Method of setting up apparatus for handling electrical or electronic components

• US 4,893,396 A
• Filed: 01/11/1989
• Issued: 01/16/1990
• Est. Priority Date: 01/28/1988
• Status: Expired due to Fees

• Current Assignee: Storax, Inc.
• Original Assignee: Emhart Industries, Inc. (Stanley Black & Decker, Inc.)
• Inventors: Dane, Derek R., Ainsworth, Steven J. H.
• Primary Examiner(s): Eley, Timothy V.
• Application Number:
  US07/295,964
• Time in Patent Office: 370 Days
• Field of Search: 29/407, 29/720, 29/740
• US Class Current: 29/407.04
• CPC Class Codes: H05K 13/089 Calibration, teaching or correction of mechanical systems, e.g. of the mounting head
• CPC Class Codes: Y10T 29/49769 Using optical instrument [excludes mere human eyeballing]

Abstract

A component placement machine comprising an X-Y table, at least two pick-up tools movable between an up-position and a down position is set up to allow for movement of each tool in a horizontal plane in moving between its down position and its up position. A test piece is removably mounted in a pocket on the X-Y table so that it is accurately reproducibly mounted. The test piece is picked-up by a pick-up tool in its down position and a detection device detects the actual position of the piece on the tool in its up position. This is repeated for all the tools so that, when the X-Y table drive is used to compensate for variations in component position on a tool, as detected by the detection device, account can be taken of said movement in a horizontal plane.

Claims

1. A method of setting up a component placement machine comprising a substrate supporting X-Y table, a head having a tool displaceable between an up position and a down component pick up/deposit position, the head movable, with the tool at the up position, to locate the tool at pick up, inspection and deposit locations, comprising

removably mounting a test component on the X-Y table at a precise X-Y location,

picking up the removably mounted test component with the tool,

displacing the tool to the up position and moving the head to locate the tool at the inspection station and

inspecting the test electronic component held by the tool at the inspection to determine its X-Y location, and

comparing the actual and theorretical X-Y locations and determining X, Y corrections for such tool as it is displaced between the inspection location and the deposit location.

2. A method according the claim 1, wherein the test electronic component is non circular, further comprising

removably mounting the test component ta a precise orientation,

inspecting the test electronic component held by the tool at the inspection station to determine its orientation and

comparing the actual orientation and the theoretical orientation of the test electronic component based upon the precise orientation of the test electronic component removably supported on the X-Y table and the displacement thereof to the inspection station and determining the orientation correction for such tool as it is displaced between the inspection location and the deposit location.