Digital registers with serial accessed mode control bit

• US 4,847,839 A
• Filed: 08/26/1987
• Issued: 07/11/1989
• Est. Priority Date: 08/26/1987
• Status: Expired due to Term

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Kalm, Michael L., Hudson, Charles L. Jr.
• Primary Examiner(s): Atkinson, Charles E.
• Application Number:
  US07/089,381
• Time in Patent Office: 685 Days
• Field of Search: 371/15, 371/25, 324/73 R, 324/73 AT
• US Class Current: 714/732
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

A reconfigurable digital register that can be serially loaded has an additional bit associated with the register which holds information indicative of a mode of operation of the register. The mode control bit is located such that it can be serially loaded along with the other bits. A particularly useful embodiment is to use the mode control bit to configure the register as either a test pattern generator or a signature analysis register in support of integrated circuit self-test functions.

Claims

1. A reconfigurable digital register, comprising:

a plurality of means for retaining an electrical signal indicative of either a first or a second state;

means for serially loading said plurality of means for retaining an electrical signal in response to a first control signal, so that said state is set for each of said plurality of means for retaining an electrical signal; and

an additional means for retaining an electrical signal indicative of either a first or a second state, wherein said additional means for retaining an electrical signal is capable of being serially loaded along with said plurality of means for retaining an electrical signal, and wherein said state of said additional means for retaining an electrical signal is indicative of two different modes of operation of said register.

2. The register of claim 1 wherein said additional means for retaining an electrical signal is proximate one of said plurality of means for retaining an electrical signal.

3. The register of claim 1 further including means for serially unloading said register in response to a second control signal.

4. The register of claim 1 further including means for selectively placing said register in one of said two different modes of operation in response to a second control signal, wherein the state of said additional means for retaining an electrical signal is part of said second control signal and wherein said means for selectively placing said register in one of said two different modes of operation includes one or more access lines for transmitting said second control signal to said plurality of means for retaining an electrical signal.

5. The register of claim 4 further including means for automatically and sequentially generating a plurality of test patterns when said additional means for retaining an electrical signal is in said first state, said generating being in response to said second control signal and wherein said means for automatically and sequentially generating a plurality of test patterns includes test pattern logic means connected to at least one of said plurality of means for retaining an electrical signal.

6. The register of claim 5 further including means for compacting digital data input to said register from a digital logic circuit when said additional means for retaining an electrical signal is in said second state, said compacting being in response to said second control signal.

7. An electronic apparatus for selectively configuring one or more digital registers to facilitate the testing of the response of a digital logic circuit to a plurality of digital test patterns, said digital logic circuit having an input and an output, said apparatus comprising:

first digital register including a first set of bits;

means for serially loading said first set of bits in response to a first control signal; and

means for configuring said first digital register to automatically and sequentially generate said digital test patterns and apply, directly or indirectly, said test patterns individually to at least part of said digital logic circuit input, wherein said means for configuring said first digital register includes access lines to said first set of bits and an additional bit, wherein the state of said additional bit can be set so that when a second control signal is applied to said access lines to said first set of bits, the state of said additional bit will be determined and said test patterns will be generated, and wherein said means for configuring said first digital register also includes means for serially loading said additional bit along with said first set of bits.

8. The device of claim 7 wherein said first digital register includes also means for selectively serially unloading said first digital register.

9. The apparatus of claim 7 further including:

second digital register including a second set of bits;

means for serially loading said second set of bits in response to a third control signal; and

means for configuring said second digital register to sequentially receive, directly or indirectly, a plurality of at least a portion of the outputs of said logic block, wherein said outputs result from the input of said test patterns to said logic block, wherein said means for configuring said second digital register includes access lines to said second set of bits and a further bit, wherein the state of said further bit can be set so that when a fourth control signal is applied to said access lines to said second set of bits, the state of said further bit will be determined and receipt of said outputs will be enabled, and wherein said means for configuring said second digital register further includes means for serially loading said further bit along with said second set of bits.

10. The apparatus of claim 9 wherein said second digital register also includes means for selectively serially unloading said register.

11. The apparatus of claim 9 wherein said second digital register also includes means for selectively compacting said outputs.

12. The apparatus of claim 9 further including:

a serial data path leading into said first digital register, continuing from said first digital register to said second digital register and including at least part of each of said means for configuring said first digital register and said means for configuring said second digital register, and wherein data passing along that portion of said serial data path between said first and said second digital registers does not follow the same route as said test patterns.

13. A reconfigurable digital register, comprising:

a plurality of means for retaining an electrical signal indicative of either a first or a second state, said plurality of means for retaining an electrical signal being arranged in an order along a path, wherein each of said plurality of means for retaining an electrical signal can be independently set in either of said first or said second states;

a serial input to said plurality of means for retaining an electrical signal;

means for sequentially setting each of said plurality of means for retaining an electrical signal in either said first or said second state in response to state signals input at said serial input, wherein said state of each of said means for retaining an electrical signal are set in reverse of said order and said state signal for a particular of said means for retaining an electrical signal must first pass through all of said plurality of means for retaining an electrical signal which are on said path and between said serial input and said particular of said means for retaining an electrical signal; and

an additional means for retaining an electrical signal indicative of either a first or a second state, wherein said state of said additional means for retaining an electrical signal can be set as part of said sequence of setting said state in each of said plurality of means for retaining an electrical signal, and wherein said state of said additional means for retaining an electrical signal is also indicative of two different operational modes of said register.

14. The digital register of claim 13 wherein one of said modes is the automatic and sequential generation of a plurality of digital data test patterns.

15. The digital register of claim 14 wherein the other of said modes is the compaction of a plurality of inputs.