System for diagnosing defects in electronic assemblies

• US 4,847,795 A
• Filed: 08/24/1987
• Issued: 07/11/1989
• Est. Priority Date: 08/24/1987
• Status: Expired due to Term

• Current Assignee: Raytheon Company (Rtx Corporation)
• Original Assignee: Hughes Aircraft Company (Rtx Corporation)
• Inventors: Baker, John R., Cornia, Paul B., Spencer, Timothy T.
• Primary Examiner(s): Lall, Parshotam S.
• Assistant Examiner(s): Black, Thomas G.
• Application Number:
  US07/088,454
• Time in Patent Office: 687 Days
• Field of Search: 364/550, 364/551, 364/579, 364/513, 371/20, 371/25, 371/26, 324/73 R, 324/73 AT, 324/73 PC
• US Class Current: 702/184
• CPC Class Codes: G06F 11/076 by exceeding a count or rate limit, e.g. word- or bit count limit
• CPC Class Codes: G06F 11/181 Eliminating the failing redundant component
• CPC Class Codes: G06F 11/183 by voting, the voting not being performed by the redundant components
• CPC Class Codes: G06F 11/2257 using expert systems
• CPC Class Codes: G06F 11/2273 Test methods
• CPC Class Codes: Y10S 706/916 Electronic or computer, internal or network, circuit

Abstract

A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern search section (36) for comparing current test failure data to information stored in the knowledge base (26). A voting section (40) is also provided for generating a recommended repair procedure to eliminate the defect in the electronic assembly (12). Finally, the system (20) further comprises a historical pattern generation section (46) which updates the knowledge base (26) with information regarding whether the recommended repair procedure eliminated the defect.

Claims

1. An apparatus for diagnosing a defect in an electronic assmbly in response to current test failure data, said electronic assembly being divided into functional blocks and comprising a plurality of replaceable subassemblies, said apparatus comprising:

a knowledge base for storing information regarding said electronic assembly, said information comprising prior test failure data from other assemblies similar to said electronic assembly;

means for comparing said current test failure data to information stored in said knowledge base;

means for generating a recommended repair procedure to eliminate said defect in said electronic assembly, said knowledge base generating a wait-pattern containing said recommended repair procedure; and

means for updating said knowledge base with information regarding whether said recommended repair procedure eliminated said defect, said means for updating said knowledge base generating a ready-pattern from said wait-pattern only when said recommended repair procedure eliminates said defect.

2. The apparatus of claim 1, further comprising means for providing information regarding said electronic assembly to said knowledge base from a domain expert.

3. The apparatus of claim 1, further comprising means for generating an output indicative of the degree of confidence associated with said recommended repair procedure, said output being indicative of the probability that implementing said recommended repair procedure will eliminate said defect.

4. The apparatus of claim 1, wherein said knowledge base includes information from a domain expert concerning the functional blocks which comprise said electronic assembly.

5. The apparatus of claim 4, wherein said knowledge base includes information from a domain expert concerning the dependence of said functional blocks with respect to each other.

6. The apparatus of claim 5, wherein said knowledge base includes information from a domain expert concerning the identification of the replaceable subassemblies in each of said functional blocks.

7. The apparatus of claim 1, wherein said knowledge base includes a plurality of ready-patterns, each of said ready-patterns comprising a record of the repair activity undertaken to eliminate a defect in another assembly similar to said electronic assembly.

8. The apparatus of claim 1, wherein said means for comparing said current test failure data to the information stored in said knowledge base determines the overlap of said current test failure data with said prior test failure data.

9. The apparatus of claim 8, wherein said means for comparing said current test failure data to said information stored in said knowledge base compares said current test failure data with prior test failure data having the greatest overlap with said current test failure data.

10. A method for diagnosing a defect in an electronic assembly, said electronic assembly able to be divided into functional blocks and comprising a plurality of replaceable subassemblies, said method comprising the steps of:

(a) providing information regarding said electronic assembly from a domain expert to a knowledge base;

(b) testing said electronic assembly to generate current test failure data;

(c) comparing said current test failure data to information stored in said knowledge base, said information stored in said knowledge base comprising prior test failure data from other assemblies similar to said electronic assembly;

(d) generating a recommended repair procedure to eliminate said defect in said electronic assembly and a wait-pattern containing said recommended repair procedure;

(e) determining whether said recommended repair procedure eliminated said defect in said electronic assembly;

(f) repeating steps (b) through (e) until said defect has been eliminated; and

(g) storing said recommended repair procedures in said knowledge base, said step of storing said recommended repair procedures includes generating a ready-pattern from each of said wait-patterns only when a recommended repair procedure eliminates said defect.

