Oximeter with monitor for detecting probe dislodgement

• US 4,901,238 A
• Filed: 05/02/1988
• Issued: 02/13/1990
• Est. Priority Date: 05/08/1987
• Status: Expired due to Fees

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: Suzuki, Susumu, Hakamata, Naotoshi, Ozaki, Takeo, Yagi, Sumio
• Primary Examiner(s): Smith, Jerry
• Assistant Examiner(s): Huntley, David
• Application Number:
  US07/188,912
• Time in Patent Office: 652 Days
• Field of Search: 128/633, 128/664, 128/665, 356/40, 356/41, 356/51, 364/413.01, 364/413.09, 200/61.02
• US Class Current: 600/407
• CPC Class Codes: A61B 5/14553 specially adapted for cerebral tissue
• CPC Class Codes: G01N 21/3151 using two sources of radiation of different wavelengths G01N21/33 - G01N21/39 take precedence

Abstract

An examination apparatus measures the oxygenation of body organs by using the near infrared transmission spectrophotometry. To assure the measurement reliability and the object person'"'"'s safety, the examination apparatus monitors the variation of the fitting position of an illumination-side fixture by detecting the reflection light quantity from the measuring object.

Claims

1. An examination apparatus for measuring the oxygenation in an object with electromagnetic wave transmission spectrophotometry, comprising:

light source means for sequentially emitting electromagnetic waves with different wavelengths;

an illumination-side fixture for making said electromagnetic waves introduced from said light source means incident on a measuring object and detecting reflected electromagnetic waves from said measuring object;

reflection light detection means for detecting said reflected electromagnetic waves introduced from said illumination-side fixture and outputting reflection light data;

output light detection means for detecting emitted electromagnetic waves from said light source means and outputting output light data; and

a computer system for receiving said reflection light data from said reflection light detection means and output light data from said output light detection means, and judging whether a fitting position of said illumination-side fixture has been changed on the basis of said reflection light data and said output light data.

2. An examination apparatus as claimed in claim 1, wherein said electromagnetic waves are near infrared light rays.

3. An examination apparatus as claimed in claim 1, wherein

said reflection light detection means further detects dark light reflected from said measuring object when said electro-magnetic waves are not emitted from said light source means and outputs dark light data;

and

said computer system receives said dark light data from said reflection light detection means, calculates variations of said dark light data from said dark light data at a beginning of a measurement period, and judges whether said fitting position has been changed on the basis of said variations of said dark light data.

4. An examination apparatus as claimed in claim 1, wherein

said computer system calculates reflectivities which are defined as ratios of said reflection light data to said respective output light data, calculates variations of said reflectivities from said ratios at a beginning of a measurement period, and judges whether said fitting position has been changed on the basis of said variations of said calculated reflectivities.

5. An examination apparatus as claimed in claim 1, wherein

said reflection light detection means further detects dark light reflected from said measuring object when said electro-magnetic waves are not emitted from said light source means and outputs dark light data;

and

said computer system calculates differences between said reflection light data and said dark light data, and reflectivities which are defined as ratios of said calculated differences to said respective output light data, calculates variations of said reflectivities from said ratios at a beginning of a measurement period, and judges whether said fitting position has been changed on the basis of said variations of said reflectivities.

6. An examination apparatus as claimed in claim 1, wherein said reflection light detection means and said output light detection means comprise:

a reflection light monitor detecting said reflected electro-magnetic wave and converting said reflected electro-magnetic wave into an analog electric signal of reflection light;

an output light monitor detecting said emitted electro-magnetic wave and converting said emitted electro-magnetic wave into an analog electric signal of output light;

a common data selector receiving said analog electric signals of reflection light and output light, selecting between said analog electric signals according to a selection signal sent from said computer system, and converting selected analog electric signals into digital signals; and

a common multi-channel data accumulator receiving said digital signals, accumulating received digital signals over a prescribed measurement period at every wavelength of emitted electromagnetic waves, and outputting accumulated digital signals as either said reflection light data or said output light data.