Multiple coil eddy current probe and method of flaw detection

• US 4,855,677 A
• Filed: 03/11/1988
• Issued: 08/08/1989
• Est. Priority Date: 03/11/1988
• Status: Expired due to Fees

• Current Assignee: Westinghouse Electric Company LLC (Brookfield Asset Management Incorporated)
• Original Assignee: Westinghouse Electric Company LLC (Brookfield Asset Management Incorporated)
• Inventors: Metala, Michael J., Clark, William G. Jr.
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): Harvey, Jack B.
• Application Number:
  US07/167,289
• Time in Patent Office: 515 Days
• Field of Search: 324/219-221, 324/226-229, 324/232, 324/234, 324/237, 324/238, 324/239, 324/240, 324/242, 324/243, 324/262
• US Class Current: 324/238
• CPC Class Codes: G01N 27/904 with two or more sensors
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

An improved eddy current probe system and method for simultaneously detecting different types of flaws at different depths within a metallic wall, such as a section of Inconel tubing, is disclosed herein. The system comprises a current generator for generating alternating currents of substantially different frequencies, a probe head including first, second and third concentrically arranged coils in separate communication with the current generator, shielding material disposed between the coils for preventing cross talk between each coil and the pulsating magnetic field of the coils adjacent to it, and a detector circuit which may include an inductive bridge for providing an electrical output representative of the impedance changes in the respective coils. In operation, each of the coils conduct currents having substantially different frequencies, the highest frequency being conducted by the smallest-diametered coil and the lowest frequency being conducted by the largest-diametered coil. The different levels of magnetic field penetration provided by the coils as it is helically moved around the inside surface of a section on Inconel tubing not only allows the probe system to detect diverse kinds of flaws such as cracks, pits, or regions of thinning, but also flaws located at different depths throughout the tube wall. In the method of the invention, a computer is used to adjust the frequencies of the alternating currents conducted through the coils during the scanning operation in order to maximize the impedance changes in each coil, thereby maximizing the resolution of the probe system.

Claims

1. An improved eddy current probe system for simultaneously detecting different types of flaws at different depths within a metallic wall, comprising:

a. current means for generating alternating current of substantially different frequencies including a frequency adjuster and timing means;

b. a probe head including first and second coils in separate communication with said alternating currents of substantially different frequencies for detecting different types of flaws at different depths within said metallic wall, wherein the windings of one coil surround the windings of the other coil;

c. shielding means for preventing cross talk between said coils;

d. detector means for providing an electrical output representative of the relative impedance of the respective coils, and

e. a computing means connected to said detector means and said current generating means for receiving and storing the value of the impedance of each coil as the probe head is moved across a portion of said metallic wall, and for transmitting control signals to said frequency adjuster and timing means which cause the current generating means to adjust the frequency of the alternating currents received by the coil so that impedance changes in the coils and hence the flaw-detecting resolution of each is maximized.

2. An improved eddy current probe system as defined in claim 1, wherein the windings of said coils are substantially circular, and wherein the windings of the first coil circumscribe the windings of the second coil.

3. An improved eddy current probe system as defined in claim 2, wherein the first coil is substantially concentrically disposed around the second coil.

4. An improved eddy current probe system as defined in claim 1, wherein the current means applies a lower frequency alternating current to the surrounding coil, and a substantially higher frequency alternating current to the surrounded coil.

5. An improved eddy current probe system as defined in claim 4, wherein the frequency of the alternating current applied to the surrounding coil is low enough to detect flaws occurring relatively deep within said metallic wall, and the frequency of the alternating current applied to the surrounded coil is high enough to detect flaws on the surface of said metallic wall.

6. An improved eddy current probe system as defined in claim 4, wherein the frequency of the current applied to the surrounding coil is low enough to detect flaws covering a relatively wide area of said metallic wall, and the frequency of the alternating current applied to the surrounded coil is high enough to detect flaws covering a relatively narrow areas of said metallic wall.

7. An improved eddy current probe system as defined in claim 1, wherein the current means applies an alternating current having a frequency of at least 30 Khz to the surrounding coil, and an alternating current having a frequency no greater than 1.0 MHz to the surrounded coil.

8. An improved eddy current probe system as defined in claim 1, wherein the windings of said first coil surround the windings of the second coil, and further including a third coil whose windings surround the windings of the first coil.

9. An improved eddy current probe system as defined in claim 8, wherein the frequency of the alternating current applied to the second, first and third coils is relatively higher for each coil, respectively.

10. An improved eddy current probe system as defined in claim 9, wherein the frequency of the alternating current applied to the second, first and third coils is between about 300 and 700 kHz for said second coil, 50 and 450 kHz for said first coil, and 20 and 100 kHz for said third coil.

11. An improved eddy current probe system for simultaneously detecting different types of flaws at different depths within a metallic wall, comprising:

a. current means for generating alternating currents at a plurality of different frequencies, including a frequency adjuster and timing means;

b. a probe head including a plurality of different coils having a different diameters arranged substantially concentrically, each of which is separately connected to said current means for receiving one of said currents of different frequencies;

c. shielding means disposed between the edges of adjacent coils for preventing cross talk between the fluctuating magnetic fields generated by each coil and the coils adjacent to each such field;

d. detector means for providing an electrical output representative of impedance changes in the respective coils, and

e. a computing means connected to said detector means and said current generating means for receiving and storing the value of the impedance of each coil as the probe head is moved across a portion of said metallic wall, and for transmitting control signals to said frequency adjuster and timing means which cause the current generating means to adjust the frequency of the alternating currents received by the coils so that impedance changes in the coils and hence the flaw-detecting resolution of each is maximized

12. An improved eddy current probe system as defined in claim 11, wherein said shielding means is a plurality of ring-shaped walls of netic-conetic material disposed between the edges of different coils.

