Datuming of analogue measurement probes
First Claim
1. A method of datuming an analogue measurement probe in position determining apparatus, the probe having an output indicative of a distance of a surface of an object from the probe along a measurement axis of the probe when the distance is within a measuring range of the probe, the apparatus having means for moving the probe relative to the object and position determining means for taking a reading of the position of the probe with respect to at least one measurement axis of the apparatus, the method comprising:
- (a) providing a test object having a datum point;
(b) moving the probe into a plurality of surface-sensing positions with respect to the test object and using the position determining means to take a first set and a second set of said readings, the readings within each set being in respect of different surface positions of the test object and being sufficient to make a determination from that set of readings of the position of said datum point of the test object, each reading of the first set being taken when the probe output indicates that the probe is substantially at a first point within its measuring range and each reading of the second set being taken when the probe output indicates that the probe is substantially at a second point within its measuring range;
(c) making a first determination of the position of said datum point of the test object from the first set of readings and a second determination thereof from the second set of readings; and
(d) deriving from the first and second determinations of the position of said datum point a correction factor for use in correcting the probe output for any angular deviation between the measurement axis of the probe and the measurement axis of the apparatus.
1 Assignment
0 Petitions
Accused Products
Abstract
An optical analogue probe (9) is used on a co-ordinate measuring machine (1). Prior to use, it is datumed to compensate for any misalignment of the angle (θ) of its measurement axis (12A) from each of the machine'"'"'s axes (X,Y,Z). Trigger points (D2,D3) are defined near opposite ends of the probe'"'"'s measurement range (MR). A first set of machine X,Y,Z co-ordinates of at least four points (40) on a test sphere (38) are taken at one probe trigger point (D2). A corresponding set of co-ordinates for another four points (44) are taken at the other trigger point (D3). For each set of co-ordinates, a calculation is made of the center of the sphere, giving respective center points (42,46). The vector between these center points (42,46) is parallel to the measurement axis (12A) of the probe (9). From this vector, direction cosines are calculated for correcting the probe output to give X,Y and Z values.
42 Citations
8 Claims
-
1. A method of datuming an analogue measurement probe in position determining apparatus, the probe having an output indicative of a distance of a surface of an object from the probe along a measurement axis of the probe when the distance is within a measuring range of the probe, the apparatus having means for moving the probe relative to the object and position determining means for taking a reading of the position of the probe with respect to at least one measurement axis of the apparatus, the method comprising:
-
(a) providing a test object having a datum point; (b) moving the probe into a plurality of surface-sensing positions with respect to the test object and using the position determining means to take a first set and a second set of said readings, the readings within each set being in respect of different surface positions of the test object and being sufficient to make a determination from that set of readings of the position of said datum point of the test object, each reading of the first set being taken when the probe output indicates that the probe is substantially at a first point within its measuring range and each reading of the second set being taken when the probe output indicates that the probe is substantially at a second point within its measuring range; (c) making a first determination of the position of said datum point of the test object from the first set of readings and a second determination thereof from the second set of readings; and (d) deriving from the first and second determinations of the position of said datum point a correction factor for use in correcting the probe output for any angular deviation between the measurement axis of the probe and the measurement axis of the apparatus. - View Dependent Claims (2, 3, 4, 5, 6)
-
-
7. In a position determining apparatus having at least one measurement axis and comprising:
-
an analogue measurement probe having an output indicative of a distance of a surface of an object from the probe along a measurement axis of the probe when the distance is within a measuring range of the probe; means for moving the probe relative to an object; position determining means for taking a reading of the position of the probe with respect to the at least one measurement axis of the apparatus; said apparatus further comprising; (a) a test object having a datum point; (b) means for moving the probe into a plurality of surface-sensing positions with respect to said test object and using the position determining means to take a first set and a second set of readings, the readings within each set being in respect of different surface positions of the test object and being sufficient to make a determination from that set of readings of the position of said datum point of the test object, each reading of the first set being taken when the probe output indicates that the probe is substantially at a first point within its measuring range and each reading of the second set being taken when the probe output indicates that the probe is substantially at a second point within its measuring range; (c) means for making a first determination of the position of said datum point of the test object from the first set of readings and a second determination thereof from the second set of readings; and (d) means for deriving from the first and second determinations of the position of the datum point a correction factor for use in correcting the probe output for any angular deviation between the measurement axis of said probe and the measurement axis of the apparatus. - View Dependent Claims (8)
-
Specification