Apparatus for measuring three-dimensional surface geometries

• US 4,957,369 A
• Filed: 01/23/1989
• Issued: 09/18/1990
• Est. Priority Date: 01/23/1989
• Status: Expired due to Fees

• Current Assignee: California Institute of Technology
• Original Assignee: California Institute of Technology
• Inventors: Antonsson, Erik K.
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US07/298,931
• Time in Patent Office: 603 Days
• Field of Search: 356/1, 356/375, 356/376
• US Class Current: 356/608
• CPC Class Codes: G01B 11/2545 with one projection direction and several detection directions, e.g. stereo

Abstract

Automatic acquistion and anaylsis for three-dimensional surface geometries is accomplished by use of an opto-electronic technique which exploits large-linear-area lateral-photo-effect-diodes and employs a reflected, tightly focused light spot. The technique consists of one very small light spot pulsed for example at 10,000 Hertz with a 50% duty cycle. The light spot is focused on the surface to be measured and scanned across it stopping for, in one example, 50 microseconds each time it is illuminated. The diode detectors mounted in the focal plane of a pair of cameras, return azimuth and elevation information for each spot. Knowledge of the location and orientation of the cameras, as well as calibration corrections for each camera, completes the information necessary to reconstruct the full three-dimensional location of each reflected light spot.

Claims

1. A three-dimensional measurement apparatus for accurately determining the precise geometric shape of an object;

the apparatus comprising;

a source of radiation;

means for focusing a spot of said radiation onto said object;

means for scanning said focussed spot of radiation over the surface of said object;

a pair of detectors positioned relative to said object for receiving radiation reflected from said focussed spot on said object, each said detector providing electrical signals representing the instantaneous two-dimensional coordinates of said spot of radiation as received by each said detector;

means for calculating the three-dimensional coordinates of said spot of radiation on said object from said electrical signals provided by said detectors; and

said focussing means comprising a Z-axis optical scanner having a focal length that is continuously variable over a pre-selected range and driving means for varying said focal length within said range.

2. The apparatus recited in claim 1 wherein said radiation is laser generated light.

3. The apparatus recited in claim 2 wherein said light is infrared.

4. The apparatus recited in claim 1 wherein said means for scanning comprises an X-Y axis optical scanner for directing a narrow beam of said radiation in two dimensions over a pre-selected range and driving means for controlling said beam direction within said range.

6. The apparatus recited in claim 1 wherein said calculating means comprises a computer.

7. The apparatus recited in claim 6 wherein each such diode comprises a pair of opposing space current bars in each of two orthogonal planes of said diode for providing an analog current in each such plane, the magnitude of each said analog current being correlated to the corresponding location of said reflected radiation on said detector.

8. The apparatus recited in claim 7 wherein said current bars are electrically connected for common-mode rejection of analog currents resulting from ambient light.

5. A three-dimensional measurement apparatus for accurately determining the precise geometric shape of an object;

the apparatus comprising;

a source of radiation;

means for focusing a spot of said radiation onto said object;

means for scanning said focussed spot of radiation over the surface of said object;

a pair of detectors positioned relative to said object for receiving radiation reflected from said focussed spot on said object, each said detector providing electrical signals representing the instantaneous two-dimensional coordinates of said spot of radiation as received by each said detector;

means for calculating the three-dimensional coordinates of said spot of radiation on said object from said electrical signals provided by said detectors; and

each said detector comprising a large-linear-area lateral-photo-effect-diode.

9. A three-dimensional measurement apparatus for accurately determining the precise geometric shape of an object;

the apparatus comprising;

a source of radiation;

means for focusing a spot of said radiation onto said object;

means for scanning said focussed spot of radiation over the surface of said object;

a pair of detectors positioned relative to said object for receiving radiation reflected from said focussed spot on said object, each said detector providing electrical signals representing the instantaneous two-dimensional coordinates of said spot of radiation as received by each said detector;

means for calculating the three-dimensional coordinates of said spot of radiation on said object from said electrical signals provided by said detectors; and

an electrical interconnection between said focussing means and said calculating means for minimizing the size of said spot of radiation in accordance with the calculated coordinates of said spot of radiation.

10. The apparatus recited in claim 9 further comprising an electrical interconnection between said scanning means and said calculating means for directing the spot of radiation on said object in accordance with the calculated coordinates of said spot of radiation.

11. A three-dimensional measurement apparatus for accurately determining the precise geometric shape of an object;

the apparatus comprising;

a source of radiation;

means for focusing a spot of said radiation onto said object;

means for scanning said focussed spot of radiation over the surface of said object;

a pair of detectors positioned relative to said object for receiving radiation reflected from said focussed spot on said object, each said detector providing electrical signals representing the instantaneous two-dimensional coordinates of said spot of radiation as received by each said detector;

means for calculating the three-dimensional coordinates of said spot of radiation on said object from said electrical signals provided by said detectors; and

means controlling said source of radiation for turning said source off during said scanning, stopping said scanning at pre-selected intervals and turning said source on during said intervals whereby said calculating means provides a non-ambiguous calculation of said three-dimensional coordinates of said spot of radiation corresponding to each such interval.

12. The apparatus recited in claim 11 wherein each such detector further comprises a lens for directing said received reflected radiation onto a pre-selected planar area.

13. An apparatus for analyzing the shape of an object by determining the precise three-dimensional coordinates of numerous closely space points on the object;

the apparatus comprising;

a source providing a pulsed beam of light;

a Z-axis scanner for focussing said beam onto said object;

an X-Y axis scanner for repositioning said beam onto said closely space points on the object;

a pair of stationary cameras pointed at said object and having detectors sensitive to said light for identifying respective two-dimensional coordinates of the intersection of said beam on said object; and

means for mathematically converting the two sets to two-dimensional coordinates identified by the pair of cameras to a single set of three-dimensional coordinates of the intersection of said beam on said object.

14. The apparatus recited in claim 13 wherein said light is infrared.

15. The apparatus recited in claim 13 wherein said light-beam source is a laser.

16. The apparatus recited in claim 13 wherein said detectors each comprise a large-linear-area lateral-photo-effect-diode.

17. The apparatus recited in claim 13 wherein said converting means comprises a computer.

18. The apparatus recited in claim 13 wherein said z-axis scanner and said X-Y axis scanner are controlled by a computer.

19. The apparatus recited in claim 13 wherein the duty cycle of said pulsed beam of light is about 50% and wherein said beam of light is off during said repositioning of said beam and on during said identifying.