Charge transfer matrix type photodetector with integrated charge-filtering device

• US 4,881,249 A
• Filed: 05/01/1989
• Issued: 11/14/1989
• Est. Priority Date: 05/03/1988
• Status: Expired due to Fees

• Current Assignee: Thomson-CSF
• Original Assignee: Thomson-CSF
• Inventors: Vidal, Andre, Chautemps, Jacques
• Primary Examiner(s): Munson, Gene M.
• Application Number:
  US07/345,232
• Time in Patent Office: 197 Days
• Field of Search: 357/24, 357/30, 377/57-63, 358/213.26
• US Class Current: 377/60
• CPC Class Codes: H01L 27/14831 Area CCD imagers
• CPC Class Codes: H04N 25/443 by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
• CPC Class Codes: H04N 25/621 for the control of blooming
• CPC Class Codes: H04N 25/622 by controlling anti-blooming drains
• CPC Class Codes: H04N 25/72 using frame transfer [FT]
• CPC Class Codes: H04N 3/1568 for disturbance correction or prevention within the image-sensor, e.g. biasing, blooming, smearing correction circuits H04N25/62

Abstract

A matrix photodetector includes, for example, at the bottom of the memory zone, an ancillary zone with a region having an implantation of a type opposite to that of the substrate, parallel to the transfer channels and followed by a region for the passage of the charges, located so as to be an extension of the tranfer channels, and surmounted by an ancillary gate capable of receiving low or high ancillary control signals to apply, to the passage region, low or high ancillary potential levels, which are respectively smaller, in terms of absolute value, than the levels of low or high potentials produced by the other gates, thus enabling a first filtering of the charges to be done before they are transferred into the read-out butter, in removing unwanted charges to an anti-blooming device, notably of the type with insulating zone.

Claims

1. A charge transfer matrix photodetector of the type comprising:

a first, partly photosensitive zone, wherein said charges are stored, said first zone having, on a semiconducting substrate;

a plurality of parallel charge transfer devices;

transfer gates, surmounting the transfer channels and being capable of receiving low or high control signals to apply a low or high potential level to the transfer channels, so as to enable the transfer of charges therein;

a second zone, connected to the first zone, capable of receiving at least a portion of the charges stored in the first zone, and comprising;

a read-out buffer extended by a read diode;

a read gate, surmounting the read-out buffer, and being capable of receiving low or high control signals to apply a low or high potential level to the read-out buffer, so as to enable the transfer of the charges, contained in the read-out buffer, into the read diode; and

,

filtering means acting on the read diode to deliver, at output, only useful charges corresponding to a useful portion of the incident light radiation,

wherein the filtering means comprise, in the first zone, an ancillary zone having a region with implantation of a type opposite to that of the substrate, parallel to the transfer channels and followed by a region for the passage of charges, said region being located in the extension of the transfer channels and being surmounted by an ancillary gate capable of receiving high or low ancillary control signals, to apply low or high ancillary levels of potential to the passage region, said ancillary levels of potential being respectively smaller, in terms of absolute value, than the low or high levels of potential produced by the other gates, thus enabling a first filtering of the charges to be performed before their transfer into the read-out buffer.

2. A device according to claim 1, wherein the ancillary zone has an antiblooming device of the type with insulating zone.

3. A device according to claim 1, wherein the passage region has a portion with implantation of a type identical to that of the substrate, and wherein the low or high ancillary control signals are respectively identical, in amplitude, to the low or high control signals of the other gates.

4. A device according to claim 1, wherein the ancillary low or high control signals have amplitudes different from the respective amplitudes of the other low or high control signals.

5. A device according to claim 1, wherein it is of the frame transfer type, the first zone including a first photosensitive sub-zone, called an image zone, followed by a second non-photosensitive sub-zone, called a memory zone, and wherein said ancillary zone is located at the bottom of the image zone.

6. A device according to the claim 1, wherein it is of the frame transfer type, the first zone including a first photosensitive sub-zone, called an image zone, followed by a second non-photosensitive sub-zone, called a memory zone, and wherein said ancillary zone is located at the bottom of the memory zone.

7. A device according to claim 1, wherein it is of the inter-line transfer type, including a first sub-zone, formed by photosensitive elements, particularly photodiodes, and a second sub-zone called a memory zone, comprising columns of charge transfer channels, and wherein said ancillary zone is located at the bottom of the memory zone.

8. A device according to any of the above claims, comprising at least one other anti-blooming device of the type with insulating zone, located in the photosensitive part of the first zone.