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Arrangement for inspecting light waveguide end faces

  • US 4,854,701 A
  • Filed: 12/21/1987
  • Issued: 08/08/1989
  • Est. Priority Date: 12/20/1986
  • Status: Expired due to Fees
First Claim
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1. An arrangement for inspecting light waveguide end faces by observing the interference pattern formed by means of measuring light in the airgap between a plane transparent plate and the end face of a light waveguide abutting on said plate, wherein the measuring light is led towards the end faces to be observed via the light waveguides (1, 2, 23, 24).

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