Polychromatic optical strain gauge

• US 4,939,368 A
• Filed: 04/13/1989
• Issued: 07/03/1990
• Est. Priority Date: 04/13/1989
• Status: Expired due to Fees

• Current Assignee: Massachusetts Institute of Technology
• Original Assignee: Massachusetts Institute of Technology
• Inventors: Brown, Stuart B.
• Primary Examiner(s): NOT, DEFINED
• Assistant Examiner(s): Beck, George C.
• Application Number:
  US07/337,317
• Time in Patent Office: 446 Days
• Field of Search: 250/231 R, 250/237 G, 250/550, 350/162.16, 350/162.16, 356/32, 356/35.5, 356/354, 356/800, 356/162.18, 356/162.22, 356/162.23, 356/162.24
• US Class Current: 250/231.1
• CPC Class Codes: G01B 11/165 by means of a grating deformed by the object

Abstract

A method and apparatus for measuring strain of an object is provided. The object to be measured is provided with a diffraction grating which is illuminated with radiation including at least two frequencies to produce an interference pattern. At least a portion of the interference pattern corresponding to at least one of the frequencies is detected and analyzed to determine strain. In some embodiments, the frequency of a portion of the diffraction pattern is detected, for example, by a human eye and the detected frequency compared with known frequencies to determine strain. In other embodiments, the relative angular position of portions of the pattern corresponding to different frequencies is detected. Since the relative angular position and intensity is affected by strain but not by certain rigid body rotations, strain measurement free of body rotation error may be made.

Claims

1. A method for measuring strain of an object comprising:

providing said object with a diffraction grating,

illuminating said grating with radiation including at least two frequencies to produce an interference pattern corresponding to said frequencies,

detecting at least a portion of the interference pattern corresponding to one of said frequencies, and

analyzing said interference pattern to determine strain.

2. The method of claim 1 wherein said detecting comprises detecting the frequency of said radiation of said interference pattern.

3. The method of claim 2 wherein said analyzing includes comparing said detected frequency with known frequencies indicative of the strain.

4. The method of claim 3 wherein said detector is a human eye.

5. The method of claim 2 wherein said detecting includes detecting at least a portion of said interference pattern corresponding to at least two frequencies and comparing said two frequencies to known frequencies indicative of said strain.

6. The method of claim 2 wherein said detecting includes the intensity of said frequency.

7. The method of claim 2 wherein said interference pattern detected corresponds to at least two frequencies, said detecting includes detecting the intensity distribution of said interference pattern for said frequencies, and said analyzing includes analyzing said distribution.

8. The method of claim 1 wherein said detecting comprises detecting the angular position of said portion of said interference pattern.

9. The method of claim 2 wherein said detecting comprises detecting the angular position for portions of the interference pattern corresponding to at least two different frequencies, and said analyzing includes comparing said positions to determine strain.

10. The method of claim 7 wherein said comparing includes finding the difference between said angles and comparing said differences to known differences to determine strain.

11. The method of claim 1 further comprising modulating said radiation before illuminating said diffraction grating.

12. The method of claim 11 wherein said analyzing includes demodulating said signal.

13. The method of claim 11 wherein said modulating includes chopping said radiation.

14. The method of claim 1 comprising selecting said radiation to include frequencies different from emission frequencies of said object and said detecting includes detecting said different frequencies.

15. The method of claim 1 wherein said portion of said diffraction pattern is a maximum.

16. The method of claim 15 wherein said maximum is a first order maximum.

17. The method of claim 1 wherein said detector detects the intensity of said diffraction pattern.

18. Apparatus for measuring strain of an object comprising:

a diffraction grating fixed to said object,

a source of radiation including two frequencies for illuminating said grating and producing an interference pattern,

a detector means for detecting at least a portion of said interference pattern corresponding to at least one of said frequencies, and

analysis means for analyzing said portion of said pattern for determining said strain.

19. The apparatus of claim 18 wherein said detector detects the angular position of a portion of the interference pattern corresponding to at least two frequencies and said analyzing means compares said positions to determine strain.

20. The apparatus of claim 18 wherein said detector is a frequency detector which detects the frequency of said portion of said interference pattern and said analyzing means compares said frequency to known frequencies to determine strain.

21. The apparatus of claim 20 wherein said detector further detects the intensity distribution of a portion of said interference pattern corresponding to at least two frequencies and said analyzing includes analyzing a distribution pattern.

22. The apparatus of claim 20 wherein said detector is the human eye.

23. The apparatus of claim 18 further comprising a modulator for modulating said radiation before illuminating said grating.

24. The apparatus of claim 23 wherein said modulator is a chopper.

25. The apparatus of claim 24 wherein said surface is heated.

26. The apparatus of claim 25 wherein the temperature of said surface is over about 1000°

C.

27. The apparatus of claim 26 wherein said diffraction grating is formed of a refractory metal or ceramic.

28. The apparatus of claim 18 wherein said grating is electrodeposited onto said object.

29. The apparatus of claim 18 wherein said grating is vapor deposited onto said object.

30. The apparatus of claim 18 wherein said grating is formed integrally with said surface.

31. The apparatus of claim 18 wherein said grating is a reflective grating.

32. The apparatus of claim 18 wherein said surface is transparent to said radiation and said grating is a transmission grating.

33. The apparatus of claim 18 wherein said grating is fixed on a rotating surface.