Boresight alignment measuring apparatus and method for electro-optic systems

• US 4,917,490 A
• Filed: 02/04/1988
• Issued: 04/17/1990
• Est. Priority Date: 02/04/1988
• Status: Expired due to Fees

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Schaffer, James R. Jr., Pitalo, Stephen K., Lay, Henry P.
• Primary Examiner(s): Tarcza, Thomas H.
• Assistant Examiner(s): NOT, DEFINED
• Application Number:
  US07/152,401
• Time in Patent Office: 803 Days
• Field of Search: 250/341, 250/342, 356/153, 356/141, 356/152, 434/4, 89/41.06
• US Class Current: 356/152.1
• CPC Class Codes: F41G 3/145 using a target illuminator
• CPC Class Codes: F41G 3/326 for checking the angle between the axis of the gun sighting device and an auxiliary measuring device F41G3/323 takes precedence

Abstract

An apparatus and method are provided for static and dynamic testing of the boresight alignment of an electro-optic system, the system having a line-of-sight sensor responsive to first radiation from a target for sensing the location of the target and setting the direction of a target vector to correspond to the location of the target, and having a line-of-sight illuminator for directing an illumination beam of second radiation at the located target. The apparatus comprises a main optic for receiving the second radiation from the electro-optic system and focusing the second radiation about a focal point in a focal plane substantially perpendicular to a principal radiation path. The main optic includes a primary reflector for reflecting the first and the second radiations between the electro-optic system and a subreflector zone, a secondary reflector positioned in the subreflector zone and spaced from the primary reflector for reflecting the first and second radiations between the primary reflector and the focal plane along the principal radiation path. The apparatus comprises a first radiation source for generating a target beam of the first radiation and for directing the target beam along the principal radiation path sequentially to the secondary and primary reflectors and to the sensor of the electro-optic system, thereby causing the sensor to set the direction of the target vector in substantial correspondence with the target beam, and a detector responsive to the second radiation for detecting the location of the illumination beam relative to the location of the target vector.

Claims

1. An apparatus for static and dynamic testing of the boresight alignment of an electro-optic system having a line-of-sight sensor responsive to first radiation from a target for sensing the location of the target and setting the direction of a target vector to correspond to the location of the target, and a line-of-sight illuminator for directing an illumination beam of second radiation at the located target, the boresight alignment being the extent to which the target vector and the illumination beam have achieved a predetermined angular relationship, said apparatus comprising:

a main optic optically coupled to the electro-optic system and aligned with a principal radiation path for receiving the second radiation from the electro-optic system and focusing the second radiation about a focal point in a focal plane substantially perpendicular to said principal radiation path, said main optic including a primary reflector for reflecting the first and the second radiations between the electro-optic system and a subreflector zone, and a secondary reflector positioned in said subreflector zone and spaced from said primary reflector for reflecting the first and second radiations between said primary reflector and said focal plane along said principal radiation path;

first radiation source means positioned effectively in said principal radiation path for generating a target beam of the first radiation and for directing said target beam along said principal radiation path sequentially to said secondary reflector, to said primary reflector, and to the sensor of the electro-optic system, said target beam causing the sensor to set the direction of the target vector in substantial correspondence with said target beam; and

detecting means positioned effectively in said focal plane and in said principal radiation path and responsive to the second radiation for detecting the location of the illumination beam relative to the location of the target vector.

2. An apparatus as recited in claim 1, wherein said primary reflector reflects said first and second radiations between the electro-optic system and said subreflector zone for a plurality of locations of said apparatus relative to the electro-optic system.

3. An apparatus as recited in claim 1, wherein said primary reflector comprises a reflecting surface having surface geometry z₁ along a z-axis according to ##EQU3## where p² =x² +y², r₁ =-22.409, Δ

₁ =-1, and x, y and z are the three axes of a rectilinear coordinate system.

4. An apparatus as recited in claim 1, wherein said secondary reflector reflects the first and second radiations between said primary reflector and said principal radiation path for a plurality of locations of said apparatus relative to the electro-optic system.

5. An apparatus as recited in claim 1, wherein said secondary reflector comprises a reflecting surface having surface geometry z₂ along a z-axis according to ##EQU4## where p² =x² +y², r₂ =-7.272, Δ

₂ =-1.6112155, and x, y and z are the three axes of a rectilinear coordinate system.

6. An apparatus as recited in claim 1, wherein said first radiation source means includes an infrared radiation source.

7. An apparatus as recited in claim 1, wherein said first radiation source means includes an infrared radiation source spaced from said principal radiation path, and a first beam reflecting means positioned in said principal radiation path for reflecting said target beam from said infrared radiation source to said secondary reflector along said principal radiation path.

8. An apparatus as recited in claim 1, wherein said first radiation source means includes beam defining means positioned effectively in said focal plane and in said principal radiation path for defining said target beam.

9. An apparatus as recited in claim 8, wherein said beam defining means comprises a surface having an aperture, said surface being substantially opaque and said aperture being substantially transparent to the first radiation.

10. An apparatus as recited in claim 1, wherein said detecting means includes a detector matrix effectively positioned in said principal radiation path and responsive to the second radiation for detecting the direction of the illumination beam relative to the target vector.

