Method and apparatus for calibrating an imaging sensor

• US 4,876,453 A
• Filed: 02/19/1986
• Issued: 10/24/1989
• Est. Priority Date: 02/19/1986
• Status: Expired due to Term

• Current Assignee: Raytheon Company (Rtx Corporation)
• Original Assignee: Hughes Aircraft Company (Rtx Corporation)
• Inventors: Wirick, Michael P.
• Primary Examiner(s): Fields, Carolyn E.
• Application Number:
  US07/830,788
• Time in Patent Office: 1,343 Days
• Field of Search: 250/252.1, 250/330, 250/332, 250/334, 250/349, 358/113
• US Class Current: 250/332
• CPC Class Codes: H04N 25/21 for transforming thermal infrared radiation into image signals
• CPC Class Codes: H04N 25/48 Increasing resolution by shifting the sensor relative to the scene
• CPC Class Codes: H04N 25/673 by using reference sources
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

An imaging sensor for scanning a thermal image is disclosed. The imaging sensor comprises a first set of elemental detectors operable to receive a thermal image during a first portion of the calibration cycle. A second set of elemental detector is provided which are operable to receive the image during a second portion of the calibration cycle. Means are provided for calibrating the first and second sets of elemental detectors by comparing the output of the first set of elemental detectors during the first portion of the calibration cycle with the outputs of the second set of elemental detectors during the second portion of the calibration cycle.

Claims

1. An imaging sensor for scanning a thermal image comprising:

a first set of elemental detectors operable to receive a portion of said thermal image during a first portion of a calibration cycle;

a second set of elemental detectors operable to receive said portion of said thermal image during a second portion of said calibration cycle; and

means for calibrating said first and second sets of elemental detectors by directly comparing the outputs of said first set of elemental detectors during said first portion of said calibration cycle with the outputs of said second set of elemental detectors during said second portion of said calibration cycle so that the relative responses between said first and second plurality of elemental detectors may be determined.

2. The imaging sensor of claim 1, wherein at least one of said elemental detectors in said first set of elemental detectors receives substantially the same thermal radiation during said first portion of said calibration cycle as at least one elemental detector in said second set of elemental detectors during the second portion of said calibration cycle.

3. The imaging sensor of claim 1, wherein said first and second sets of elemental detectors form a staring detector array.

4. The imaging sensor of claim 1, wherein said means for calibrating said first and second sets of elemental detectors includes means for sequentially displacing a predetermined portion of said thermal image with respect to said first and second sets of elemental detectors.

5. The imaging sensor of claim 4, wherein said means for sequentially displacing said predetermined portion of said thermal image includes a horizontal positioner and a vertical positioner.

6. The imaging sensor of claim 1, further including a diffuser through which said thermal image is received.

7. The imaging sensor of claim 1, further comprising a third set of elemental detectors operable to receive said portion of said thermal image during a third portion of said calibration cycle, said means for calibrating being further operable to calibrate said third set of elemental detectors by comparing the output of said third set of elemental detectors during said third portion of said calibration cycle with the output of said second set of elemental detectors during said second portion of said calibration cycle.

8. The imaging sensor of claim 7, further comprising a fourth set of elemental detectors operable to receive said portion of said thermal image during a fourth portion of said calibration cycle, said means for calibrating being further operable to calibrate said fourth set of elemental detectors by comparing the output of said fourth set of elemental detectors during said fourth portion of said calibration cycle with the output of said third set of elemental detectors during said third portion of said calibration cycle.

9. A method for calibrating a device for detecting a thermal image, said device comprising first and second sets of elemental detectors, said method comprising the steps of:

focusing a predetermined portion of said thermal image on a first elemental detector in said first set of elemental detectors, the thermal radiation distribution of said predetermined portion of said thermal image being nonuniform;

measuring the outputs of said first set of elemental detectors;

focusing said predetermined portion of said thermal image on a second elemental detector in said second set of elemental detectors;

measuring the outputs of said second set of elemental detectors; and

compensating for variations in the electrical characteristics between said first and second sets of elemental detectors by comparing the outputs of said first and second sets of elemental detectors.

