Contact-sensing probe

• US 4,854,050 A
• Filed: 08/05/1988
• Issued: 08/08/1989
• Est. Priority Date: 12/17/1984
• Status: Expired due to Fees

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: McMurtry, David R.
• Primary Examiner(s): NOT, DEFINED
• Application Number:
  US07/228,739
• Time in Patent Office: 368 Days
• Field of Search: 33/558, 33/559, 33/560, 33/561, 33/503, 33/172 E, 33/504, 33/169 R
• US Class Current: 33/558
• CPC Class Codes: G01B 7/002 Constructional details of contacts for gauges actuating one or more contacts G01B7/016 takes precedence
• CPC Class Codes: G01B 7/012 Contact-making feeler heads therefor

Abstract

A contact sensing probe is disclosed for use with a measuring machine or machine tool for measuring the dimensions of a workpiece. The probe comprises a housing within which a stylus holder is mounted on a kinematic support. A spring urges the stylus holder into a rest position on the support and yieldingly resists tilting or lifting of the stylus holder from the support when the stylus engages a workpiece. A sensing device in the form of an accelerometer is supported within the housing on the stylus holder to sense one of the effects of stylus engagement with the workpiece, and to produce a signal which is used to stop the machine and read the signal and read the coordinates of the instantaneous stylus position. The effects sensed in different embodiments of the invention are, sudden lifting of the stylus holder due to physical displacement of the stylus, or the shockwave produced in the stylus on contact with the workpiece. A piezo-electric pressure transducer is used as a sensitive accelerometer for measuring the shock wave in a preferred embodiment.

Claims

1. A contact-sensing probe for use in apparatus for measuring the dimensions of a workpiece, comprising:

a fixed part adapted to be mounted in the apparatus;

a movable part, including a base portion and a stylus having a free end for engaging the workpiece during a measuring operation, the free end being supported in a position having a fixed relationship relative to the base portion via a support path extending from the base portion to the free end;

support means for supporting the base portion so that the movable part is in a rest position on the fixed part;

bias means for urging the movable part into said rest position; and

sensing means for sensing a pressure wave transmitted through the stylus caused by engagement of the free end of the stylus with the workpiece, the sensing means comprising an accelerometer having opposing first and second portions, said first portion being supported by said movable part so that the accelerometer lies outside said support path and said first portion receives said pressure wave, said second portion being free relative to said support path, thereby permitting said sensing while maintaining said fixed relationship between said stylus free end and said base portion,

said contact-sensing probe being arranged such that an urging force of said bias means is transmitted to said movable part through the accelerometer.

2. A contact-sensing probe according to claim 1, wherein said base portion has a first side from which said stylus projects, and said accelerometer is supported by said base portion at a second side opposite said first side.

3. A contact-sensing probe according to claim 1, wherein the accelerometer is a piezo-electric element.

4. A contact-sensing probe according to claim 1, further comprising a member, including said accelerometer, said member transmitting an urging force of said bias means to said movable part.

5. A contact-sensing probe according to claim 1, further comprising a member having upper and lower components, said accelerometer being sandwiched between said upper and lower components, wherein the urging force of said bias means is transmitted to said movable part through said member.

6. A contact-sensing probe according to claim 1, wherein the accelerometer is a piezo-electric element sandwiched between the movable part and a member arranged to transmit an urging force of said bias means to said movable part.

7. A contact-sensing probe for use in apparatus for measuring the dimensions of a workpiece, comprising:

a fixed part adapted to be mounted in the apparatus;

a movable part, including a base portion and a stylus having a free end for engaging the workpiece during a measuring operation, the free end being supported in a position having a fixed relationship relative to the base portion via a support path extending from the base portion to the free end;

support means for supporting the base portion so that the movable part is in a rest position on the fixed part;

bias means for urging the movable part into said rest position; and

sensing means for sensing movement of the movable part caused by engagement of the free end of the stylus with the workpiece, the sensing means comprising an accelerometer having opposing first and second portions, said first portion being supported by said movable part so that the accelerometer lies outside said support path and said first portion participates in movement of said movable part relative to said fixed part, said second portion being free relative to said support path, thereby permitting said sensing while maintaining said fixed relationship between said stylus free end and said base portion,

said contact-sensing probe being arranged such that an urging force of said bias means is transmitted to said movable part through the accelerometer.

8. A contact-sensing probe according to claim 7, wherein said base portion has a first side from which said stylus projects, and said accelerometer is supported by said base portion at a second side opposite said first side.

9. A contact-sensing probe according to claim 7, wherein the accelerometer is a piezo-electric element.

10. A contact-sensing probe according to claim 7, further comprising a member with said accelerometer arranged to transmit the urging force of said bias means to said movable part, wherein said accelerometer is a piezo-electric element.

