Arrangement for inspecting light waveguide end faces

• US 4,854,701 A
• Filed: 12/21/1987
• Issued: 08/08/1989
• Est. Priority Date: 12/20/1986
• Status: Expired due to Fees

• Current Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Schmitt, Hans-Jurgen, Blazek, Vladimir, Noll, Joachim J.
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US07/135,877
• Time in Patent Office: 596 Days
• Field of Search: 356/73.1, 356/352, 356/359, 356/371
• US Class Current: 356/73.1
• CPC Class Codes: G01M 11/00 Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
• CPC Class Codes: G01M 11/331 by using interferometer
• CPC Class Codes: G02B 6/3807 Dismountable connectors, i.e. comprising plugs

Abstract

The invention relates to an arrangement of inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the airgap between a plane transparent plate and the end face of a light waveguide abutting on said plate. A less elaborate measuring device requiring less space is obtained in that the measuring light is led towards the end faces to be observed, via the light waveguides (1, 2, 23, 24).

Claims

1. An arrangement for inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the airgap between a plane transparent plate and the end face of a light waveguide abutting on said plate, wherein the measuring light is led towards the end faces to be observed via the light waveguides (1, 2, 23, 24).

2. An arrangement as claimed in claim 1, wherein that the measuring light is coupled into the light waveguide (23, 24) by means of coupling in a curved section (33).

3. An arrangement as claimed in claim 2, wherein curved sections of at least two light waveguides (23 and 24) into which light is coupled by means of a single light transmitter (34), are juxtaposed.

4. An arrangement as claimed in claim 1, wherein the end faces of two light waveguides (1, 2, and 23, 24) to be connected are put into a holding device, in such a way that both end faces are observable before establishing the connection.

5. An arrangement as claimed in claim 4, wherein an observation device for observing the end faces is integrated in the light waveguide splicer (14).

6. An arrangement as claimed in claim 1, wherein the interference patterns are observable by means of an observation device for inspection of the geometrical positions of the light waveguides (1, 2 and 23, 24).

7. An arrangement as claimed in claim 5 containing a pivotable deflecting mirror (9) whereby when the mirror is arranged in a first position via said mirror, and, when arranged in a second position, the geometrical positions of the light waveguides (1,2) are imaged.

8. An arrangement as claimed in claim 5, wherein the interference patterns and the geometrical coupling positions of the light waveguides (23, 24) are imaged on the same image plane by means of a semi-transparent reflecting surface and in that either the locations of the interference patterns or the coupling positions of the light waveguides are illuminated.

9. An arrangement for inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the air gap between a plane transparent plate and the end face of a light waveguide abutting on said plate, the end faces of two light waveguides to be connected being in a holding device in such a way that both end faces are observable before establishing the connection and wherein an observation device for observing the end faces is integrated into a light waveguide splicer, said observation device comprising a transparent measuring block which has plane-parallel end surfaces that abut on the end faces of the waveguides and wherein one of two formed interference patterns is reflected on a common observation point via reflecting surfaces which are inclined at an angle of approximately 45°

with respect to the end surfaces of the measuring block.

10. An arrangement for inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the air gap between a plane transparent plate and the end face of a light wave guide abutting on said plate, wherein the measuring light is led towards the end faces to be observed via the ligth waveguides, the arrangement comprising juxtaposed light waveguides abutting on a transparent plate and each receiving measuring light, the interference patterns being imaged via at least two optical systems and at least two deflection mirrors onto the surface of an observation point.

11. An arrangement as claimed in claim 10 wherein the light waveguides are removed from the plate and mounted on a splicer, the geometrical alignment of the ends of the light waveguides in the splicer being imaged via reflection mirrors and at least two optical systems onto the surface of an observation point.

12. An arrangement as claimed in claim 10 or 11 wherein the interference patterns and the geometrical alignment of the ends of the light waveguides, respectively, are imaged onto the light sensitive surface of a video camera after which the images are evaluated by an electronic evaluation system and displayed on a monitor.

13. An arrangement as claimed in claim 10 or 11 wherein one of the deflection mirrors is a pivotable deflecting mirror whereby when the mirror is arranged in a first position the interence patterns are imaged on a common observation point via said mirror, and, when arranged in a second position, the geometrical positions of the light waveguides are imaged.

14. An arrangement for inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the air gaps between a plane transparent plate and the end face of a light waveguide abutting on said plate, wherein the measuring light is led towards the end faces to be observed via the light waveguides, and wherein the observation device comprises a transparent measuring block which has plane-parallel end surfaces and is arranged between the end faces of the light waveguides, which surfaces abut on the end faces of the light waveguides, the interference patterns being reflected on a common observation point via reflecting surfaces which are inclined at an angle of approximately 45°

with respect to the end surfaces of the measuring block.

15. An arrangement as claimed in claim 14 wherein the measuring light is coupled into the light waveguide by means of coupling in a curved section.

16. An arrangement as claimed in claim 15 wherein curved sections of at least two light waveguides into which light is coupled by means of a single light transmitter are juxtaposed.

17. An arrangement as claimed in claim 15 wherein the end faces of two light waveguides to be connected are put into a holding device in such a way that both end faces are observable before establishing the connection.

18. An arrangement as claimed in claim 14 in which the observation device for observing the end faces is integrated in a light wave splicer.

19. An arrangement as claimed in claim 14 wherein the interference between and the geometrical coupling positions of the light waveguides are imaged on the same image plane by means of a semi-transparent reflecting surface and wherein either the locations of the interference patterns or the coupling positions of the light waveguides are illuminated.