11. The method of claim 10, comprising the additional step of generating an output indicative of the degree of confidence associated with each recommended repair procedure, said output being indicative of the probability that implementing a recommended repair procedure will eliminate said defect.

12. The method of claim 10, wherein said step of providing information from a domain expert comprises the step of providing said knowledge base with information concerning the functional blocks which comprise said electronic assembly.

13. The method of claim 12, wherein said step of providing information from a domain expert comprises the step of providing information to said knowledge base concerning the dependence of said functional blocks with respect to each other.

14. The method of claim 13, wherein said step of providing information from a domain expert comprises the step of providing information to said knowledge base concerning the identification of the replaceable subassemblies in each of said functional blocks.

15. The method of claim 10, wherein said knowledge base includes a plurality of ready-patterns, each of said ready-patterns comprising a record of the repair activity undertaken to eliminate a defect in another assembly similar to said electronic assembly.

16. The method of claim 10, wherein said step of comparing said current test failure data to the information stored in said knowledge base comprises the step of determining the overlap of said current test failure data with said prior test failure data.

17. The method of claim 16, wherein said step of comparing said current test failure data to said information stored in said knowledge base comprises the step of comparing said current test failure data with prior test failure data having the greatest overlap with said current test failure data.

18. A machine implementable method for diagnosing defects in an electronic assembly comprising:

providing information regarding said assembly to a knowledge base from a domain expert;

generating a recommended repair procedure in response to current test failure data from said electronic assembly, said knowledge base generating a wait-pattern containing said recommended repair procedure; and

learning said recommended repair procedure when said recommended repair procedure eliminates said defect, said learning step includes generating a ready-pattern from said wait-pattern only when said recommended repair procedure eliminates said defect.

19. The method of claim 18, comprising the additional step of generating an output indicative of the degree of confidence associated with said recommended repair procedure, said output being indicative of the probability that implementing said recommended repair procedure will eliminate said defect.

20. The method of claim 19, wherein said knowledge base includes information from a domain expert concerning the functional blocks which comprise said electronic assembly.

21. The method of claim 20, wherein said knowledge base includes information from a domain expert concerning the dependence of said functional blocks with respect to each other.

22. The method of claim 21, wherein said knowledge base includes information from a domain expert concerning the identification of the replaceable subassemblies in each of said functional blocks.

23. The method of claim 22, wherein said knowledge base includes a plurality of ready-patterns, each of said ready-patterns comprising a record of the repair activity undertaken to eliminate a defect in another assembly similar to said electronic assembly.

24. The method of claim 23, wherein said step of generating a recommended repair procedure comprises the step of determining the overlap of said current test failure data with the ready-patterns stored in said knowledge base.

25. The method of claim 24, wherein said step of generating a recommended repair procedure comprises the step of comparing said current test failure data with the ready-patterns stored in said knowledge base having the greatest degree of overlap with said current test failure data.

26. A system for diagnosing defects in an electronic assembly from current test failure data comprising:

a modeling subsystem for use in obtaining information regarding said electronic assembly from a domain expert and generating a plurality of ready-patterns in response thereto, said modeling subsystem comprising;

(a) a functional block definition for allowing said domain expert to provide information regarding the functional blocks of said electronic assembly,

(b) a removable subassembly definition section for allowing said domain expert to provide information regarding the removable subassemblies in each of said functional blocks,

(c) a functional test specification section for allowing said domain expert to provide information regarding the test limits which are to be used for determining whether said electronic assembly has a defect,

(d) an expert pattern generation section for allowing said plurality of ready-patterns from the information provided by said domain expert through said functional test definition section, said removable subassembly definition section, and said functional test specification section; and

a data driven subsystem for generating a diagnosis comprising;

(a) a knowledge base for storing said plurality of patterns and generating a wait-pattern upon receipt of said current test failure data,

(b) a pattern search section for ranking the ready-patterns in said knowledge base with said current test failure data in terms of overlap,

(c) a candidate list section for forming a list of ready-patterns having the greatest degree of overlap with the current test failure data,

(d) a voting section for voting on the recommended repair procedure suggested by said ready-patterns in said list,

(e) a confidence determination section for indicating the degree of confidence associated with said recommended repair procedure according to a set of rules,

(f) a confidence determination rule section containing said set of rules used by said confidence determination section to indicate the degree of confidence associated with said recommended repair procedure, and

(g) a historical pattern generation section for generating a ready-pattern from said wait-pattern.