11. A contact-sensing probe according to claim 7, further comprising a member, including said accelerometer, said member transmitting an urging force of said bias means to said movable part.

12. A contact-sensing probe according to claim 7, further comprising a member having upper and lower components, said accelerometer being sandwiched between said upper and lower components, wherein the urging force of said bias means is transmitted to said movable part through said member.

13. A contact-sensing probe according to claim 7, wherein the accelerometer is a piezo-electric element sandwiched between the movable part and a member arranged to transmit an urging force of said bias means to said movable part.

14. A contact-sensing probe for use in apparatus for measuring the dimensions of a workpiece, comprising:

a fixed part adapted to be mounted in the apparatus;

a first movable part, including a stylus for engaging said workpiece during a measuring operation;

support means for supporting the first movable part in a rest position on the fixed part;

bias means for urging the first movable part into said rest position;

a second movable part movable with respect to the first movable part, the second movable part bearing against the first movable part so as to allow transmission from the first movable part to the second movable part of a pressure wave caused by engagement of the stylus with said workpiece during a measuring operation; and

sensing means on the second movable part for sensing said engagement, said sensing means being sensitive to said pressure wave.

15. A contact-sensing probe according to claim 14, wherein the second movable part bears against the first movable part at a single point.

16. A contact-sensing probe according to claim 15, wherein the second movable part has a point which bears in a recess in the first movable part.

17. A contact-sensing probe according to claim 14, wherein the sensing means comprises a piezo-electric element.

18. A contact-sensing probe according to claim 14, wherein an urging force of said bias means is transmitted to the first movable part through the second movable part.

19. A contact-sensing probe according to claim 18, wherein the sensing means comprises a piezo-electric element and said urging force is transmitted through the piezo-electric element.

20. A contact-sensing probe according to claim 17, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.

21. A contact-sensing probe according to claim 19, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.

22. A contact-sensing probe for use in apparatus for measuring the dimensions of a workpiece, comprising:

a fixed part adapted to be mounted in the apparatus;

a first movable part, including a stylus for engaging said workpiece during a measuring operation;

support means for supporting the first movable part in a rest position on the fixed part;

bias means for urging the movable part into said rest position; and

sensing means for sensing when the stylus engages the workpiece, the sensing means being sensitive to accelerations induced in the first movable part by initial engagement of the stylus with the workpiece, wherein

a second movable part is provided which is free to move with respect to the first movable part, but which is supported to participate in said accelerations of the first movable part; and

the sensing means is located on the second movable part.

23. A probe according to claim 22, wherein the fixed part includes a housing and the first movable part includes a stylus holder to which said connectable to project from one side of the holder out of the housing to enable the stylus to engage a workpiece, and wherein the second movable part is supported on a surface of the stylus holder on the opposite side thereof to the stylus.

24. A contact-sensing probe according to claim 22, wherein the sensing means is sensitive to accelerations in the form of a pressure wave caused by engagement of the stylus with the workpiece.

25. A contact-sensing probe according to claim 23, wherein the sensing means is sensitive to accelerations in the form of a pressure wave caused by engagement of the stylus with the workpiece.

26. A contact-sensing probe according to claim 22, wherein the sensing means is sensitive to the initial acceleration of the movement of the first movable part when it is displaced on contact with the workpiece.

27. A contact-sensing probe according to claim 23, wherein the sensing means is sensitive to the initial acceleration of the movement of the first movable part when it is displaced on contact with the workpiece.

28. A contact-sensing probe according to claim 22, wherein the second movable part bears against the first movable part at a single point.

29. A contact-sensing probe according to claim 23, wherein the second movable part bears against the first movable part at a single point.

30. A contact-sensing probe according to claim 28, wherein the second movable part has a point which bears in a recess in the first movable part.

31. A contact-sensing probe according to claim 29, wherein the second movable part has a point which bears in a recess in the first movable part.

32. A contact-sensing probe according to claim 22, wherein the sensing means comprises a piezo-electric element.

33. A contact-sensing probe according to claim 22, wherein the urging force of said bias means is transmitted to the first movable part through the second movable part.

34. A contact-sensing probe according to claim 32, wherein the urging force of said bias means is transmitted through the piezo-electric element.

35. A contact-sensing probe according to claim 32, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.

36. A contact-sensing probe according to claim 34, wherein the second movable part comprises two components and the piezo-electric element is sandwiched between said two components.

37. A contact-sensing probe according to claim 22, wherein the support means is a kinematic support.

38. A contact-sensing probe according to claim 27, further comprising a member with said accelerometer arranged to transmit the urging force of said bias means to said movable part, wherein said accelerometer is a piezo-electric element.