Method of and arrangement for accurately measuring low capacitances

• US 4,849,686 A
• Filed: 02/13/1987
• Issued: 07/18/1989
• Est. Priority Date: 02/13/1986
• Status: Expired due to Term

• Current Assignee: Vaisala OY Vanha Nurmijarventie 21 01670 Vantaa Finland
• Original Assignee: Vaisala OY
• Inventors: Lyyra, Matti
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): Solis, Jose M.
• Application Number:
  US07/014,661
• Time in Patent Office: 886 Days
• Field of Search: 340/870.04, 340/870.1, 340/870.13, 340/870.37, 364/571, 324/57 R, 324/60 R, 324/61 R, 324/63, 73/1 R
• US Class Current: 324/679
• CPC Class Codes: G01D 5/24 by varying capacitance
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24
• CPC Class Codes: G01R 27/2623 Measuring-systems or electronic circuits G01R27/2635, G01R27/2682 take precedence

Abstract

A third reference capacitor cooperates with first and second reference capacitors to minimize measurement errors in a measurement circuit of the type in which reference and measurement capacitors are connected, one at a time, to an oscillator of the measurement circuit to generate an output frequency proportional to the capacitance of the capacitor being measured. The measurement errors introduced by different temperature and loading conditions during calibration and measurement modes of the measurement circuit are minimized.

Claims

1. A method of accurately measuring physical quantities using measurement impedances having low impedance values, comprising the steps of:

(a) selecting first and second stable reference impedance with impedance values respectively at lower and upper regions of an impedance measurement range;

(b) selecting a third stable reference impedance with an impedance value at an intermediate region between the lower and upper regions of the measurement range;

(c) determining an initial correction parameter by connecting each reference impedance, one at a time, to a measuring circuit during calibration mode, said initial correction parameter being a function of each reference impedance and of operating conditions of calibration environment;

(d) storing the initial correction parameter;

(e) providing a measuring circuit connectable in calibration and measurement modes of operation to each reference impedance and measurement impedance for measuring the impedance value of a selected measurement impedance, said measuring circuit having a variable response characteristic as a function of different operating conditions during the calibration and measurement modes;

(f) determining an updated correction parameter by connecting each reference impedance, one at a time, to the measuring circuit during the measurement mode, said updated correction parameter being a function of each reference impedance;

(g) comparing the updated correction parameter with the initial correction parameter, and storing a correction factor based on the difference between the updated and initial correction parameters;

(h) measuring the impedance value of the measurement impedance by connecting the latter to the measuring circuit during the measurement mode; and

(i) determining a corrected impedance value for the measurement impedance as a function of the impedance value measured in step (h) and the correction factor, thereby reducing measurement errors caused by the variable response characteristic due to the different operating conditions.

2. The method as recited in claim 1, wherein step (c) is performed by calculating a ratio, the numerator of which is the difference between the second reference impedance and the measurement impedance, the denominator of which is the difference between the two reference impedances.

3. The method as recited in claim 1, wherein each impedance is a low capacitance whose value is indicative of a variable physical quantity.

4. An arrangement for accurately measuring physical quantities using measuring impedance having low impedance values, comprising:

(a) first and second stable reference impedances with impedance values respectively at lower and upper regions of an impedance measurement range;

(b) a third stable reference impedance with an impedance value at an intermediate region between the lower and upper regions of the measurement range;

(c) means for determining an initial correction parameter by connecting each reference impedance, one at a time, to a measuring circuit during calibration mode, said initial correction parameter being a function of each reference impedance and of operating conditions of calibration environment;

(d) means for storing the initial correction parameter;

(e) a measuring circuit connectable in calibration and measurement modes of operation to each reference impedance and measurement impedance for measuring the impedance value of a selected measurement impedance, said measuring circuit having a variable response characteristic as a function of different operating condition during the calibration and measurement modes;

(f) means for determining an updated correction parameter by connecting each reference impedance, one at a time, to the measuring circuit during the measurement mode, said updated correction parameter being a function of each reference impedance;

(g) means for comparing the updated correction parameter with the initial correction parameter, and storing a correction factor based on the difference between the updated and initial correction parameters;

(h) means for measuring the impedance value of the measurement impedance by connecting the latter to the measuring circuit during the measurement mode; and

(i) means for determining a corrected impedance value for the measurement impedance as a function of the measured impedance value and the correction factor, thereby reducing measurement errors caused by the variable response characteristic due to the different operating conditions.