Polarizing beam splitter using dielectric multilayers

• US 4,974,219 A
• Filed: 03/16/1988
• Issued: 11/27/1990
• Est. Priority Date: 10/30/1987
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines SA (International Business Machines Corporation)
• Inventors: Korth, Hans-Erdmann
• Primary Examiner(s): Levy, Stuart S.
• Assistant Examiner(s): Nguyen, Hoa
• Application Number:
  US07/168,792
• Time in Patent Office: 986 Days
• Field of Search: 369/13, 369/110, 350/370, 350/381, 350/394, 360/59, 360/114, 365/122
• US Class Current: 369/110.02
• CPC Class Codes: G01N 2021/218 Measuring properties of electrooptical or magnetooptical media
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G02B 27/283 used for beam splitting or combining
• CPC Class Codes: G11B 11/10543 using optical beam of radiation
• CPC Class Codes: G11B 11/10576 with provision for moving the transducers for maintaining alignment or spacing relative to the carrier

Abstract

An optical analyzer for determining changes of the polarization plane in a light beam (4) comprises a substrate (20) supporting a photodetector array (21) and a system of imaging mirrors (22-24) underneath a parallel plate (25) of high-quality optical glass. The lower surface of the glass plate is covered by a system (26) of dielectric multilayers which acts as a polarizing beam splitter over a large range of angles of incidence. The optical beam (4) enters the analyzer through the glass plate to impinge under an oblique angle of incidence on a first mirror (24) which rotates the plane of polarization in the beam by 45 degrees with respect to the polarizing beam splitter, which then generates two beams partial (202,203) to be eventually directed to photodetector array (21). The beam analyzer is used in magneto-optical storage system to extract an information signal and to generate servo control signals for the focus and track positions of the beam. The tilted first mirror may have circular or stripe geometry and be integrally formed within the substrate (20). The multilayer polarizing beam-splitter system comprises two stacks of layers separated by an intermediate layer and covered by a thick dielectric layer.

Claims

1. An analyzer for determining the polarization state of a light beam comprising:

a laser to generate a collimated light beam;

focusing lens to direct the collimated light beam to a magneto-optical disk;

an optical glass plate;

a polarizing beam splitter formed on a first surface of said optical glass plate;

said beam splitter having a plurality of lower stack alternating dielectric layers, an intermediate dielectric layer, a plurality of upper stack alternating dielectric layers and a thick dielectric layer deposited on the upper stack dielectric layers;

one alternating dielectric layer having a different index of refraction from its adjacent alternating dielectric layer, such that the component reflected at all dielectric layers add together and have a P reflective component having an effective sum close to zero; and

means to direct the light beam reflected from the magneto-optical disk to said optical polarizing beam splitter.

2. An analyzer as defined in claim 1, wherein said optical glass plate has an index of refraction of 1.513 and wherein said polarizing beam splitter includes a plurality of stacks of dielectric layers comprising:

said lower stack and said upper stack, each having seven dielectric layers with the odd alternating layers each made of a ZrO₂ layer, with a thickness of 80 nm and a refraction index of 2.236 and the even alternating layers made of a SiO₂ layer with a thickness of 140 nm and a refraction index of 1.453, which are alternately stacked on each other, respectively;

said intermediate layer separating said lower stack layers and said upper stack layers including a SiO₂ layer with a thickness of 195 nm and a refraction index of 1.453;

said thick layer covering said upper stack layers including a SiO₂ layer having a thickness of 750 nm and a refraction index of 1.453; and

further including top layers having a ZrO₂ layer deposited on said thick layer and having a thickness of 55 nm and a refraction index of 2.236 and a SiO₂ layer deposited on the ZrO₂ layer and having a thickness of 20 nm and a refraction index of 1.453.

3. An analyzer as defined in claim 1 wherein said optical glass plate has an index of refraction of 1.513, and wherein the plurality of layers of said beam splitter comprise:

said lower stack and said upper stack layers each includes five alternating dielectric layers with the odd dielectric layers including a TiO₂ layer with a thickness of 56 nm and a refraction index of 2.646 and the even layers having a SiO₂ layer with a thickness of 140 nm and a refraction index of 1.453, which are alternately stacked on each other, respectively;

said intermediate layer separating said lower stack and said upper stack, includes an SiO₂ layer with a thickness of 200 nm and a refraction index of 1.453;

said thick layer covering said upper stack includes a SiO₂ layer having a thickness of 820 nm and a refraction index of 1.453.

4. An analyzer as defined in claim 1 further including a tilted mirror and a first and a second photodetector, and wherein:

said means to direct the light beam reflected from the magnetooptical disk, directs the reflected light beam in a first oblique angle to a second surface of said optical glass plate and is reflected by said tilted mirror to be redirected to said polarizing beam splitter under a second oblique angle of incidence, said plane of polarization of the beam reflected by said tilted mirror, being rotated by said polarizing beam splitter;

said first photodetector detecting a first partial beam emerging from said polarizing beam splitter directly; and

said second detector detecting a second partial beam after reflection at the top surface of said optical glass plate.

5. The analyzer of claim 4 wherein said tilted mirror is circular and surrounded by an annular imaging mirror.