Method and apparatus for active vision image enhancement with wavelength matching

• US 4,933,541 A
• Filed: 06/29/1989
• Issued: 06/12/1990
• Est. Priority Date: 06/29/1989
• Status: Expired due to Fees

• Current Assignee: National Research Council Canada
• Original Assignee: Canadian Patents and Development Limited
• Inventors: Dufour, Marc
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Le, Que Tan
• Application Number:
  US07/373,066
• Time in Patent Office: 348 Days
• Field of Search: 250/202, 250/226, 356/376, 219/130.01, 219/124.34, 318/577
• US Class Current: 250/202
• CPC Class Codes: B23K 9/127 Means for tracking lines during arc welding or cutting copying in general B23Q35/00
• CPC Class Codes: G01B 11/2509 Color coding

Abstract

A method and apparatus for optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations. A beam of monochromatic light having a predetermined wavelength and a structured light pattern is projected onto the surface to thereby scatter the structured light beam and produce a scattered light beam which is thereafter separated into first and second scattered beam portions. The first scattered beam portion is passed through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to the wavelength of the projected light, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation. The second scattered beam portion is passed through a second optical filter having a narrow wavelength bandwidth and a central wavelength which is closely spaced from the predetermined wavelength of the projected light by a wavelength offset such as to reject the projected light wavelength, thereby providing a second optical output signal representative of substantially the same external light noise perturbation as that passing through the first optical filter. The first and second optical output signals are detected and converted into first and second electrical signals, respectively. The second electrical signal is then subtracted from the first electrical signal to provide a substantially noise-free electrical output signal representative of the surface geometry. The invention is particularly useful for active vision robot welding and enables arc light noise-free images to be obtained in real time.

Claims

1. A method of optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations, which comprises the steps of:

(a) projecting a beam of monochromatic light having a predetermined wavelength and a structured light pattern onto said surface to thereby scatter the structured light beam and produce a scattered light beam;

(b) separating said scattered light beam into first and second scattered beam portions;

(c) passing said first scattered beam portion through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to said predetermined wavelength, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation;

(d) passing said second scattered beam portion through a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, thereby providing a second optical output signal representative of substantially the same external light noise perturbation as that passing through said first optical filter;

(e) detecting said first and second optical output signals and converting same into first and second electrical signals, respectively; and

(f) subtracting said second electrical signal from said first electrical signal to provide a substantially noise-free electrical output signal representative of said surface geometry.

2. A method as claimed in claim 1, wherein step (a) is carried out by means of a laser diode optically coupled to an optical projection unit for projecting a structured laser beam onto said surface.

3. A method as claimed in claim 1, wherein step (b) is carried out by means of a 50%--50% beam splitter.

4. A method as claimed in claim 1, wherein said first and second optical filters comprise interference filters having a bandwidth ranging from about 2 to about 10 nanometers.

5. A method as claimed in claim 1, wherein said first and second optical filters have substantially the same bandwidth.

6. A method as claimed in claim 5, wherein said second optical filter has a central wavelength closely spaced from said predetermined wavelength by a wavelength offset which is substantially equal to the bandwidth of both said filters.

7. A method as claimed in claim 1, wherein step (e) is carried out by means of two separate CCD-type detectors.

8. A method as claimed in claim 7, wherein said first and second scattered beam portions are focussed through said first and second optical filters and onto said detectors.

9. A method as claimed in claim 7, wherein said first scattered beam portion is directed onto a mirror to produce a reflected beam portion which is thereafter directed through said first optical filter and onto one of said detectors.

10. A method as claimed in claim 7, wherein step (e) is carried out by means of an analog subtracting circuit connected to said detectors.

11. An apparatus for optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations, which comprises:

structured monochromatic light source means for generating a beam of monochromatic light having a predetermined wavelength with a structured light pattern and projecting same onto said surface to thereby scatter the structured light beam and produce a scattered light beam;

beam splitting means for separating said scattered light beam into first and second scattered beam portions travelling along respective optical paths;

a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to said predetermined wavelength, said first optical filter being arranged in the optical path of said first scattered beam portion to provide a first optical output signal representative of the surface geometry and of external light noise perturbation;

a second optical filter having a narrow bandwidth and a central wavelength which is closely spaced from said predetermined wavelength by a wavelength offset such as to reject said predetermined wavelength, said second optical filter being arranged in the optical path of said second scattered beam portion to provide a second optical output signal representative of substantially the same external light noise perturbation as that passing through said first optical filter;

first and second detector means for detecting said first and second optical output signals and converting same into first and second electrical signals, respectively; and

a subtracting circuit connected to said first and second detector means for subtracting said second electrical signal from said first electrical signal to provide a substantially noise-free electrical output signal representative of said surface geometry.

12. An apparatus as claimed in claim 11, wherein said structured monochromatic light source means comprises a laser diode optically coupled to an optical projection unit for projecting a structured laser beam onto said surface.

13. An apparatus as claimed in claim 11, wherein said beam splitting means comprises a 50%--50% beam splitter.

14. An apparatus as claimed in claim 11, wherein said first and second optical filters comprise interference filters having a bandwidth ranging from about 2 to about 10 nanometers.

15. An apparatus as claimed in claim 11, wherein said first and second optical filters have substantially the same bandwidth.

16. An apparatus as claimed in claim 15, wherein said second optical filter has a central wavelength closely spaced from said predetermined wavelength by a wavelength offset which is substantially equal to the bandwidth of both said filters.

17. An apparatus as claimed in claim 11, further including optical lens means for focussing said first and second scattered beam portions through said first and second optical filters and onto said first and second detector means.

18. An apparatus as claimed in claim 11, further including a mirror arranged in the optical path of said first scattered beam portion between said beam splitting means and said first optical filter for producing a reflected beam portion directed through said first optical filter and onto said first detector means.

19. An apparatus as claimed in claim 11, wherein said first and second detector means each comprise a CCD-type detector.

20. An apparatus as claimed in claim 11, wherein said subtracting circuit comprises an analog subtracting circuit.