Method and apparatus for bistable optical information storage for erasable optical disks

• US 4,965,784 A
• Filed: 05/31/1988
• Issued: 10/23/1990
• Est. Priority Date: 05/31/1988
• Status: Expired due to Fees

• Current Assignee: United States Of America As Represented By The Department Of Energy
• Original Assignee: Sandia Corporation (Martin Marietta Corporation)
• Inventors: McKinney, Ira D., Land, Cecil E.
• Primary Examiner(s): MCELHENY JR, DONALD E
• Application Number:
  US07/200,095
• Time in Patent Office: 875 Days
• Field of Search: 365/108, 365/109, 365/117, 365/122, 360/114, 369/13, 369/14, 369/15, 369/100, 369/110, 369/275, 369/276
• US Class Current: 369/100
• CPC Class Codes: G11B 11/08 using recording by electric charge or by variation of electric resistance or capacitance G11B11/002, G11B11/10 take precedence
• CPC Class Codes: G11B 13/00 Recording simultaneously or selectively by methods covered by different main groups among G11B3/00, G11B5/00, G11B7/00 and G11B9/00; Record carriers therefor not otherwise provided for; Reproducing therefrom not otherwise provided for G11B9/14, G11B11/002 take precedence; driving or moving of heads G11B3/02, G11B5/48, G11B7/08, G11B21/02
• CPC Class Codes: G11B 7/004 Recording, reproducing or erasing methods; Read, write or erase circuits therefor magneto-optical systems G11B11/105
• CPC Class Codes: G11B 9/02 using ferroelectric record carriers; Record carriers therefor

Abstract

A method and an optical device for bistable storage of optical information, together with reading and erasure of the optical information, using a photoactivated shift in a field dependent phase transition between a metastable or a bias-stabilized ferroelectric (FE) phase and a stable antiferroelectric (AFE) phase in an lead lanthanum zirconate titanate (PLZT). An optical disk contains the PLZT. Writing and erasing of optical information can be accomplished by a light beam normal to the disk. Reading of optical information can be accomplished by a light beam at an incidence angle of 15 to 60 degrees to the normal of the disk.

Claims

1. A method of bistable storage of optical information, which comprises:

providing a material capable of shifting between stable first antiferroelectric and second ferroelectric phases by applying at least one of electric energy and illumination energy thereto,

applying an electrical field across a surface of the material, so that the material shifts from the first phase to the second phase,

illuminating parts of the material, thereby causing the illuminated parts to shift back to the first phase,

removing the illumination and electrical field so that the illuminated parts remain in the first phase and the unilluminated parts remain in the second phase, and

directing a read light beam onto the portion of the material and determining the first and second phase parts thereof.

2. The method of claim 1, wherein the read light beam is at an angle of 15 to 60 degrees incident to normal of the material.

3. Apparatus for bistable optical information storage comprising:

optical disk means for storing binary information as a function of the ferroelectric/antiferroelectric phases at different locations on the disk surface;

write-erase means for writing and erasing binary optical information on and from a surface of the optical disk means, said write-erase means comprising;

electric means for applying an electric potential across said optical disk means; and

light means for directing a write-erase light beam toward said disk surface to selectively alter said phases; and

read means for reading binary optical information from said surface.

4. The apparatus of claim 3, wherein the means for applying an electrical potential across the disk means is capable of applying two different electrical potentials.

5. The apparatus of claim 3, wherein the read means includes means for directing a read light beam onto the disk means at an incidence angle of 15 to 60 degrees to the normal of the disk means;

and

said disk means includes a light reflecting layer on said surface.

6. The apparatus of claim 5, wherein the read means further includes:

focusing means for focusing the read light beam;

light beam polarization analyzing means for analyzing the polarization of the light beam reflected from the disk reflecting layer; and

a photodetecting means for detecting the output of said analyzing mean.

7. The apparatus of claim 6, wherein said reflecting means includes mirror means for reflecting the light beam reflected from said layer means back along the path of the read light means;

and said polarization analyzing means comprises;

a polarizing beam splitter to split the reflected light beam from the path;

light beam polarization analyzing means for analyzing the polarization of the split beam; and

photodetecting means for detecting the output of said analyzing mean.

8. The apparatus of claim 5, wherein the optical disk means includes a layer of lead lanthanum zirconate titanate (PLZT).

9. The apparatus of claim 8 wherein the PLZT is PLZT 7.6/70/30.

10. The apparatus of claim 8, wherein the PLZT is PLZT 7.7/70/30.

11. The apparatus of claim 3, wherein:

the write-erase light means is directed at an angle of 90°

to said surface, and the write-erase means further includes;

focusing means for focusing the write-erase light beam onto said surface;

a reflecting layer on said surface, wherein said beam is reflected back towards the light means; and

reflected light detecting means comprising;

a polarizing beam splitter to split the reflected light beam from a path between said light means and said surface;

light beam polarization analyzing means for analyzing the polarization of the split beam; and

photodetecting means for detecting the output of said analyzing mean.

12. The apparatus of claim 11, wherein the optical disk means includes a layer of ferroelectric material.

13. The apparatus of claim 12, wherein the layer of ferroelectric material is capable of shifting between stable first and second phases by applying at least one of electric energy and illumination energy thereto.

14. The apparatus of claim 13, wherein the ferroelectric material is a lead lanthanum zirconate titanate (PLZT).

15. The apparatus of claim 14, wherein the PLZT is PLZT 7.6/70/30.

16. The apparatus of claim 15, wherein the first phase of the material is antiferroelectric and the second phase is metastable ferroelectric.

17. The apparatus of claim 14, wherein the PLZT is PLZT 7.7/70/30.

18. The apparatus of claim 17, wherein the first phase of the material is antiferroelectric and the second phase is bias-stabilized ferroelectric.

19. The apparatus of claim 11, wherein the write-erase light means illuminates a portion of the disk, the means for applying an electrical potential across the disk and the light means operating together so that characteristics of the disk means at an illuminated

20. The apparatus of claim 19, wherein the characteristics are thresholds of the phase transition between antiferroelectric and metastable ferroelectric phases.

21. The apparatus of claim 19, wherein the characteristics are thresholds of the phase transition between antiferroelectric and bias-stabilized ferroelectric phases.

22. The apparatus of claim 3, wherein the read means includes means for directing a light beam onto the disk means at an incidence angle of 90 degrees to the surface of the disk means.

23. The apparatus of claim 22, wherein the read means further includes means for measuring the short-circuit photocurrent across the disk means;

a collimating means for collimating the read light beam;

a focusing means for focusing the read light beam;

a polarizing beam-splitter to split the read light beam;

a light beam polarization analyzing means; and

a photodetecting means.

24. The apparatus of claim 23, wherein the optical disk means includes a layer of ferroelectric material.

25. The apparatus of claim 24, wherein the layer of ferroelectric material is capable of shifting between stable first and second phases by applying at least one of electric energy and illumination energy thereto.

26. The apparatus of claim 25, wherein the ferroelectric material is a lead lanthanum zirconate titanate (PLZT).

27. The apparatus of claim 26, wherein the PLZT is PLZT 7.6/70/30.

28. The apparatus of claim 27, wherein the first phase of the material is selected from the group consisting of antiferroelectric, penferroelectric and paraelectric phases and the second phase is ferroelectric.

29. The apparatus of claim 26, wherein the PLZT is PLZT 7.7/70/30.

30. The apparatus of claim 29, wherein the first phase of the material is selected from the group consisting of antiferroelectric, penferroelectric and paraelectric phases and the second phase is ferroelectric.