Lead inspection system for surface-mounted circuit packages

• US 4,875,778 A
• Filed: 04/25/1988
• Issued: 10/24/1989
• Est. Priority Date: 02/08/1987
• Status: Expired due to Fees

• Current Assignee: Edward J. Roberts, Richard J. Luebbe
• Original Assignee: Edward J. Roberts, Richard J. Luebbe
• Inventors: Luebbe, Richard J., Hopkins, H. Kenneth
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US07/185,838
• Time in Patent Office: 547 Days
• Field of Search: 356/237, 356/372, 356/375, 356/387, 356/394, 388/101, 388/106, 388/107, 250/561, 250/562
• US Class Current: 356/394
• CPC Class Codes: H05K 13/0813 Controlling of single components prior to mounting, e.g. orientation, component geometry H05K13/0812 takes precedence

Abstract

An electro-optical system for detecting selected geometrical properties of leads of circuit packages of the surface-mounted type. The system employs a horizontally-arranged linear array of photosensitive elements which is moved in a direction perpendicular to a reference surface and operated to provide a series of one-dimensional horizontal scans along the leads.

Claims

1. A process for inspecting leads on circuit packages of the surface-mounted type, comprising the steps of:

positioning a circuit package for inspection on a generally horizontal reference surface having at least one horizontal reference edge;

illuminating the package to produce sharp optical contrast at the edges and contact ends of the leads;

moving a horizontally-arranged linear array of photosensitive elements in a direction substantially perpendicular to the reference edge;

operating the horizontally-arranged linear array of photosensitive elements to provide a series of one-dimensional scans horizontally across the leads; and

analyzing signal information obtained from the horizontal scans to detect and measure selected geometrical properties of the inspected leads.

2. A process according to claim 1 wherein the signal information is analyzed to measure the vertical distance between the reference edge and the contact end of each lead.

3. A process according to claim 2 wherein all leads on all sides of the circuit package are scanned, and the signal information from the scans is analyzed to measure the extent to which the contact ends of the leads of the circuit package are coplanar within preselected limits.

4. A process according to claim 1 wherein silhouettes of the package leads are produced by casting light onto the backs of the leads.

5. A process according to claim 1 including the step of focusing silhouetted images of the contact ends of leads onto the array.

6. A process according to claim 1 including the steps of detecting vertical travel of the horizontal array relative to the reference edge, providing position-identifying signals that represent the location of the vertically moving array, and employing the position-identifying signal information to provide selected measures of the geometry of the contact ends of the leads.

7. A process according to claim 1 wherein the position-identifying signal information is analyzed to measure the extent to which the contact ends of leads deviate from the plane of the reference surface.

8. A process according to claim 1 wherein the signal information is analyzed to measure center-to-center distances between leads.

9. A process according to claim 1 wherein the signal information is analyzed to measure edge-to-edge spacings between leads.

10. A process according to claim 1 wherein the signal information is analyzed to measure standoff of the circuit package relative to the reference surface.

11. A process for inspecting leads on circuit packages of the surface-mounted type comprising the steps of:

positioning a circuit package for inspection on a generally horizontal reference surface having a horizontal edge;

moving a horizontally-arranged linear array of photosensitive elements in a direction which is perpendicular to the reference surface;

operating the photosensitive elements of the linear array to provide a series of one-dimensional scans along the leads in the horizontal direction;

analyzing signal information provided by the scans to measure selected geometrical properties of the inspected leads.

12. A process according to claim 11 including the steps of detecting vertical movement of the array relative to the reference surface, providing position -identifying signals that represent the location of the array, and employing the position-identifying signal information to measure geometrical properties of the contact ends of the leads.

13. A process according to claim 11 wherein silhouettes of the package leads are produced by casting light onto the backs of the leads and the photosensitive elements are operated to detect outlines provided by the silhouettes.

14. A process according to claim 12 wherein the position-identifying signal information is analyzed to measure the vertical distance between the reference edge and the contact end of each lead.

15. A process according to claim 14 wherein the signal information is analyzed to determine the spacing between leads.

16. A process for inspecting leads on circuit packages of the surface-mounted type, comprising the steps of:

positioning a circuit package for inspection on a generally horizontal reference surface having a horizontal reference edge;

providing illumination to silhouette the package leads;

moving a horizontally-extending linear array of photosensitive elements in a direction perpendicular to the reference surface, and detecting the position of the moving array relative to the reference edge;

operating the array of photosensitive elements to provide a series of horizontally scans; and

analyzing the signal information obtained from the horizontal scans to measure geometrical properties of the inspected leads.

17. A system for inspecting leads on circuit packages of the surface-mounted type comprising:

support means for providing a horizontal reference surface for supporting a circuit package for inspection;

illumination means for silhouetting the package leads;

a linear array of photosensitive elements mounted to extend horizontally and operative to provide one-dimensional scans of the leads of the package under inspection;

means for moving the linear array vertically relative to the support means; and

means for analyzing signal information provided by the photosensitive elements of the linear array during a series of scans to provide information as to geometrical properties of the inspected leads.

18. A system according to claim 17 wherein the information obtained from scans made by the linear array is used to measure the vertical distances between the reference surface and the contact ends of the inspected leads.

19. A system according to claim 17 further including location-detecting means for detecting the location of the array relative to the reference surface.

20. A system according to claim 19 wherein the means for analyzing signal information employs signals from the location-detecting means and from the photosensitive elements to measure the distance between the contact ends of inspected leads and the reference surface.

21. A system for inspecting leads on circuit packages of the surface-mounted type comprising:

support means for providing a reference surface for supporting a circuit package for inspection;

a linear array of photosensitive elements mounted to extend horizontally to scan the leads of the circuit package;

means for moving the linear array in a direction perpendicular to the reference surface; and

means for analyzing signal information provided by the linear array to detect selected geometrical properties of the leads.

22. A system according to claim 21 further including illumination means to silhouette the contact ends of the package leads.

23. A system according to claim 22 wherein the illumination means includes a reflector mounted to the support means to reflect light onto the back surfaces of the package leads.

24. A system according to claim 23 wherein the support means has an aperture formed therein to received light which is to be reflected by the reflected means.