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Maximum length pseudo-random test pattern generator via feedback network modification

  • US 4,974,184 A
  • Filed: 04/19/1990
  • Issued: 11/27/1990
  • Est. Priority Date: 05/05/1988
  • Status: Expired due to Term
First Claim
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1. An exhaustive test pattern generator for generating 2n test patterns, comprising:

  • (a) feedback shift register means comprising a feedback network logically coupled to only a single input of a shift register for generating a sequence of 2n -1 test patterns;

    (b) means external to the feedback shift register means for generating a 2n th test pattern and for inserting the 2n th test pattern into the sequence of 2n -1 test patterns; and

    (c) output means for providing the sequence of 2n test patterns.

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