10. The method of claim 9, wherein said step of compensating for variations in the electrical characteristics between said first and second sets of elemental detectors includes the step of comparing the outputs of said second set of elemental detectors when said predetermined portion of said thermal image is focused on said second elemental detector with the outputs of said first set of elemental detectors when said predetermined portion of said image is focused on said first elemental detector.

11. The method of claim 9, wherein said step of compensating for variations in the electrical characteristics between said first and second sets of elemental detectors includes the step of compensating for differences in the responsivities between said elemental detectors.

12. The method of claim 9, wherein said first and second sets of elemental detectors form a staring detector array.

13. The method of claim 9, wherein said thermal image remains substantially constant from when the outputs of said first set of detectors are measured to when the outputs of said second set of detectors are measured.

14. The method of claim 9, wherein said step of compensating for variations in the electrical characteristics between said first and second sets of elemental detectors includes the step of compensating for differences between the gains of the amplifiers associated with each of said elemental detectors.

15. The method of claim 9, wherein said device further comprises a third set of elemental detectors, said method comprising additional steps of:

focusing said predetermined portion of said thermal image on a third elemental detector in said third set of elemental detectors;

measuring the output of said third set of elemental detectors; and

compensating for variations in the electrical characteristics between said second and third sets of elemental detectors by comparing the outputs of said second and third sets of elemental detectors.

16. The method of claim 15, wherein said device further comprises a fourth set of elemental detectors, said method comprising the additional steps of:

focusing said predetermined portion of said thermal image on a fourth elemental detector in said fourth set of elemental detectors;

measuring the output of said fourth set of elemental detectors; and

compensating for variations in the electrical characteristics between said third and fourth sets of elemental detectors by comparing the outputs of said third and fourth sets of elemental detectors.

17. A method of calibrating a staring detector array during a calibration cycle without using a thermal reference source, said staring detector array having first and second sets of elemental detectors, said method comprising the steps of:

receiving a thermal image during said calibration cycle, said thermal image having a substantially constant distribution of infrared radiation during said calibration cycle;

sequentially displacing said thermal image on said staring detector array according to a predetermined pattern during said calibration cycle; and

calibrating said elemental detectors by comparing the outputs of a first set of elemental detectors during a first portion of said calibration cycle with the outputs of a second set of elemental detectors during a second portion of said calibration cycle.

18. The method of claim 17, wherein said step of receiving said thermal image includes the step of receiving said thermal image through a diffuser.

19. The method of claim 18, wherein said step of sequentially displacing said thermal image includes the step of actuating horizontal and vertical positioners to locate said thermal image on said staring detector array.

20. The method of claim 19, wherein said step of calibrating said elemental detectors includes the step of calculating the relative responses of substantially all of said elemental detectors with respect to a predetermined elemental detector in said staring detector array.

21. The method of claim 20, wherein said step of calibrating said elemental detectors permits compensation for differences in responsivities between each of said elemental detectors.

22. The method of claim 21, wherein said step of calibrating said elemental detectors permits compensation for differences in the gain characteristics of the amplifying electronics associated with each of said elemental detectors.

23. The method of claim 17, wherein said staring detector array further comprises a third set of elemental detectors, said step of calibrating said elemental detectors further comprises the step of comparing the output of said second set of elemental detectors during said second portion of said calibration cycle with the output of said third set of elemental detectors during a third portion of said calibration cycle.

24. The method of claim 23, wherein said staring detector array further comprises a fourth set of elemental detectors, said step of calibrating said elemental detectors further comprises the step of comparing the output of said third set of elemental detectors during said third portion of said calibration cycle with the output of said fourth set of elemental detectors during a fourth portion of said calibration cycle.