Circuit arrangement for evaluating the output of a photodiode unit

• US 4,914,283 A
• Filed: 01/26/1989
• Issued: 04/03/1990
• Est. Priority Date: 01/28/1988
• Status: Expired due to Term

• Current Assignee: Alcatel NV (Nokia Corporation)
• Original Assignee: Alcatel NV (Nokia Corporation)
• Inventors: Nestel, Siegfried, Brinckmann, Willi
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Allen, Stephone B.
• Application Number:
  US07/302,544
• Time in Patent Office: 432 Days
• Field of Search: 250/203 R, 250/203 S, 250/221, 250/208, 250/209, 250/578, 126/425
• US Class Current: 250/206.1
• CPC Class Codes: G01S 3/781 Details
• CPC Class Codes: G01S 3/784 using a mosaic of detectors

Abstract

The intensity of the optical radiation varies within a wide range. The proportion of parasitic radiation registered by the photodiodes (D1 to Dn) increases with increasing radiation intensity. To exclude this parasitic radiation from evaluation, the photodiodes (D1 to Dn) are followed by analog comparators (K1 to Kn) with a variable reference voltage (Uref1). The reference voltage (Uref1) is varied by an analog comparator (Kz1) in porportion to the radiation intensity determined by a central photodiode (Dz).

Claims

1. A circuit arrangement for determining the angle of incidence of optical radiation, comprising

a plurality of closely spaced photodiodes which each have a respective individual field of view corresponding to optical radiation having a different respective range of said angle of incidence,

central photodiode means having a combined field of view which includes all said individual fields of view,

a plurality of analog comparators, each having an input coupled to a respective one of the outputs from said plurality of photodiodes, a second input of each of the analog comparators being coupled to a common reference voltage,

a first analog comparator having an input coupled to the central photodiode means and a second input also coupled to the common reference voltage,

reference control means responsive to the output from the central photodiode means, for varying said common reference voltage in accordance with the intensity of radiation detected by the central photodiode.

2. A circuit arrangement as claimed in claim 1, wherein

at least the first analog comparator comprises a respective operational amplifier functioning as a differential amplifier having an inverting input and a non-inverting input, with the common reference voltage being coupled to the inverting input, and

said reference control means comprises a diode for feeding the output of that differential amplifier back to the inverting input thereof and a storage capacitor coupled between said inverting input and a fixed potential.

3. A circuit arrangement as claimed in claim 1, wherein the output from the central photodiode means is also coupled to an input of a second comparator having a second input coupled to a second reference voltage,

an output of the second comparator is connected to respective control inputs of a plurality of electronic switches each respectively associated with a different one of the plurality of photodiodes, such that when the second comparator responds to a signal from the central photodiode means indicative of a level of incident optical radiation above a predetermined upper threshold, the plurality of electronic switches all assume a first state,

a plurality of load resistors are each coupled to a respective one of said plurality of electronic switches and to a respective one of the plurality of photodiodes such that the effective sensitivity of the respective photodiode is lowered when the respective switch assumes said first state, and

the output voltage of the first analog comparator is also responsive to the output of said second comparator, such that when said effective sensitivity is lowered, a corresponding change is also made in said first reference voltage.

4. The circuit arrangement of claim 1, wherein

said plurality of closely spaced photodiodes are arranged in a linear array extending in the direction of a first axis,

said array is disposed behind a surface parallel to said first axis,

said surface defines a slit extending in the direction of a second axis, perpendicular to said first axis

said optical radiation passes through said slit before it illuminates said array, and

said central photodiode means comprises a photodiode located in front of said surface adjacent to said slit.