Apparatus and method for testing impedances of interconnect devices

• US 4,859,952 A
• Filed: 12/28/1987
• Issued: 08/22/1989
• Est. Priority Date: 12/28/1987
• Status: Expired due to Term

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Digital Equipment Corporation (HP Inc.)
• Inventors: Wissell, Daniel
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US07/137,928
• Time in Patent Office: 603 Days
• Field of Search: 324/538, 324/525, 324/526, 324/62, 324/57 R, 324/421
• US Class Current: 324/538
• CPC Class Codes: G01R 31/66 Testing of connections, e.g. of plugs or non-disconnectable joints testing for incorrect line connections G01R31/55

Abstract

In electronic devices, such as data processing systems that operate at high frequencies, the integrity of the interconnect or coupling apparatus transferring signals between component modules is critical to prevent compromise of information being transferred. However, the interconnect or coupling apparatus is subject to both long term and to short term impedance variations. Apparatus is disclosed for testing both the long term impedance changes and the rapid fluctuations that are not observable by current testing procedures. In addition, apparatus is disclosed for providing controllable rapid impedance changes to verify the operation of test apparatus, disclosed herein, for measuring the rapid impedance changes.

Claims

1. Apparatus for testing long term and intermittent impedance changes in an interconnect device used to couple data processing system components, said apparatus comprising:

a bridge circuit means for receiving a radio frequency input signal, an interconnect device being coupled in one arm of said bridge circuit by means of a cable, said interconnect device having a coupled impedance coupled thereto, said coupled impedance and said interconnect device impedance being generally equal to a characteristic impedance of said cable coupling said interconnect device to said bridge circuit means, said bridge circuit means providing an output signal in response to said radio frequency input signal when a value of said interconnect device impedance in said bridge circuit means changes;

first signal processing means responsive to said output signal for providing a DC signal proportional to slow changes in said interconnect device impedance; and

second signal processing means responsive to said output signal for providing a count signal in response to intermittent changes in said interconnect device impedance.

2. The apparatus for testing an impedance of an interconnect device of claim 1 wherein said bridge circuit means further includes three resistive elements and a transformer, said input signal being applied to first terminals of said three resistive elements and said interconnect device cable, a primary winding of said transformer being coupled to second terminals of said three resistive elements and said interconnect device cable, said output signal being provided by secondary windings of said transformer.

3. The apparatus for testing an impedance of an interconnect device of claim 2 further comprising

a terminating impedance coupled across said transformer secondary windings.

4. The apparatus for testing an impedance of an interconnect device of claim 2 wherein said three resistive elements, said one arm, and said transformer are mutually positioned to enhance high frequency response.

5. The apparatus for testing an impedance of an interconnect device of claim 3 wherein said second signal processing means includes amplifying means for amplifying said bridge circuit output signal.

6. The apparatus for testing an impedance of an interconnect device of claim 5 wherein said second signal processing means for determining temporary change parameters includes:

a first voltage comparator responsive to an output voltage from said amplifying means, said first voltage comparator providing clock signals having a frequency determined by said radio frequency input signal when an intermittent interconnect device impedance change is greater than a predetermined value; and

a second voltage comparator responsive to said output signal from said amplifying means, said second voltage comparator having a first output signal state when said interconnect device impedance change is greater than said predetermined value, said clock signals permitting an interconnect impedance change greater than said predetermined value to be timed.

7. The apparatus for testing an impedance of an interconnect device of claim 6 further including impedance means coupled to said coupled impedance for controllably altering an impedance in said one arm of said bridge circuit means including said interconnect device.

8. The apparatus for testing an impedance of an interconnect device of claim 7 wherein said impedance means includes a diode coupled in series with said coupled impedance, wherein said impedance of said one arm of said bridge circuit means is altered when said diode is changed from a conducting to a non-conducting state.

9. The apparatus for testing an impedance of an interconnect device of claim 5 wherein said first signal processing means for providing a DC signal includes:

a filter unit for rectifying and filtering said amplifying means output signal; and

an operational amplifier for providing said DC signal in response to said rectified and filtered signal.

