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Pattern recognition apparatus

  • US 4,972,499 A
  • Filed: 03/28/1989
  • Issued: 11/20/1990
  • Est. Priority Date: 03/29/1988
  • Status: Expired due to Term
First Claim
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1. An apparatus for automatically recognizing an input pattern, comprising:

  • (a) contour segmentation means for segmenting a detected contour line of an input pattern into an array of input contour segments;

    (b) characteristic extraction means for extracting a line characteristic of each of said input contour segments;

    (c) reference storage means for storing characteristic data of standard patterns, said reference storage means having,main reference storage means for storing partial pattern characteristic data representing line characteristics of an array of reference contour segments of each of said standard patterns, anddetailed matching reference storage means for storing detailed line characteristic data of each array of said standard patterns together with a program for specifying an operation sequence of said detailed characteristic data; and

    (d) matching processor means, connected to said characteristic extraction means and said main reference storage means, for extracting a primary matching process in which said input contour pattern is sequentially compared and collated with said standard contour patterns to find out that standard pattern with which said input pattern is matched with highest similarity;

    (e) detailed recognition means, connected to said matching processor means and said detailed matching reference storage means, for executing a secondary recognition process in such a manner that, when said input contour pattern is matched in its line characteristic with several standard contour patterns, said detailed recognition means executes a detailed recognition process using said detailed characteristic data of partial patterns of input patterns corresponding to specific partial patterns said standard patterns to select a correct standard contour pattern from among said matched standard contour patterns,said main reference storage means additionally storing identification marks for identifying specific reference contour segments necessary to acquire said detailed characteristic data, said marks absolutely identifying the partial patterns corresponding to the specific reference segments regardless of the sequence of appearance thereof in the array of said input segments.

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