11. An apparatus as recited in claim 10, wherein said detector matrix is spaced from said principal radiation path, and said detecting means includes second beam reflecting means positioned in said principal radiation path for reflecting the illumination beam from said principal radiation path to said detector matrix.

12. An apparatus as recited in claim 10, wherein said detecting means includes a fast detector positioned effectively in said principal radiation path and coupled to said detector matrix for triggering said detector matrix in response to said illumination beam.

13. An apparatus as recited in claim 12, wherein said detecting means includes diffusing means positioned effectively in said principal radiation path between said secondary reflector and said fast detector for diffusing the illumination beam to make said triggering of said fast detector independent of the exact location of the illumination beam.

14. An apparatus as recited in claim 12, wherein said fast detector is spaced from said principal radiation path, and said detecting means includes third beam reflecting means positioned in said principal radiation path for reflecting said illumination beam from said principal radiation path to said fast detector.

15. An apparatus as recited in claim 12, wherein said detecting means includes beam attenuation means positioned between said secondary reflector and at least one of said detector matrix and said fast detector for attenuating the illumination beam.

16. An apparatus as recited in claim 1, further including internal alignment means for aligning said first radiation source means with said detecting means, said internal alignment means including internal alignment radiation source means effectively positioned in said principal radiation path for generating an internal alignment beam of a third radiation to which said detecting means responds and for directing said internal alignment beam substantially along said principal radiation path sequentially to said secondary reflector and to said primary reflector, and retro-reflector means positioned substantially in said principal radiation path for receiving said internal alignment beam from said primary reflector and reflecting said internal alignment beam sequentially to said primary reflector, to said secondary reflector, and substantially along said principal radiation path to said detecting means.

17. An apparatus as recited in claim 16, wherein said first radiation source means includes beam defining means positioned effectively in said focal plane and in said principal radiation path between said internal alignment radiation source and said secondary reflector for defining said target beam, said beam defining means including a surface having an aperture with a spot positioned in said aperture, said surface and said spot being substantially opaque and said aperture other than said spot being substantially transparent to the first and third radiations.

18. An apparatus as recited in claim 7, further including internal alignment means for aligning said radiation source means with said detecting means, said internal alignment means including internal alignment radiation source means spaced from said principal radiation path for generating an internal alignment beam of a third radiation to which said detecting means responds and for directing said internal alignment beam to said first beam reflecting means, said first beam reflecting means reflecting said internal alignment beam substantially along said principal radiation path sequentially to said secondary reflector and to said primary reflector, and retro-reflector means positioned substantially along said principal radiation path for receiving said internal alignment beam from said primary reflector and reflecting said internal alignment beam sequentially to said primary reflector, to said secondary reflector, and substantially along said principal radiation path to said detecting means.

19. An apparatus as recited in claim 18, wherein said first radiation source means includes beam defining means positioned effectively in said focal plane and in said principal radiation path between said internal alignment radiation source and said secondary reflector for defining said target beam, said beam defining means including a surface having an aperture with a spot positioned in said aperture, said surface and said spot being substantially opaque and said aperture other than said spot being substantially transparent to the first and third radiations.

20. An apparatus as recited in claim 18, wherein said apparatus includes fourth beam reflecting means spaced from said principal radiation path and from said first beam reflecting means for reflecting in the alternative (1) said target beam from said first radiation source to said first beam reflecting means and (2) said internal alignment beam from said internal alignment radiation source means to said first beam reflecting means.

21. An apparatus as recited in claim 20, wherein said fourth beam reflecting means comprises a movable mirror.

22. A method for static and dynamic testing of the boresight alignment of an electro-optic system having a line-of-sight sensor responsive to first radiation from a target for sensing the location of the target and setting the direction of a target vector to correspond to the location of the target, and a line-of-sight illuminator for directing an illumination beam of second radiation at the located target, the boresight alignment being the extent to which the target vector and the illumination beam have achieved a predetermined angular relationship, said method comprising:

generating a target beam of the first radiation defined by an aperture in a focal plane and directing said target beam along a principal radiation path substantially perpendicular to said focal plane to a secondary reflector, reflecting said target beam at said secondary reflector to a primary reflector, and reflecting said target beam at said primary reflector to the sensor of the electro-optic system, said primary and secondary reflectors collimating said target beam, said target beam causing the sensor to set the direction of the target vector in substantial correspondence with said target beam; and

reflecting the illumination beam at said primary reflector to said secondary reflector, reflecting the illumination beam at said secondary reflector to a detector positioned in said focal plane along said principal radiation path, said primary and secondary reflectors focusing said illumination beam, and detecting the location of the illumination beam relative to the location of the target vector at said detector.

23. A method as recited in claim 22, further including:

generating an internal alignment beam including a spot image and directing said internal alignment beam substantially along said principal radiation path through said aperture sequentially to said secondary reflector, to said primary reflector, to a retro-reflector, to said primary reflector, to said secondary reflector, and substantially along said principal radiation path to said detector; and

detecting the location of said spot image contained in said internal alignment beam at said detector to align said detector with said target beam.