Apparatus for examining objects
First Claim
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1. An apparatus for examining objects each having an elliptical cross sectional face extending in a plane and bounded by a perimeter rim, said apparatus comprising:
- a test station adapted for location on the path of a means for conveying the objects in a direction through said test station;
a means providing signals indicative of the conveying means speed of object conveyance;
a means for illuminating said object face with electromagnetic radiation;
electronic camera means at the test station for generating a plurality of electromagnetic scans of said object face presented thereto at least in a direction transverse to the conveying direction of the object, said camera means providing output signals associated with said electromagnetic scans;
means for processing the camera output signals includinga means for detecting signals corresponding to leading and trailing edges of object rim first and second sections displaced from one another in a direction approximately parallel to said conveying direction,a means for detecting signals corresponding to leading and trailing edges of object rim third and fourth sections displaced from one another in a direction approximately perpendicular to said conveying direction,a computation means receiving and said scanned object rim signals for computing magnitudes of displacement between selected ones of said leading and trailing object rim section signals in accordance with said conveyor means speed signals, and computing from said displacement magnitudes signals indicative of the magnitude of ellipticity of said object face; and
comparator means for comparing the computed object face ellipticity signals with reference data signals indicative of a preferred magnitude thereof and determining therefrom whether each object complies with preset limits.
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Accused Products
Abstract
Apparatus for examining the shape and/or dimensions of an object wherein an object is fed to a test station (12) on a stepping conveyor (14), the object is illuminated within the test station and scanned by two linear charge-coupled camera devices (18, 20) acting in mutually perpendicular directions across and along the conveyor. Logic circuitry processes the video signals to provide raw measurement signals fed into a microprocessor for analyzing the signals and for providing control signals for a downstream reject mechanism.
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Citations
14 Claims
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1. An apparatus for examining objects each having an elliptical cross sectional face extending in a plane and bounded by a perimeter rim, said apparatus comprising:
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a test station adapted for location on the path of a means for conveying the objects in a direction through said test station; a means providing signals indicative of the conveying means speed of object conveyance; a means for illuminating said object face with electromagnetic radiation; electronic camera means at the test station for generating a plurality of electromagnetic scans of said object face presented thereto at least in a direction transverse to the conveying direction of the object, said camera means providing output signals associated with said electromagnetic scans; means for processing the camera output signals including a means for detecting signals corresponding to leading and trailing edges of object rim first and second sections displaced from one another in a direction approximately parallel to said conveying direction, a means for detecting signals corresponding to leading and trailing edges of object rim third and fourth sections displaced from one another in a direction approximately perpendicular to said conveying direction, a computation means receiving and said scanned object rim signals for computing magnitudes of displacement between selected ones of said leading and trailing object rim section signals in accordance with said conveyor means speed signals, and computing from said displacement magnitudes signals indicative of the magnitude of ellipticity of said object face; and comparator means for comparing the computed object face ellipticity signals with reference data signals indicative of a preferred magnitude thereof and determining therefrom whether each object complies with preset limits. - View Dependent Claims (2, 3, 4, 5, 6, 8, 9, 10, 11, 12, 13, 14)
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7. Apparatus according to claim wherein said computation means further comprises a means for determining values of rim width from associated leading and trailing signal portions of object rim first and second sections measured during a single scan and comparing said measured rim width values with one another determining therefrom whether the object complies with preset limits for said object rim width.
Specification
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Current AssigneeSoudronic AG
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Original AssigneeSoudronic AG
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InventorsMartin, Michael S.
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Primary Examiner(s)Lall, Parshotam S.
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Assistant Examiner(s)MELNICK, STEVEN A
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Application NumberUS06/854,604Time in Patent Office1,211 DaysField of Search364/550, 364/552, 364/560, 364/468, 364/551.01, 364/478, 364/507, 364/561, 364/564, 356/384-386, 356/241, 356/240, 198/502.2, 198/339.1, 72/6, 72/12, 358/107, 358/106, 358/101, 901/47, 209/576, 209/577, 209/597, 209/524, 209/525, 382/25, 250/233 BUS Class Current348/129CPC Class CodesG01B 11/024 by means of diode-array sca...
