Tester for solid state electronic components

• US 4,924,177 A
• Filed: 04/29/1983
• Issued: 05/08/1990
• Est. Priority Date: 04/29/1983
• Status: Expired due to Term

• Current Assignee: Robert H. Mulz
• Original Assignee: Robert H. Mulz
• Inventors: Mulz, Robert H.
• Primary Examiner(s): Smith, Jerry
• Assistant Examiner(s): Baker, Stephen M.
• Application Number:
  US06/489,758
• Time in Patent Office: 2,566 Days
• Field of Search: 324/158 T, 324/133, 324/158 SC, 324/51, 324/73 R
• US Class Current: 324/133
• CPC Class Codes: G01R 19/16557 Logic probes, i.e. circuits indicating logic state (high, low, O); modifications of electronic switches or gates for indicating state of switch H03K17/18
• CPC Class Codes: G01R 31/2608 for testing bipolar transistors
• CPC Class Codes: G01R 31/263 for testing thyristors
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58

Abstract

A tester for determining basic electronic and circuit information of solid state components. The tester provides indications in 2- and 3-wire devices of short or open conditions, whether a transistor is NPN or PNP type and whether or not an SCR or triac will latch. Both visual and audible indications are provided and cooperatively provide the indications of component quality.

Claims

1. A quality tester for electronic components, said tester selectively providing indications of simple circuit continuity and, in two- and three-terminal solid state components, of short and open conditions, transistor type, and latchability of SCR'"'"'s and triacs, said tester comprising:

a DC voltage source having a positive side and a negative side;

bistable switching means connected to the positive and negative sides of said voltage source, said switching means having first and second stable positions;

a first lead selectively connected to the positive and negative sides of said voltage source;

a second lead selectively coupled to the negative and positive sides of said voltage source;

a first resistor connected between said second lead and said switching means;

a third lead connected between said first resistor and said switching means;

a second resistor connected in said third lead; and

a three-state visual indicator and diode means connected in parallel with said first resistor, said visual indicator and diode means having first and second terminals and providing selective quality indications for the component being tested;

said first and second leads being adapted to be connected to the leads of a two-lead device such as an LED, fuse, diode and two circuit leads for circuit continuity testing, the emitter and collector of a transistor, the two main terminals of a triac and the anode and cathode of a silicon controlled rectifier (SCR), to determine shorts and open circuits, said third lead being adapted to be connected to the base of the transistor, and the gate of the triac and the SCR, whereby said second resistor biases the transistor ON and latches the triac and the SCR;

said switching means and said visual indicator and diode means being adapted to distinguish NPN and PNP transistors from each other and to determine state of latching ability of SCR'"'"'s and triacs in either their positive or negative state by reversing the polarity of the applied voltage of said first and second leads and to said visual indicator and diode means, said switching means further changing the voltage polarity on said first and second leads to determine shorts, opens and conductive direction through various of the electronic components to be tested.

2. The tester recited in claim 1 wherein:

when said switching means is in said first position, said first lead is connected to said negative side of said voltage source and said second lead is connected through said first resistor to said positive side of said voltage source, thereby positively biasing one terminal of said visual indicator and diode means; and

when said switching means is in said second position, said first lead is connected to said positive side of said voltage, source and said second lead is connected through said first resistor to said negative side of said voltage source, thereby negatively biasing said one terminal of said visual indicator and diode means.

3. The tester recited in claim 1, and further comprising audible indicator means connected in parallel with said first resistor, said audible indicator means having first and second terminals and providing audible indications of current conduction in one of the components, said buzzer functioning simultaneously with one of said indicators of said visual indicator means.

4. The tester recited in claim 3 wherein when a diode is to be tested, non-actuation of both said indicator means with said switching means in said first position, said first lead connected to the anode of the diode and said second lead connected to the cathode of the diode, and actuation of said audible indicator means and the second state of said visual indicator and diode means indicates that the diode is not shorted or open.

5. The tester recited in claim 3 wherein when a diode is to be tested, non-actuation of both said indicator means with said switching means in said second position, said first lead connected to the cathode of the diode and said second lead connected to the anode of the diode, and actuation of said audible indicator means and the first state of said visual indicator and diode means indicates that the diode is not shorted or open.

6. The tester recited in claim 3 wherein:

said audible indicator means is connected across said first resistor through said switching means;

whereby

when said switching means in in said first position, said first terminal of said audible indicator means is connected to said positive side of said voltage source and said second terminal of said audible indicator means is connected to said second lead;

when said switching means is in said second position, said first terminal of said audible indicator means is connected to said second lead and said second terminal is connected to said negative side of said voltage source.

7. The tester recited in claim 3 wherein when a transistor is to be tested, with said switching means in said first position, said first lead connected to the emitter of the transistor and said second lead connected to the collector of the transistor, actuation of said audible indicator and diode means and one state of said visual indicator means indicates shorting between emitter and collector, non-actuation of said audible indicator means and actuation of said one state of said visual indicator and diode means indicates leakage through the base junction of the transistor.

8. The tester recited in claim 7 wherein, with said third lead connected to the base of the transistor, actuation of both said audible indicator means and said one state of said visual indicator and diode means indicates that the transistor is good and that it is an NPN type device.

9. The tester recited in claim 8 wherein non-actuation of said audible indicator and diode means and said visual indicator means with said switch selectively in both said first and said second positions indicates that the transistor is bad.

10. The tester recited in claim 8 wherein non-actuation of said audible indicator and diode means and said visual indicator means with said switching means in said first position, and actuation of said audible indicator means and the second state of said visual indicator and diode means when said switching means is in said second position indicates that the transistor is good and that it is a PNP type device.

11. A method for testing electronic components with a tester capable of providing indications of simple circuit continuity and, in two- and three-terminal solid state components, of short and open conditions, transistor type, and latchability of SCR'"'"'s and triacs, the tester comprising a DC voltage source having a positive side and a negative side, switching means connected to the positive negative sides of said voltage source, said switching means having first and second positions, a first lead selectively connected to the positive and negative sides of said voltage source, a second lead selectively coupled to the negative and positive sides of said voltage source, a first resistor connected between said second lead and said switching means, a third lead coupled between said first resistor and said switching means, a second resistor connected in said third lead, a three-state visual indicator and diode means connected in parallel with said first resistor, said visual indicator and diode means having first and second terminals, said method comprising the steps of:

setting said switching means to said first position;

connecting said first lead to one terminal of an electronic component to be tested;

connecting said second lead to a second terminal of said component;

observing visual indication means responses to provide information on electrical shorts within said component;

when testing a three terminal component, connecting said third lead to the third terminal of said component thereby biasing said component ON through said second resistor;

observing responses of said visual indication means to provide information as to quality of said component; and

setting said switching means to said second position to determine type of component.