Semiconductor device
First Claim
Patent Images
1. A structure for a p-n junction gate type FET semiconductor device, comprising:
- a substrate;
a first silicon carbide layer disposed on said substrate for electrically insulating said substrate;
a second silicon carbide layer disposed on said first silicon carbide layer for forming an active layer of the semiconductor device, wherein said second silicon carbide layer is electrically insulated from said substrate by said first silicon carbide layer;
a third silicon carbide layer disposed on a first portion of said second silicon carbide layer for forming a channel layer;
a first electrode layer disposed on a second portion of said second silicon carbide layer for forming a source electrode and a drain electrode; and
a second electrode layer disposed on said third silicon carbide layer for forming a gate electrode.
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Abstract
The semiconductor device comprises a silicon substrate, a boron-doped high resistant silicon carbide layer that is formed on the silicon substrate and a silicon carbide layer formed on the high resistant silicon carbide layer. The silicon carbide layer that is formed on the high resistant silicon carbide layer provides an electrical insulation for the device so that improved device characteristics are obtained.
90 Citations
14 Claims
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1. A structure for a p-n junction gate type FET semiconductor device, comprising:
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a substrate; a first silicon carbide layer disposed on said substrate for electrically insulating said substrate; a second silicon carbide layer disposed on said first silicon carbide layer for forming an active layer of the semiconductor device, wherein said second silicon carbide layer is electrically insulated from said substrate by said first silicon carbide layer; a third silicon carbide layer disposed on a first portion of said second silicon carbide layer for forming a channel layer; a first electrode layer disposed on a second portion of said second silicon carbide layer for forming a source electrode and a drain electrode; and a second electrode layer disposed on said third silicon carbide layer for forming a gate electrode. - View Dependent Claims (2, 3, 4, 5)
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6. A structure for a semiconductor resistor, comprising:
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a substrate; a first silicon carbide layer disposed on said substrate for electrically insulating said substrate; a second silicon carbide layer disposed on said first silicon carbide layer for forming a resistive layer of the semiconductor resistor, wherein said second silicon carbide layer is electrically insulated from said substrate by said first silicon carbide layer and said second silicon carbide layer is formed of a nitrogen doped-type single crystal silicon layer; and an electrode layer disposed on said second silicon carbide layer for forming a pair of ohmic electrodes for the resistor. - View Dependent Claims (7)
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8. A structure for a semiconductor capacitor, comprising:
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a substrate; a first silicon carbide layer disposed on said substrate for electrically insulating said substrate; a second silicon carbide layer disposed on said first silicon carbide layer for forming a bottom plate layer of the semiconductor capacitor, wherein said second silicon carbide layer is electrically insulated from said substrate by said first silicon carbide layer; a dielectric layer disposed on a first portion of said second silicon carbide layer for forming a capacitance layer; a first electrode layer disposed on a second portion of said second silicon carbide layer for forming a first electrode contacted to said second silicon carbide layer, thereby forming a bottom plate; and a second electrode layer disposed on said dielectric layer for forming a top plate of the capacitor. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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Specification