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Semiconductor test system

  • US 4,888,715 A
  • Filed: 11/19/1985
  • Issued: 12/19/1989
  • Est. Priority Date: 12/03/1984
  • Status: Expired due to Term
First Claim
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1. A semiconductor test system for testing functions of a semiconductor device and evaluating the same, said semiconductor test system comprising:

  • first storage means for storing all the output data signals supplied from said semiconductor device to be tested, said semiconductor device operating along a predetermined procedure;

    second storage means for storing said predetermined procedure in the form identical to internal machine code specific to said semiconductor device to be tested and for directly supplying said predetermined procedure to said semiconductor device to be tested;

    expected value storage means for storing expected values of said all of the output data to be supplied from said semiconductor device to be tested in the form of codes identical to those stored in said first storage means; and

    comparator means for directly receiving all the output data signals from said first storage means and said expected value storage means to compare the same with each other to determine whether or not said device is faulty.

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