Computed tomography inspection of electronic devices

• US 4,852,131 A
• Filed: 05/13/1988
• Issued: 07/25/1989
• Est. Priority Date: 05/13/1988
• Status: Expired due to Term

• Current Assignee: Rapiscan Laboratories Incorporated (OSI Systems Incorporated)
• Original Assignee: Advanced Research & Applications Corp. (OSI Systems Incorporated)
• Inventors: Armistead, Robert A.
• Primary Examiner(s): Church, Craig E.
• Application Number:
  US07/193,439
• Time in Patent Office: 438 Days
• Field of Search: 378/4, 378/58, 378/901, 378/17, 364/414
• US Class Current: 378/4
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01N 23/046 using tomography, e.g. computed tomography [CT]
• CPC Class Codes: H05G 1/60 Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography

Abstract

Computed tomography inspection apparatus and method of inspecting electronic devices and features of PCBs/PWBs, such as solder bonds, tracings and vias. The system scans radiation passed through the devices in thin slices and detects attenuated radiation from which it generates data representing slice images with high resolution. The detected image data are analyzed automatically by an image data analyzer which receives model data against which it compares and evaluates the detected image data.

Claims

1. A method of inspecting mechanical/electrical interconnections between electronic components and conductors on a supporting circuit board, comprising the steps of:

arranging radiation source means to radiate X-rays along and about a plane in a thin sheet through a sector defined by said source means and by an arc lying in said plane, centered on said source means, and located at a selected radius from said source means;

arranging X-ray detector means in said plane in a linear array coinciding with said arc to receive X-rays from said source means;

positioning said board so that said mechanical/electrical interconnections are intersected by said plane while operating said detector means to detect levels of radiation received from said source means during predetermined time intervals and to develop corresponding measurement data signals, and storing said measurement data signals;

rotating said board by a selected angle θ

around an axis normal to said plane;

repeating a selected number of times said steps of operating said detector means, storing said measurement data signals, and rotating said board;

processing said stored measurement data signals by computed tomography techniques to generate image data corresponding to an image of the density distribution of said mechanical/electrical interconnections intersected by said plane; and

comparing said image data to model data to develop defect data indicative of defects in said mechanical/electrical interconnections.

2. A method as in claim 1 wherein said step of positioning includes positioning said board so that said mechanical/electrical interconnections are intersected by said plane outside of said sector, said step of positioning is followed by a step of translating said board in a selected direction through said sheet of X rays across said sector, and said step of repeating includes the step of translating said board before operating said detector means.

3. A method as in claim 1 wherein said mechanical/electrical interconnections include solder bonds, and wherein said step of comparing comprises the steps of:

(1) receiving model data including position parameters, defect parameters, and acceptance criteria for the board under inspection;

(2) receiving said image data;

(3) transforming said image data using said position parameters so that its corresponding image is moved to a normal position;

(4) if said image data is for a first training image, then using said image data for model image data and repeating steps 2 and 3;

(5) inspecting the placement of said components represented by said image data using said position and defect parameters to develop component defect severity variables;

(6) inspecting said solder bonds represented by said image data to develop bond defect severity variables; and

(7) evaluating said defect variables using said defect parameters and acceptance criteria to develop board defect data.

4. A method as in claim 3 wherein said steps 2 through 7 are executed on image data for at least one model board image and are then executed on image data for at least one board under inspection which corresponds to said model board.

5. A method as in claim 4 wherein said step 5 of inspecting the placement of said components comprises the steps of:

(A) subtracting the image data from the model image data to provide difference image data;

(B) if the image data is training image data not yet used to normalize the model image data, then using the difference image data to normalize the model image data and repeating step A;

(C) filtering the difference image data to eliminate insignificant misalignment signatures;

(D) using placement classification parameters to classify difference image data excursions;

(E) if the image data is training image data then tuning the placement classification parameters;

(F) using defect severity parameters to calculate component defect severity variables;

(G) if the image data is training image data then tuning defect severity parameters;

(H) using component defect severity variables to update records in a component defect vector; and

(I) storing the defect vector.

6. A method as in claim 4 wherein said model data includes model bond geometry specifications and parameters for solder density threshold, mass and shape signature, and wherein said step 6 of inspecting said solder bonds comprises the steps of:

(A) subjecting the normally positioned image data to model bond parameters to characterize the bonds;

(B) comparing characterized bonds to said specifications to determine bond geometry compliance;

(C) if the image data is for a training image then tuning the bond character parameters;

(D) using defect severity parameters to factor bond non-compliances to develop bond defect severity variables;

(E) if the image data is for a training image, then tuning defect severity parameters;

(F) using the defect severity variables to update records in a bond defect vector; and

(G) storing the defect vector.

7. A method as in claim 4 wherein said step 7 of evaluating comprises the steps of:

(A) applying said acceptance criteria to said board defect data to decide whether to accept, attempt repair of, or reject a board;

(B) using defect vectors to identify trends in board manufacturing problems; and

(C) producing an overall board defect rating signal.

8. Means for inspecting mechanical/electrical interconnections between electronic components and conductors of a supporting circuit board, comprising:

radiation source means for radiating a thin sheet of X rays along a selected plane in a sector;

spatial positioning means for positioning said circuit board with said interconnections in said plane and in said sector;

data acquisition means for detecting levels of radiation received from said source means and for developing corresponding measurement data signals;

scan control means for controlling operation of said source means, said positioning means and said data acquisition means, and including data storage means for receiving and storing said measurement data signals;

image data generating means responsive to measurement data signals from said data storage means, and operative to generate image data corresponding to an image of the density distribution of said mechanical/electrical interconnections intersected by said plane; and

image data analyzing means including database means for storing model data for said mechanical/electrical interconnections and including image data comparing means for comparing said image data to said model data to develop defect data indicative of defects in said mechanical/electrical interconnections.

9. Means as in claim 8 wherein said image data analyzing means comprises

means for inspecting component placement and for producing component defect variables;

means for inspecting solder bonds and for producing bond defect variables; and

means for evaluating said component defect and bond defect variables to produce an overall board defect rating signal.