Apparatus and process for performing ellipsometric measurements of surfaces
First Claim
1. Surface measurement apparatus for determining the properties of a surface, comprising:
- a pair of ellipsometric sensors, each of the sensors having a structure includinga monochromatic light source disposed so as to emit a devergent light beam along an optical path toward the surface at an angle of incidence during operation of the apparatus.a polarizer through which the beam passes before reflecting from the surface being measured,a first polarizing light analyzer through which a first portion of the reflected beam passes and a first detector to measure the intensity of the first portion after it passes through the first light analyzer,a second polarizing light analyzer through which a second portion of the reflected beam passes and a second detector to measure the intensity of the second portion after it passes through the second light analyzer, anda third polarizing light analyzer through which a third portion of the reflected beam passes and a third detector to measure the intensity of the third portion after it passes through the third light analyzer, wherein the operating wavelength of the light source and the angle of incidence for the two sensors are the same, and wherein one of the sensors further includes a quarter wave plate matched to the wavelength of the monochromatic light source, in the optical path of the beam, and the other of the sensors has no quarter wave plate in the optical path of the beam.
2 Assignments
0 Petitions
Accused Products
Abstract
A compact ellipsometric apparatus is constructed using as a building block a tri-beam ellipsometric sensor having a monochromatic source of polarized light with a diverging beam of sufficient divergence that three analyzers and associated light detectors may be placed into the beam side by side so that they each receive light reflected from a surface under study at the same angle of reflection. Pairs of these sensors are used together, with one of each pair having in the optical path a quarter wave plate matched to the monochromatic light wavelength and the other of the pair having no quarter wave plate, but with the light wavelength and angle of incidence being the same for each pair. A variety of measurements are made by constructing apparatus using one or more pairs of these basic sensors, the pairs of sensors varying from each other in the light wavelength of the source and the angle of incidence of the polarized beam of light to the surface. Various apparatus having from one to six pairs of sensors have been designed, with higher numbers of sensors providing greater generality in respect to the properties that can be measured.
77 Citations
16 Claims
-
1. Surface measurement apparatus for determining the properties of a surface, comprising:
-
a pair of ellipsometric sensors, each of the sensors having a structure including a monochromatic light source disposed so as to emit a devergent light beam along an optical path toward the surface at an angle of incidence during operation of the apparatus. a polarizer through which the beam passes before reflecting from the surface being measured, a first polarizing light analyzer through which a first portion of the reflected beam passes and a first detector to measure the intensity of the first portion after it passes through the first light analyzer, a second polarizing light analyzer through which a second portion of the reflected beam passes and a second detector to measure the intensity of the second portion after it passes through the second light analyzer, and a third polarizing light analyzer through which a third portion of the reflected beam passes and a third detector to measure the intensity of the third portion after it passes through the third light analyzer, wherein the operating wavelength of the light source and the angle of incidence for the two sensors are the same, and wherein one of the sensors further includes a quarter wave plate matched to the wavelength of the monochromatic light source, in the optical path of the beam, and the other of the sensors has no quarter wave plate in the optical path of the beam. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. Surface measurement apparatus for determining the properties of a surface, comprising:
-
a first ellipsometric sensor having a structure including a monochromatic light source disposed so as to emit a divergent light beam along an optical path toward the surface at an angle of incidence during operation of the apparatus, a polarizer through which the beam passes before reflecting from the surface being measured, a first polarizing light analyzer through which a first portion of the reflected beam passes and a first detector to measure the intensity of the first portion after it passes through the first light analyzer, a second polarizing light analyzer through which a second portion of the reflected beam passes and a second detector to measure the intensity of the second portion after it passes through the second light analyzer, and a third polarizing light analyzer through which a third portion of the reflected beam passes and a third detector to measure the intensity of the third portion after it passes through the third light analyzer; and a second ellipsometric sensor having a structure including a monochromatic light source disposed so as to emit a divergent light beam along an optical path toward the surface at an angle of incidence during operation of the apparatus, a polarizer through which the beam passes before reflecting from the surface being measured, a first polarizing light analyzer through which a first portion of the reflected beam passes and a first detector to measure the intensity of the first portion after it passes through the first light analyzer, a second polarizing light analyzer through which a second portion of the reflected beam passes and a second detector to measure the intensity of the second portion after it passes through the second light analyzer, and a third polarizing light analyzer through which a third portion of the reflected beam passes and a third detector to measure the intensity of the third portion after it passes through the third light analyzer, and a quarter wave plate matched to the wavelength of the monochromatic light source, in the optical path of the beam, wherein the operating wavelength of the light source for the first sensor and the second sensor are the same, and the angle of incidence for the first sensor and the second sensor are the same.
-
-
12. Surface measurement apparatus for determining the properties of a surface, comprising:
means for measuring the properties of the surface by an ellipsometric measurement, the means including at least one pair of ellipsometric sensors, the sensors of each pair having no moving parts and operating at the same light wavelength and angle of incidence, the sensors of each pair differing in that one sensor has a quarter wave plate in the optical path and the other sensor has no quarter wave plate in the optical path. - View Dependent Claims (13)
-
14. A process for measuring surface properties of a surface, with an apparatus having no moving parts, comprising the steps of:
-
furnishing at least one pair of ellipsometric sensors that each measure the ellipsometric parameters del and psi without using any moving parts, each of the pairs of sensors being characterized by its wavelength of monochromatic radiation emitted by a light source in the sensor, and angle of incidence of the monochromatic light beam of the surface being measured, one of each pair of sensors having a quarter wave plate in the optical path and the other sensor of the pair having no quarter wave plate in the optical path; setting the different pairs of ellipsometric sensors to different combinations of wavelength of monochromatic radiation and angle of incidence; measuring the properties of a region of the surface using the pairs of ellipsometric sensors and without changing the surface properties of the region during the period when the two measurements are made; and calculating the surface properties of the measured region from the measured properties. - View Dependent Claims (15, 16)
-
Specification