Wide angle optical filters

• US 4,854,670 A
• Filed: 03/29/1988
• Issued: 08/08/1989
• Est. Priority Date: 12/17/1986
• Status: Expired due to Term

• Current Assignee: GTE Products Corporation
• Original Assignee: GTE Products Corporation
• Inventors: Mellor, Charles E.
• Primary Examiner(s): Corbin, John K.
• Assistant Examiner(s): Ryan, Jay
• Application Number:
  US07/178,790
• Time in Patent Office: 497 Days
• Field of Search: 350/1.6, 350/1.7, 350/164, 350/166
• US Class Current: 359/359
• CPC Class Codes: G02B 5/282 reflecting for infrared and transparent for visible light, e.g. heat reflectors, laser protection

Abstract

A thin-film optical interference filter designed and manufactured to have high transmission of blue light and high reflectance of infrared light. The novel feature of this filter rests in the thin-film layer design at the top and bottom of a quarterwave stack and the manufacturing technique by which this thin-film design is deposited. The thin-film layer design suppresses the so called halfwave holes which occur at wide angles of incidence of the incoming light. This desirable effect is achieved by the proper layer thickness and refractive index control in the manufacturing process.

Claims

1. A thin-film optical interference filter having high-transmission of blue light and high-reflectance of infrared light, said filter having a predetermined design wavelength, said filter comprising:

(a) a glass substrate;

(b) a first or bottom coating of a high-refractive index material applied on said substrate, said first coating having a first thickness of less than one-sixteenth of said design wavelength;

(c) a second coating of a low-refractive index material applied on said first coating, said second coating having a second thickness greater than one-sixteenth and less than three-sixteenths of said design wavelength;

(d) a third coating of a high-refractive index material applied on said second coating, said third coating having a third thickness of less than one-sixteenth of said design wavelength; and

(e) a quarterwave stack applied on said third coating, said quarterwave stack including a plurality of layers of alternating high- and low-refractive index materials, said quarterwave stack having a design wavelength being matched approximately to said predetermined design wavelength of said filter.

2. An optical filter as described in claim 1 wherein said filter further includes a fourth coating of low-refractive index material applied on said quarterwave stack, said fourth coating having a thickness of less than one-quarter of said design wavelength.

3. An optical filter as described in claim 1 wherein said first and third coatings are formed from titanium dioxide and said second coating is formed from silicon dioxide.

4. An optical filter as described in claim 2 wherein said fourth coating is formed from silicon dioxide.

5. An optical filter as described in claim 1 wherein the thicknesses of said first and third coatings are each less than one thirty-second of said design wavelength and the thickness of said second coating is one-eighth of said design wavelength plus or minus one-tenth of one-eighth of said wavelength.

6. An optical filter as described in claim 2 wherein the thickness of said fourth coating is between approximately twenty-five percent to approximately sixty-seven percent of one-quarter of said design wavelength.

7. An optical filter as described in claim 1 wherein said design wavelength is approximately 880 nanometers.