetallic element.

8. An apparatus according to claim 2, including first and second metallic plates disposed upstream in front of the first and second bimetallic elements, respectively, each metallic plate projecting into the beam by a given intercepting distance which is shorter than the intercepting distance of the bimetallic element downstream behind it.

9. An apparatus according to claim 1, wherein the bimetallic element is cooled by a cooling liquid.

10. An apparatus according to claim 1, wherein the energy range of the beam particles passing the energy selection filter is at the lower current level by at least a factor 5 smaller than at the higher current level.

11. An apparatus according to claim 10, wherein said energy range has a width of up to E₀ ±

2%, E₀ being the preset energy value, at the lower current level.

12. An apparatus according to claim 1, wherein the beam of charged particles is a pulsed electron beam, the magnetic system bends said beam by 270°

in a bending plane, the current at the higher and lower of said two different current levels ranges between 50 and 150 mA and 0.5 and 3 mA, respectively, the preset energy value ranges between 5 and 20 MeV, and the the pulsed electron beam has a duty cycle between 1;

500 and 1;

2,000.

13. An apparatus for generating and transporting an electron beam, comprising:

(a) a beam source for generating said electron beam at two different current levels;

(b) a magnet system for bending said electron beam by 270°

in a bending plane, said magnet system having a plane of symmetry being perpendicular to the bending plane; and

(c) an energy selection filter disposed in said plane of symmetry, said filter including a bimetallic element projecting into the electron beam by a given interception distance, said bimetallic element being adapted such that at the lower of the two different current levels the interception distance is longer than at the higher of the two current levels.