Wafer inspecting apparatus
First Claim
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1. Apparatus comprising:
- (a) inspection means for inspecting a wafer, said inspection means having support means for supporting said wafer while the wafer is inspected;
(b) transport means for transporting said wafer to said support means;
(c) scanning means for scanning said wafer photoelectrically and for generating output signals during said transporting of said wafer by said transport means; and
(d) alignment means for aligning said wafer with respect to said apparatus in response to said output signals generated by said scanning means during said transporting of said wafer by said transport means.
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Abstract
Semiconductor wafer inspecting apparatus comprises plural supports each adapted to support a wafer to be inspected and a feeder for feeding a wafer to each of the plural supports. The apparatus can effect accurate and rapid positioning of the wafer.
141 Citations
14 Claims
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1. Apparatus comprising:
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(a) inspection means for inspecting a wafer, said inspection means having support means for supporting said wafer while the wafer is inspected; (b) transport means for transporting said wafer to said support means; (c) scanning means for scanning said wafer photoelectrically and for generating output signals during said transporting of said wafer by said transport means; and (d) alignment means for aligning said wafer with respect to said apparatus in response to said output signals generated by said scanning means during said transporting of said wafer by said transport means. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. Apparatus comprising:
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(a) support means for supporting a wafer; (b) transport means for transporting said wafer to said support means; (c) scanning means for scanning said wafer photoelectrically and for generating output signals during said transporting of said wafer by said transport means; and (d) alignment means for aligning said wafer with respect to said apparatus in response to said output signals generated by said scanning means during said transporting of said wafer by said transport means.
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10. Apparatus comprising:
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(a) operating means having support means for supporting a substrate; (b) transporting means for transporting said substrate to said support means in order to permit said operating means to operate upon said substrate; (c) scanning means for scanning said substrate photoelectrically and for generating output signals during said transporting of said substrate by said transport means; and (d) alignment means for causing said support means to align said substrate supported by said support means with respect to said operating means in response to said output signals operated by said scanning means during said transporting of said substrate by said transport means; said operating means operating upon said substrate in response to the completion of said aligning by said alignment means. - View Dependent Claims (11, 12)
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13. Apparatus comprising:
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(a) operating means having means for supporting a substrate; (b) transport means for transporting said substrate from a predetermined position to said support means in order to permit said operating means to operate upon said substrate; (c) light detecting means for detecting light intensity distribution on a predetermined region which is positioned between said predetermined position and said support means, said light detecting means generating output signals indicative of light intensity distribution of said predetermined region; and (d) alignment means for causing said support means to align said substrate supported by said support means with respect to said operating means in response to said output signals which are generated by said light detecting means during said transporting of said substrate by said transport means; said operating means operating upon said substrate in response to the completion of said aligning by said alignment means. - View Dependent Claims (14)
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Specification