10. The apparatus for testing an impedance of an interconnect device of claim 9 wherein said first signal processing means further includes a first and a second diode, said first diode rectifying said amplifying means output signal, said second diode in an output circuit of said operational amplifier compensating for a voltage drop across said first diode.

11. The method of testing an impedance of an interconnect device used to couple data processing system components, said method comprising the steps of:

coupling said interconnect device to a first end of a cable;

coupling a coupled impedance to said interconnect device, said coupled impedance and an interconnect device having a characteristic impedance of said cable;

coupling a second end of said cable in one arm of said bridge circuit, impedances of remaining arms of said bridge circuit being chosen to balance an impedance associated with said one arm;

applying a radio frequency signal across said bridge circuit;

detecting an imbalance signal when said bridge circuit is not balanced because of an intermittent change in impedance in said one arm when said change is greater than a preselected value; and

processing said imbalance signal to provide a state signal during said intermittent change in impedance and to provide a clock signal with a frequency determined by said radio frequency signal.

12. The method of testing an impedance of an interconnect device of claim 11 wherein said processing step includes the steps of:

using said state signals to determine a number of intermittent signals having a number of said intermittent changes; and

using said clock signals to determine a duration of a one of said intermittent changes.

13. The method of testing an impedance of an interconnect device of claim 12 further comprising the step of calibrating said method of testing by a controllable intermittent impedance change in said one arm.

14. The method of testing an impedance of an interconnect device of claim 11 wherein said processing step includes generating a continuous output signal that is proportional to a long term change of an impedance of said interconnect device.

15. The method of testing an impedance of an interconnect device of claim 14 wherein said generating step includes generating said continuous output signal over an extended period of time.

16. The method of testing an impedance of an interconnect device of claim 15 wherein said generating step includes a step of generating said continuous output signal while said interconnect device is being subjected to preselected environments.

17. Test apparatus for testing intermittent and long term changes in an impedance of an interconnect device used in coupling data processing system components, said test apparatus comprising:

bridge means with terminals for receiving a radio frequency signal, wherein said interconnect device is coupled to a first arm of said bridge means by means of a cable, wherein said interconnect device has a first impedance coupled thereto, said first impedance and an interconnect impedance providing a characteristic impedance for said cable, said bridge means for providing an imbalance signal when an impedance of said first arm changes from an initial value and said radio frequency signal is applied to said bridge means;

amplifier means for receiving said imbalance signal and for providing a first output signal during a period when an intermittent first arm impedance change exceeds a preselected value, said amplifier means providing a clock signal having a frequency determined by said radio frequency signal during said period.

18. The test apparatus for testing an impedance of an interconnect device of claim 17 wherein said amplifier means provides a second output signal when a generally steady state change in said impedance exceeds a preestablished amount, said second output signal being proportional to an interconnect device impedance change, said amplifier means including:

a first amplifier for receiving said imbalance signal;

a first diode coupled to an output terminal of said first amplifier;

a second amplifier for receiving a rectified output signal from said first diode and a first input terminal; and

a second diode coupled between an output terminal of said second amplifier and a second input terminal of said second amplifier.

19. The test apparatus for testing an impedance of an interconnect device of claim 17 wherein said amplifier means includes:

amplifier means responsive to said imbalance for providing an intermediate signal having low frequency signal components minimized;

event detection means responsive to said intermediate signal for providing said first output signal during said period when said first arm intermittent impedance change exceeds said preselected value; and

clock means responsive to said intermediate signal for providing said clock signal during said period.

20. The test apparatus for testing an impedance of an interconnect device of claim 19 wherein said radio frequency signal has frequency of 2 MHz to 100 MHz.

21. The test apparatus for testing an impedance of an interconnect device of claim 20, wherein said interconnect device impedance change is intermittent, said 100 MHz radio frequency signal permitting measurement of an interconnect impedance change lasting 5 nanoseconds.

22. The test apparatus for testing an impedance of an interconnect device of claim 19 further comprising test means for generating a controllable intermittent impedance change in said first arm for testing said amplifier means.

23. The test apparatus for testing an impedance of and interconnect device of claim 22 wherein said test means provides an intermittent controllable change in said first arm impedance by controlling a bias voltage across a diode.