Elastomeric connectors for electronic packaging and testing

• US 4,932,883 A
• Filed: 07/20/1989
• Issued: 06/12/1990
• Est. Priority Date: 03/11/1988
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Hsia, Liang-Choo, Stuebner, Fred E., McAndrew, Thomas P.
• Primary Examiner(s): Abrams, Neil
• Application Number:
  US07/384,089
• Time in Patent Office: 327 Days
• Field of Search: 439/66-74, 439/91, 324/158 P, 324/158 F, 361/412, 361/413, 361/414
• US Class Current: 439/66
• CPC Class Codes: G01R 1/07307 with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H05K 7/1061 co-operating by abutting

Abstract

An elastomeric connector for permanently or temporarily (for testing purposes) connecting area array chips without solder balls or wire bonds comprising an elastomer base material having through-hole conductors deposited therein, and surface conductor tabs which are electrically connected to the through-hole conductors deposited thereon. The surface conductor tabs have an overhanging contact region extending past the periphery of the through-hole conductors. Upon contact between the input/output pads of a chip and the overhanging contact regions of the elastomeric connector when aligned and biased towards each other, a requisite pressure causes a reactionary force by the elastomer base which facilites contact and automatic wipe. The elastomeric connectors may replace solder balls in chip connection applications, or may replace buckling beam test probe heads in chip test applications.

Claims

1. An elastomeric connector for connecting at least one input/output pad of a first electrical component located on the first surface of said elastomeric connector to at least one corresponding input/output pad of a second electrical component located on the second surface of said elastomeric connector comprising:

an elastomeric base,

at least one substantially linear through-hole conductor extending from said first surface of said elastomeric base to said second surface,

at least one surface conductor tab located on said first surface of said elastomeric base, said surface conductor tab being connected to said substantially linear through-hole conductor at said first surface of said elastomeric base, said surface conductor tab having an overhanging contact region extending past the periphery of said through-hole conductor,

said substantially linear through-hole conductor remains stationary while said first electrical component is urged against said overhanging contact region,

said overhanging contact region being substantially parallel to said first surface of said elastomeric base is aligned with input/output pad of said first electrical component mounted on said first surface of said elastomeric connector; and

said substantially linear through-hole conductor at said second surface of said elastomeric base being aligned with said input/output pad of said second electrical component located on said second surface of said elastomeric base to make direct surface engagement therewith.

2. The elastomeric connector of claim 1 wherein said elastomeric base is an integral part of said substrate.

3. The elastomeric connector of claim 1 wherein said input/output pads are arranged in an area array.

4. The elastomeric connector of claim 2 wherein said input/output pads are arranged in an area array.

5. The elastomeric connector of claim 1 wherein said elastomeric base is a material that will deform 25 to 50 percent in thickness upon the application of a pressure of less than 180 lbs/square inch.

6. The elastomeric connector of claim 3 wherein said elastomeric base is a polyurethane polymer.

7. The elastomeric connector of claim 4 wherein said elastomeric base is a porous polyurethane polymer.

8. The elastomer connector of claim 2 wherein said elastomeric base is a material that will deform 25 to 50 percent in thickness upon the application of a pressure of less than 180 lbs/square inch.

9. The elastomeric connector of claim 1 wherein said electrical components located on said first surface of said elastomeric connector are semiconductor chips.

10. The elastomeric connector of claim 3 wherein said electrical components located on said first surface of said elastomeric connector are semiconductor chips.

11. The elastomeric connector of claim 1 wherein said substrate is a multilayered ceramic substrate.

12. The elastomeric connector of claim 2 wherein said substrate is a multilayered ceramic substrate.

13. The elastomeric connector of claim 3 wherein said substrate is a multilayered ceramic substrate.

14. The elastomeric connector of claim 1 wherein said through-hole conductor are comprised of metal.

15. The elastomeric connector of claim 14 wherein said surface conductor tabs are comprised of metal.

16. The elastomeric connector of claim 1 wherein the thickness of said elastomeric base is at least approximately 5 mils.

17. The elastomeric connector of claim 16 wherein the thickness of said surface conductor tabs is in the range of approximately 2 mils to approximately 5 mils.

18. The elastomeric connector of claim 1 wherein said second electrical component is a space transformer of a chip test probe.

19. The elastomeric connector of claim 2 wherein said second electrical component is a space transformer of a chip test probe.

20. The elastomeric connector of claim 3 wherein said second electrical component is a space transformer of a chip test probe.

21. The elastomeric connector of claim 14 wherein said second electrical component is a space transformer of a chip test probe.

22. The elastomeric connector of claim 17 wherein said second electrical component of a chip test probe.

23. The elastomeric connector of claim 1 wherein a non-oxidizing metal exists on the surface of said overhanging contact regions.

24. The elastomeric connector of claim 28 wherein said means for mechanically retaining comprises a flat plate which contacts and exerts a biasing force on said electrical components in the direction of said substrate.

25. The elastomeric connector of claim 24 wherein said flat plate is thermally conductive.

26. The elastomeric connector of claim 1 wherein means for mechanically retaining said electrical components are provided so that at least one said input/output pad of at least one said electrical component contacts said overhanging contact region of said elastomeric connector.

27. The elastomeric connector of claim 1 wherein said elastomeric base exerts a force so that said overhanging contact region each contact and wipe said corresponding input/output pad of said electric component.

28. The elastomeric connector of claim 1 wherein said input/output pad of said second electrical component has an overhanging contact region extending past the periphery of said through-hole conductor.