Wafer prober

• US 4,864,227 A
• Filed: 02/23/1988
• Issued: 09/05/1989
• Est. Priority Date: 02/27/1987
• Status: Expired due to Term

• Current Assignee: Canon Ayutthaya Limited (Canon Inc.)
• Original Assignee: Canon Ayutthaya Limited (Canon Inc.)
• Inventors: Sato, Mitsuya
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): Nguyen, Vinh P.
• Application Number:
  US07/158,736
• Time in Patent Office: 560 Days
• Field of Search: 324/158 F, 324/158 P, 324/73 PC, 324/73 AT, 364/559, 364/552, 356/400, 356/222, 33/533, 33/557
• US Class Current: 324/750.19
• CPC Class Codes: G01R 1/06794 Devices for sensing when probes are in contact, or in position to contact, with measured object
• CPC Class Codes: G01R 1/07342 the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06

Abstract

Wafer prober usable for examining, in a predetermined sequence, integrated microcircuits formed on a semiconductor wafer, is disclosed. The prober includes a contact plate which is movable in a Z-axis direction (the direction of height). The contact of the contact plate to a probe needle group is detected by detecting deformation of the contact plate. From the position of the contact plate at the time of deformation, the position of the needle tips of the probe needle group in the Z-axis direction is detected automatically. In another aspect, a laser beam source and a photosensor are provided as a unit with a wafer stage which is movable in each of an X-axis direction, a Y-axis direction and a θ (rotational) direction while carrying thereon a semiconductor wafer. With the aid of the movement of the wafer stage, the laser beam emitted from the laser beam source toward the photosensor is crossed by the probe needle group. On the basis of an output of the photosensor and the position of the wafer stage, at the time of the crossing, the position of the probe needle group with respect to each of the X-axis direction, the Y-axis direction and the θ direction is detected automatically. In a further aspect, automatization of the positioning of a probe card occurs when it is introduced into a wafer prober.

Claims

1. A wafer prober, comprising:

a wafer holder for holding a wafer;

a stage operable to move said wafer holder substantially in an X-axis direction and a Y-axis direction as well as substantially in a Z-axis direction which is perpendicular to each of the X-axis direction and the Y-axis direction;

a card holder for holding a probe card having a probe needle which is contactable to a bonding pad of the wafer when it is held by said wafer holder; and

detecting means operable to detect the position, with respect to the Z-axis direction, of the probe needle of the probe card as it is held by said card holder, said detecting means including a plate-like deformable member movable with said wafer holder, wherein the position of the probe needle is detected on the basic of deformation of said plate-like member by press-contact of the probe needle to said plate-like member.

2. A wafer prober according to claim 1, wherein said plate-like member has a surface to be contacted to the probe needle and wherein said plate-like member is supported so that said surface is placed substantially in parallel to a plane defined by the X and Y axes.

3. A wafer prober according to claim 1, wherein said plate-like member has an electrically conductive thin film formed on the surface thereof which is not contactable to the probe needle and wherein said detecting means includes an electrically conductive base member which is contactable with said thin film of said plate-like member in response to the deformation of said plate-like member.

4. A wafer prober according to claim 3, wherein said plate-like member has a central portion which is divided into plural segments.

5. A wafer prober according to claim 3, wherein said base member is formed with a passageway effective to supply a gaseous fluid between said plate-like member and said base member.

6. A wafer prober, comprising:

a wafer holder for holding a wafer;

a stage operable to move said wafer holder substantially along an X axis and a Y axis;

a card holder for holding a probe card having a probe needle which is contactable to a bonding pad of the wafer as it is held by said wafer holder; and

detecting means operable to detect the position, with respect to the directions along the X and Y axes, of the probe needle of the probe card as it is held by said card holder, said detecting means including a needle sensing unit which is movable as a unit with said wafer holder, said needle sensing unit having a source of a laser beam, a photodetector and a detecting optical system which is operable to direct the laser beam from said source in a direction substantially parallel to a plane defined by the X and Y axes and to direct the laser beam to said photodetector.

