Three-dimensional displacement gage

• US 4,972,597 A
• Filed: 12/14/1989
• Issued: 11/27/1990
• Est. Priority Date: 12/15/1988
• Status: Expired due to Term

• Current Assignee: Governor of Toyama Prefecture Yutaka Nakaoki, Kitamura Machinery Co., Ltd.
• Original Assignee: Governor of Toyama Prefecture Yutaka Nakaoki, Kitamura Machinery Co., Ltd.
• Inventors: Tohbo, Kihachiro, Kadosaki, Masahiro, Sugimori, Hiroshi, Yamada, Shigeru, Taniguchi, Katsuji
• Primary Examiner(s): Cuchlinski, Jr., William A.
• Assistant Examiner(s): Fulton, Christopher W.
• Application Number:
  US07/448,197
• Time in Patent Office: 348 Days
• Field of Search: 33/558, 33/561, 33/556, 33/559, 33/503, 33/1 M, 33/832
• US Class Current: 33/558
• CPC Class Codes: G01B 11/007 feeler heads therefor

Abstract

A three-dimensional displacement gauge comprising a housing, a probe rotatably and slidably mounted on the housing, the probe is slidable along a first direction and having a contact member attached at one end thereof, two emitting members mounted on the probe each for emitting a light beam, two-dimensional measuring member such as a position sensor fixed to the housing for detecting the light beams, a biasing spring for biasing the probe toward the contact member, and a limit switch attached to the housing for detecting whether or not the probe moves in the first direction. The two-dimensional measuring member detects the light beams struck thereon so as to measure a small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction. In another mode, the two emitting members are mounted on the housing, and a mirror is mounted at the other end of the probe, and the two-dimensional measuring element detect the light beams struck thereon from the emitting members by way of the mirror.

Claims

1. A three-dimensional displacement gauge comprising:

a housing;

probe rotatably and slidably mounted on the housing, the probe being slidable along a first direction and having a contact member attached at one end thereof;

two emitting means mounted on the probe each for emitting a light beam;

a two-dimensional measuring means fixed to the housing for detecting the light beams struck thereon;

a biasing spring for biasing the probe toward the contact member;

a limit switch attached to the housing for detecting whether or not the probe moves in the first direction;

wherein the two-dimensional measuring means detects the light beams struck thereon so as to measure small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction.

2. A three-dimensional displacement gauge according to claim 1 wherein the first direction is parallel to a longitudinal direction of the probe.

3. A three-dimensional displacement gauge according to claim 2 wherein the probe is supported by a support member, the support member having a plurality of balls rotatably mounted on a periphery thereof and the balls contacting with an inner wall of the housing.

4. A three-dimensional displacement gauge according to claim 3 wherein the probe has a spherical support portion and the support member has a spherical opening formed at a center thereof for supporting the spherical support portion in such a manner that the probe can rotate about a center of the spherical support portion.

5. A three-dimensional displacement gauge according to claim 4 wherein the probe has a flange member attached thereon between the support portion and the contact member, the flange member having a spherical lower surface a center of curvature of which coincides with the center of curvature of the support portion, and wherein when the probe is in an initial position the lower surface of the flange member contacts with an inner end wall of the housing corresponding in shape to the lower surface of the flange member.

6. A three-dimensional displacement gauge according to claim 1 wherein the probe comprises an elongated slide member having a ball at one end thereof and a middle member having a spherical concave portion for supporting the ball at the end of the slide member in such a manner that the probe can rotate about the ball at the end of the slide member, and wherein the slide member is slidably supported by an annular support member fixed to the housing.

8. A three-dimensional displacement gauge according to claim 1, wherein the biasing spring biases the probe toward a predetermined initial position.

7. A three-dimensional displacement gauge comprising:

a housing;

a probe rotatably and slidably mounted on the housing, the probe being slidable along a first direction, the probe having a contact member attached at one end thereof and a mirror mounted on the other end thereof;

two emitting means mounted inside the housing each for emitting a light beam;

a two-dimensional measuring means fixed inside the housing for detecting the light beams struck thereon from the emitting members by way of the mirror;

a biasing spring for biasing the probe toward the contact member; and

a limit switch attached to the housing for detecting whether or not the probe moves in the first direction,

wherein the two-dimensional measuring means detects the light beams struck thereon so as to measure a small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction.

9. A three-dimensional displacement gauge according to claim 7, wherein the biasing spring biases the probe toward a predetermined initial position.