Fluorescence spectrophotometer and wavelength setting method therefor

• US 4,957,366 A
• Filed: 02/22/1989
• Issued: 09/18/1990
• Est. Priority Date: 02/24/1988
• Status: Expired due to Term

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Minegishi, Hisako, Ono, Takayuki, Koshi, Hiroyuki, Owada, Minoru
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US07/313,440
• Time in Patent Office: 573 Days
• Field of Search: 356/317, 356/318, 250/458.1, 250/459.1, 250/461.1, 250/461.2
• US Class Current: 356/318
• CPC Class Codes: G01J 3/4406 Fluorescence spectrometry

Abstract

In a fluorescence spectrophotometer a first spectrum of fluorescence emitted by a sample in a state where the wavelength of excitation light is fixed to an arbitrary wavelength; a second spectrum of fluorescence emitted by the sample in a state where the wavelength of excitation light is changed to another wavelength; and the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other is set for the fluorescence wavelength emitted by said sample.

Claims

1. A fluorescence spectrophotometer comprising:

a light source;

an excitation side spectroscope for separating light emitted by said light source in wavelength and projecting excitation light having a specified wavelength on a sample;

a fluorescence side spectroscope for separating fluorescence emitted by said sample in wavelength;

a detector for detecting light emitted by said fluorescence side spectroscope;

means for storing a first spectrum, when either one of said spectroscopes is fixed to an arbitrary wavelength and the wavelength of the other is scanned;

means for storing a second spectrum, when said one of the spectroscopes is fixed to another wavelength, which is different from said arbitrary wavelength, and the wavelength of the other is scanned; and

means for comparing said first spectrum with said second spectrum and setting said excitation or fluorescence side wavelength for the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other.

3. A fluorescence spectrophotometer according to claim 1, wherein the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other is a wavelength within a limit determined by the amount of shift in the Raman scattering wavelength due to said sample.

2. A fluorescence spectrophotometer comprising:

a light source;

an excitation side spectroscope for separating light emitted by said light source in wavelength and projecting excitation light having a specified wavelength on a sample;

a fluorescence side spectroscope for separating fluorescence emitted by said sample in wavelength;

a detector for detecting light emitted by said fluorescence side spectroscope;

means for detecting the peak wavelength obtained when the wavelength of either one of said spectroscopes is fixed and the wavelength of the other is scanned;

means for storing a first spectrum, when the other spectroscope is fixed to the detected peak wavelength and the wavelength of the one is scanned;

means for storing a second spectrum, when said other spectroscope is fixed to another wavelength, which is different from said peak wavelength, and the wavelength of the one is scanned; and

means for comparing said first spectrum with said second spectrum and setting said excitation or fluorescence side wavelength for the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other.

4. A fluorescence spectrophotometer according to claim 2, wherein the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other is a wavelength within a limit determined by the amount of shift in the Raman scattering wavelength due to said sample.

5. A method for setting wavelength in a fluorescence spectrophotometer, by which excitation light having a specified wavelength is projected to a sample;

fluorescence emitted by said sample is detected; and

a measurement of said sample is effected;

comprising steps of;

fixing the wavelength of excitation light projected on said sample to a first wavelength (Steps 31,

     32);

measuring a first spectrum of the fluorescence emitted by said sample;

fixing the wavelength of said excitation light to a second wavelength;

measuring a second spectrum of the fluorescence emitted by said sample; and

setting the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other for the fluorescence wavelength emitted by said sample.

7. A method for setting wavelength in a fluorescence spectrophotometer according to claim 5, further comprising steps of:

taking out fluorescence emitted by said sample at said set fluorescence wavelength;

measuring a third spectrum obtained by scanning continuously the wavelength of the excitation light projected on said sample;

taking out a wavelength of light emitted by said sample, which is different from said fluorescence wavelength;

measuring a fourth spectrum obtained by scanning continuously the wavelength of the excitation light projected on said sample; and

setting the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other for the excitation wavelength exciting said sample.

8. A method for setting wavelength in a fluorescence spectrophotometer according to claim 5, wherein the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other is a wavelength within a limit determined by the amount of shift in the Raman scattering wavelength due to said sample.

10. A method for setting wavelength in a fluorescence spectrophotometer according to claim 5, wherein the difference between said first and said second wavelengths is smaller than the amount of shift in the Raman scattering wavelength due to said sample.

6. A method for setting wavelength in a fluorescence spectrophotometer, by which excitation light having a specified wavelength is projected to a sample;

fluorescence emitted by said sample is detected; and

a measurement of said sample is effected;

comprising steps of;

taking out a first wavelength of light emitted by said sample;

measuring a first spectrum obtained by scanning continuously the wavelength projected on said sample;

taking out a second wavelength of light emitted by said sample;

measuring a second spectrum obtained by scanning continuously the wavelength projected on said sample; and

setting the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other for the fluorescence wavelength emitted by said sample.

9. A method for setting wavelength in a fluorescence spectrophotometer according to claim 6, wherein the wavelength when corresponding peaks in the two spectra are approximately in accordance with each other is a wavelength within a limit determined by the amount of shift in the Raman scattering wavelength due to said sample.

11. A method for setting wavelength in a fluorescence spectrophotometer according to claim 6, wherein the difference between said first and said second wavelengths is smaller than the amount of shift in the Raman scattering wavelength due to said sample.