Method of determining the refractive index of a substance and apparatus thereof

• US 4,950,074 A
• Filed: 05/02/1989
• Issued: 08/21/1990
• Est. Priority Date: 05/02/1988
• Status: Expired due to Term

• Current Assignee: IOT Entwicklungsgesellschaft Fur Integrierte Optiktechnologie mbH
• Original Assignee: IOT Entwicklungsgesellschaft Fur Integrierte Optiktechnologie mbH
• Inventors: Kluge, Jurgen, Gotz, Helga, Baumgart, Jorg, Fabricius, Norbert, Guttmann, Hans-Jurgen, Oeste, Helmut, Efstathiou, Charitos, Ro.beta., Ludwig
• Primary Examiner(s): EVANS, FANNIE L
• Application Number:
  US07/346,523
• Time in Patent Office: 476 Days
• Field of Search: 356/128, 356/133, 356/361, 350/96.11
• US Class Current: 356/133
• CPC Class Codes: G01J 2009/023 of the integrated optical type
• CPC Class Codes: G01J 2009/0261 polarised
• CPC Class Codes: G01N 2021/1748 Comparative step being essential in the method
• CPC Class Codes: G01N 21/431 Dip refractometers, e.g. using optical fibres
• CPC Class Codes: G01N 21/45 using interferometric methods; using Schlieren methods

Abstract

The invention is directed to a method for determining the refractive index (n) of a substance wherein monochromatic light is conducted to a single-mode wave guide integrated into a substrate. The wave guide is brought into contact with the substance to be measured along a segment of predetermined length. In this way, the effective refractive index in this segment of the wave guide is changed. This effect is utilized for measuring the refractive index of the measured substance. The change of the effective refractive index causes a phase displacement of the light travelling through this measuring segment. This phase displacement is measured as a phase difference to a light component not influenced by the measuring substance. This measurement is preferably made interferometrically.

Claims

1. A method of determining the index of refraction (n) of a substance, the method comprising the steps of:

conducting monochromatic light to an optical single-mode wave guide integrated into a substrate;

the wave guide defining two paths for conducting respective components of light therealong;

one of said paths having a measurement segment of predetermined length (L) and an effective refractive index along said segment;

bringing the substance to be measured into optical contact with the wave guide along said measurement segment thereby changing the effective refractive index of the wave guide along said segment to produce a phase displacement of the light travelling along the path of said measurement segment; and

,

determining the refractive index (n) from the phase difference between the components of light travelling along said two light paths.

2. The method of claim 1, wherein the measurement of said index of refraction (n) is performed interferometrically.

3. A method of determining the index of refraction (n) of a substance, the method comprising the steps of:

conducting monochromatic light to an optical single-mode wave guide integrated into a substrate, the wave guide having a measurement segment of predetermined length (L) and an effective refractive index along said segment;

said light conducted to said wave guide being polarized light having a predetermined direction of polarization which changes in the measuring segment;

bringing the substance to be measured into optical contact with the wave guide along said measurement segment thereby changing the effective refractive index of the wave guide along said segment; and

,

measuring the refractive index (n) from the change in said effective refractive index by utilizing the change in said direction.

4. Apparatus for determining the index of refraction (n_M) of a substance, the apparatus comprising:

a monochromatic light source for producing a monochromatic light;

a substrate having an optical single-mode wave guide integrated therein;

said wave guide having a light entrance end for receiving said monochromatic light and a light exit end whereat the light travelling through said wave guide exits therefrom;

said wave guide having two arms dividing at said light entrance end into said two arms which are rejoined at said light exit end;

said wave guide having a measuring segment of a predetermined length (L) provided on one of said arms;

a cover layer formed on said substrate so as to cover said wave guide except for said measuring segment;

means for bringing said substance into optical contact with said measuring segment; and

,

a detector arrangement for receiving the light from said light exit end and converting the same into a signal proportional to the index of refraction (n) of said substance.

5. The apparatus of claim 4, said wave guide being a first strip-shaped optical single-mode wave guide integrated in said substrate and said apparatus further comprising a second strip-shaped optical single-mode wave guide likewise integrated in said substrate;

said wave guides being parallel to each other and configured so as to evenly divide the light from said light source; and

, said measuring segment being provided only on said first wave guide.

6. The apparatus of claim 4, said substrate having a predetermined index of refraction;

and, said cover layer having an index of refraction equal to or less than the index of refraction of said substrate.

7. The apparatus of claim 6, said cover layer being made of polyvinylidene fluoride.

8. Apparatus for determining the index of refraction (n_M) of a substance, the apparatus comprising:

a monochromatic light source for producing a monochromatic light;

a substrate having an optical single-mode wave guide integrated therein;

said wave guide having a light entrance end for receiving said monochromatic light and a light exit end whereat the light travelling through said wave guide exits therefrom and said wave guide having a measuring segment of a predetermined length (L);

means for bringing said substance into optical contact with said measuring segment;

a detector arrangement for receiving the light from said light exit end and converting the same into a signal proportional to the index of refraction (n) of said substance;

said wave guide being a first strip-shaped optical single-mode wave guide integrated in said substrate;

a second strip-shaped optical single-mode wave guide likewise integrated in said substrate;

said wave guides being parallel to each other and configured so as to evenly divide the light from said light source; and

,

said measuring segment being provided only on said first wave guide.

9. Apparatus for determining the index of refraction (n_M) of a substance, the apparatus comprising:

a monochromatic light source for producing a monochromatic light;

a substrate having an optical single-mode wave guide integrated therein;

said wave guide having a light entrance end for receiving said monochromatic light and a light exit end whereat the light travelling through said wave guide exits therefrom and said wave guide having a measuring segment of a predetermined length (L);

means for bringing said substance into optical contact with said measuring segment;

a detector arrangement for receiving the light from said light exit end and converting the same into a signal proportional to the index of refraction (n) of said substance;

said wave guide having two arms dividing at said light entrance end into said two arms which are rejoined at said light exit end; and

,

said measuring segment being provided on only one of said two arms.

10. The apparatus of claim 9, said substrate having a predetermined index of refraction;

said apparatus further comprising a cover layer formed on said substrate so as to cover said wave guide except for said measuring segment; and

, said cover layer having an index of refraction equal to or less than the index of refraction of said substrate.

11. The apparatus of claim 10, said cover layer being made of polyvinylidene fluoride.

12. Apparatus for determining the index of refraction (n_M) of a substance, the apparatus comprising:

a monochromatic light source for producing a monochromatic light;

polarization means for polarizing the light from said light source;

a substrate having an optical single-mode wave guide integrated therein;

said wave guide having a light entrance end for receiving the polarized monochromatic light;

said wave guide including two arms formed in said substrate so as to communicate with said light entrance end for conducting respective components of light;

measurement segment means formed in said substrate along one of said two arms to facilitate optical contact with said one arm;

means for bringing said substance into optical contact with said one arm via said measurement segment means thereby rotating the polarization plane of the light component travelling through said one arm;

said arms terminating in respective light exits through which said light components exit from said wave guide; and

,

detector means for receiving said light components and for determining the rotation of the polarization plane as an indication of the index of refraction (n_M) of the substance.

13. The apparatus of claim 12, comprising means for measuring the index of refraction (n_M) by compensating for the rotation of said polarization plane.