Autofocus system and method of using the same

• US 4,935,612 A
• Filed: 11/17/1988
• Issued: 06/19/1990
• Est. Priority Date: 05/16/1986
• Status: Expired due to Fees

• Current Assignee: Reichert JUNG Optische Werks AG
• Original Assignee: Reichert JUNG Optische Werks AG
• Inventors: Bierleutgeb, Fritz
• Primary Examiner(s): Nelms, David C.
• Assistant Examiner(s): Allen, Stephone B.
• Application Number:
  US07/272,644
• Time in Patent Office: 579 Days
• Field of Search: 250/201 AF, 250/201 R, 250/204, 354/406-408, 350/507, 350/518, 350/519, 350/521, 350/522
• US Class Current: 250/201.2
• CPC Class Codes: G02B 21/00 Microscopes
• CPC Class Codes: G02B 21/18 Arrangements with more than one light path, e.g. for comparing two specimens
• CPC Class Codes: G02B 21/244 using image analysis techniques

Abstract

A microscope with continuously or discontinuously variable objective magnification is provided with an autofocus system whose beam path passes through the objective and is directed out of the imaging beam path of the microscope between objective and eye piece to at least one photo-electric detector means. At least one optical system is located or locatable in the beam path of the autofocus system which allows or causes the at least one image formed on the detector means to be altered in scale when a change in the objective magnification occurs. The at least one optical system can be a zoom system or a series of lenses or fixed lens systems arranged to be inserted into the beam path of the focusing system. When the objective or objective magnification is changed, a coupling mechanism serves to appropriately vary the focal length of the at least one optical system located or locatable in the beam path of the autofocus system. Furthermore, a pattern comprising a light/dark contrast is projected into the object plane. This ensures in incident light operations that the system is optimally focused even with low contrast objects.

Claims

1. A method of autofocusing an incident light microscope having an objective and a plurality of magnifications of an object, which comprises projecting light producing a pattern image onto the object, separating a portion of the image-producing light including reflected pattern image light received through the objective from the object, generating two signals from said portion, each of said signals varying inversely to the other signal changing the size of the reflected pattern image to modify said signals when the magnification is change and controlling the microscope focus with said modified signals.

2. The method according to claim 1, wherein reflected pattern image light is filtered from the remainder of the image producing light.

3. The method according to claim 2, wherein said signals are modified by a zoom lens system.

4. The method according to claim 2, wherein said pattern image is projected through a color filter and the remainder of the image producing light is passed through a complementary filter.

5. The method according to claim 2, wherein said projecting light is outside the visible spectrum.

6. The method according to claim 5, further including compensating for the difference between the image producing light and the pattern producing light.

7. The method according to claim 6, wherein the pattern is moved to compensate for the difference.

8. An autofocusing system for a variable power incident light microscope having an imaging system, including an objective, for providing a magnified image from light received from an object, a focusing mechanism and means to direct a portion of the image-producing light from the objective to said autofocusing system, which comprises projection means for producing a pattern image on the object, the pattern image light being reflected with the image-producing light, a beam divider to direct said portion along two paths, imaging optics located on each path, electro-optical means to convert light from said imaging optics into two electrical signals, each of said signals having one characteristic varying inversely to the one characteristic of the other as the microscope focus changes, optical means to vary the size of the image on said electro-optical means and modify said signals when the magnification is changed, and control means to drive the focusing mechanism in response to said signal, whereby deleterious effects of changes in magnification;

rapid scanning at high magnification or poor object contrast are reduced.

9. The system according to claim 8, wherein said optics include a zoom system.

10. The system according to claim 8, wherein the size of the image is maintained substantially constant as the magification is varied.

11. The system according to claim 8, wherein said projection means includes a color filter and the imaging system includes a complementary color filter.

12. The system according to claim 8, wherein said projection system includes a polarized filter and the imaging system includes a crossed polarized filter.

13. The system according to claim 8, wherein said projection system is temporarily disconnected when the object is in focus.

14. The system according to claim 8, wherein said pattern comprises one set of alternating parallel black lines separated by white bars.

15. The system according to claim 8, wherein said pattern comprises a plurality of light spots on a black background.

16. The system according to claim 8, wherein the light of said projection means has a chosen wavelength and the imaging system is not responsive to said chosen wavelength.

17. The system according to claim 14, wherein said pattern further includes another set of parallel black lines, said another set being perpendicular to said one set.

18. The system according to claim 15, wherein said plurality is organized in repeating parallel rows of round light spots.

19. The system according to claim 15, wherein said plurality is organized in alternating parallel rows of round light spots.

20. The system according to claim 16, wherein said chosen wavelength is outside the visible spectrum.

21. The system according to claim 20, wherein said chosen wavelength is in the near infrared and said projecting means compensates for said chosen wavelength.

22. The system according to claim 21, wherein said projecting means includes a pattern reticle and means to move said pattern reticle.