13. An improved eddy current probe system as defined in claim 11, further including a ferrite core means disposed within the smallest-diametered coil for concentrating the magnetic flux generated thereby.

14. An improved eddy current probe system as defined in claim 11, further including a switching means 15 connected to said current means for connecting one or more of said plurality of coils in series with one another, so that said serially connected coils may conduct the same alternating current and thereby act as a single coil probe of increased diameter.

15. An improved eddy current probe system as defined in claim 11, wherein the current means applies a progressively higher frequency alternating current to coils of smaller diameter.

16. An improved eddy current probe system as defined in claim 11, wherein said current means conducts a current of between about 300 and 700 Khz to a first coil, 150 to 350 kHz to a second coil that circumscribes the first, and 30 to 70 kHz to a third coil that circumscribes the second.

17. An improved eddy current probe system as defined in claim 16, wherein said current means conducts a current of about 500 kHz to a first coil, 250 kHz to a second coil that surrounds the first, and 50 kHz to a third coil that surrounds the second.

18. An improved eddy current probe system as defined in claim 11, wherein each coil includes a front face confrontable against said metallic wall for transmitting a pulsating magnetic field therefrom that is covered by a self-lubricating plastic material.

19. An improved eddy current probe system particularly adapted to be helically moved in sliding engagement against the inner wall of a metallic conduit for simultaneously detecting both large and small area flaws located at different depths within the conduit walls, comprising:

a. current generating means for generating alternating currents of different frequencies, and for changing the frequencies of any one of said currents in response to a frequency control signal;

b. a probe head including a plurality of different coils having different diameters arranged concentrically, each of which is separately connected to said current generating means for receiving and conducting one of said alternating currents, wherein each of said coils includes a front face confrontable against said wall of said conduit for transmitting a pulsating magnetic field therefrom into said wall, and a rear face and wherein the smallest-diametered coil is provided with the highest frequency alternating current by the current generating means to provide a reference point for the system operator;

c. shielding means for minimizing cross talk between said coils and said fields including ring-shaped walls of netic-conetic material disposed between the edges of adjacent coils;

d. detector means for providing an electrical output representative of the relative impedance of the respective coils, and

e. computing means connected to said detector means and said current generating means for receiving and storing the value of the impedance of each coil as the probe head is moved in sliding engagement against the inner wall of said metallic conduit, and for transmitting frequency control signals to a frequency adjuster and timing means connected to the current generating means which cause it to adjust the frequency of the alternating currents received by the coils so that the impedance changes detected by the coils and hence the flaw-detecting resolution of each is maximized.

20. An improved eddy current probe system as defined in claim 19, wherein said current generating means conducts a current of between abut 300 and 700 kHz to a first coil, 150 to 350 kHz to a second coil that circumscribes the first, and 30 to 70 kHz to a third coil that circumscribes the second.

21. An improved eddy current probe system as defined in claim 19, wherein said current means conducts a current of about 500 kHz to a first coil, 250 kHz to a second coil that surrounds the first, and 50 kHz to a third coil that surrounds the second.

22. An improved eddy current probe system as defined in claim 19, further including a ferrite core means disposed within the smallest-diametered coil for concentrating the magnetic flux generated thereby.

23. An improved eddy current probe system as defined in claim 19, further including a switching means connected to said current means for connecting one or more of said plurality of coils in series with one another, so that said serially connected coils may conduct the same alternating current and thereby act as a single coil probe of increased diameter.

24. A method for simultaneously detecting different types of flaws in a metallic wall by an improved eddy current probe system that includes a current generating means for generating alternating currents of different frequencies, and a probe head having a plurality of different coils having different diameters arranged concentrically with respect to each other, each of which is separately connected to said current generating means, comprising the steps of:

a. conducting alternating currents of different frequencies through said coils while moving said probe head across a portion of said metallic wall, wherein the frequency of the current conducted through one coil is high enough to detect flaws on the surface of the wall confronting the probe head, and the frequency of the current conducted through another coil is low enough to detect flaws in said wall beyond said confronting wall surface;

b. monitoring the impedance of the coils as the probe head is moved, and

c. adjusting the frequencies of the alternating currents conducted through each of the coils to maximize the impedance change in each of the coils.

25. A method for simultaneously detecting different types of flaws in a metallic wall by an improved eddy current probe system as defined in claim 24, wherein the highest frequency current is conducted through the smallest-diametered coil, and the lowest frequency current is conducted through the largest-diametered coil.

26. A method for simultaneously detecting different types of flaws in a metallic wall by an improved eddy current probe system as defined in claim 24, wherein the metallic wall is the internal wall of a metallic conduit, and wherein the concentric coils of said probe head are engaged against and helically moved within said internal wall of said conduit while said current frequencies are adjusted.

27. A method for simultaneously detecting different types of flaws in a metallic wall by an improved eddy current probe system as defined in claim 24, further including the steps of storing the values of the coil impedances for each coil as said probe head is moved over a selected portion of said wall, incrementally changing the frequencies of the alternating currents conducted to the coils, and storing the values of the coil impedances for each coil as said probe head is moved over said selected portion a second time.

28. A method for simultaneously detecting different types of flaws in a metallic wall by an improved eddy current probe system as defined in claim 27, further including the step of comparing the impedance values associated with the first and second probe head movements, and further incrementally changing the values of the alternating currents conducted to the coils in a manner that the impedance change in the coil is maximized.