Wide angle optical filters

• US 4,931,315 A
• Filed: 09/23/1988
• Issued: 06/05/1990
• Est. Priority Date: 12/17/1986
• Status: Expired due to Fees

• Current Assignee: GTE Products Corporation
• Original Assignee: GTE Products Corporation
• Inventors: Mellor, Charles E.
• Primary Examiner(s): Arnold, Bruce Y.
• Assistant Examiner(s): SHAFER, RICKY D
• Application Number:
  US07/248,675
• Time in Patent Office: 620 Days
• Field of Search: 427/42, 427/162, 427/166, 427/167, 427/165, 350/166
• US Class Current: 427/167
• CPC Class Codes: G02B 5/282 reflecting for infrared and transparent for visible light, e.g. heat reflectors, laser protection
• CPC Class Codes: Y10S 359/90 Methods

Abstract

A thin-film optical interference filter designed and manufactured to have high transmission of blue light and high reflectance of infrared light. The novel feature of this filter rests in the thin-film layer design at the top and bottom of a quarterwave stack and the manufacturing technique by which this thin-film design is deposited. The thin-film layer design suppresses the so called halfwave holes which occur at wide angles of incidence of the incoming light. This desirable effect is achieved by the proper layer thickness and refractive index control in the manufacturing process.

Claims

1. A method of fabricating a thin-film optical interference filter including a substrate and a plurality of layers applied seriatim on said substrate, said plurality of layers including first and second adjacent layers of the same coating material, said method comprising the steps of:

(a) adjusting the temperature of said substrate and any previously applied layers on said substrate to a first deposition temperature;

(b) applying said first layer of a first coating material on the last appllied layer on said substrate at said first deposition temperature, said first layer having a first index of refraction;

(c) changing the temperature of said substrate and any previously applied layers on said substrate, said previously applied layers now including said first layer, to a second deposition temperature; and

(d) applying said second layer of said first coating material on said first layer at said second deposition temperature, said second layer having a second index of refraction, said second index of refraction being unequal to said first index of refraction;

(e) whereby an optical boundary is formed between said first and second layers of said same coating material.

2. A method of fabricating a thin-film optical filter as described in claim 1 wherein said second deposition temperature is cooler than said first deposition temperature.

3. A method of fabricating a thin-film optical filter as described in claim 1 wherein said first coating material is silicon dioxide.

4. A method of fabricating a thin-film optical filter as described in claim 2 wherein said first deposition temperature is approximately 200°

C. or greater and said second deposition temperature is approximately 100°

C. or less.

5. A method of fabricating a thin-film optical filter as described in claim 1 wherein said substrate is glass.