7. A wafer prober according to claim 6, wherein said photodetector is effective to detect the interception of the laser beam by the probe needle.

8. A wafer prober according to claim 7, wherein said detecting means further includes a scale for measuring the position of said needle sensing unit with respect to the directions of the X and Y axes.

9. A wafer prober according to claim 6, wherein said stage is operable to rotationally move said wafer holder in a plane substantially parallel to the plane defined by the X and Y axes, wherein said needle sensing unit is provided eccentrically with respect to the center of rotational motion of said wafer holder and wherein said stage is operable, when said needle sensing unit is rotationally moved about said wafer holder, to move said wafer holder at least in one of the X-axis direction and the Y-axis direction on the basis of an output of said photodetector.

10. A wafer prober according to claim 6, wherein said stage is operable to rotationally move said wafer holder in a plane substantially parallel to the plane defined by the X and Y axes, wherein said needle sensing unit is provided eccentrically with respect to the center of rotational motion of said wafer holder, wherein said stage is operable to rotationally move said needle sensing unit about said wafer holder after said photodetector detects the interception of the laser beam by the probe needle and wherein, at the time of the rotational motion of said needle sensing unit, said stage moves said needle sensing unit at least in one of the X-axis direction and the Y-axis direction so as to maintain the interception of the laser beam by the probe needle.

11. A wafer prober, comprising:

a wafer holder for holding a wafer;

a stage operable to move said wafer holder substantially in each of the directions of X and Y axes and in the direction of a Z axis which is perpendicular to the X and Y axes;

a card holder for holding a probe card having a probe needle which is contactable to a bonding pad of the wafer as it is held by said wafer holder; and

detecting means operable to detect the position, with respect to each of the X-axis direction and the Y-axis direction, of the probe needle of the probe card as it is held by said card holder, said detecting means including a needle sensing member which is resiliently supported by a spring member movable in the Z-axis direction as a unit with said wafer holder and which is contactable to the probe needle of the probe card as it is held by said card holder, wherein the position of the probe needle is detected on the basis of inclination of said needle sensing member by contact to the probe needle.

12. A wafer prober according to claim 11, wherein said detecting means comprises a source of a laser beam and a projection optical system effective to project the laser beam from said source upon a surface of said needle sensing member which surface is not contactable to the probe needle and wherein said detecting means includes a detector having a light-receiving surface adapted to receive the laser bean reflected by said surface of said needle sensing member in a direction corresponding to the inclination of said needle sensing member, said detector producing a signal corresponding to the position of incidence to the laser beam upon said light-receiving surface.

13. A wafer prober according to claim 11, wherein said stage is operable to repeated contact said needle sensing member to the probe needle so that the ratio of a spring constant related to the probe needle and a spring constant related to said spring member resiliently supporting said needle sensing member can be determined.

14. A wafer prober, comprising:

a wafer holder for holding a wafer;

a stage operable to move said wafer holder substantially in the direction of X and Y axes and in the direction of a Z axis which is perpendicular to the X and Y axes;

a card holder for holding a probe card having a probe needle which is contactable to a bonding pad of the wafer as it is held by said wafer holder; and

detecting means operable to detect the position of the probe needle of the probe card as it is held by said card holder, said detecting means including a needle sensing unit movable as a unit with said wafer holder at least in each of the X-axis direction and the Y-axis direction, said needle sensing unit having a source of a laser beam, a photodetector and a detecting optical system effective to direct the laser beam from said source substantially in parallel to a plane defined by the X and Y axes and to direct the laser beam to said photodetector, said detecting means further including a deformable plate movable with said wafer holder in the Z-axis direction, wherein the position of the probe needle in the Z-axis direction is detected on the basis of deformation of said plate by contact of the probe needle to said plate.

15. A wafer prober according to claim 14, wherein said detecting means further includes a spring member movable as a unit with said wafer holder at least in the Z-direction and which is contactable to the probe needle, wherein the position of the probe needle is detected on the basis of inclination of said needle sensing member by contact to the probe needle.