Voltage-clamped integrated circuit

• US 4,975,798 A
• Filed: 09/05/1989
• Issued: 12/04/1990
• Est. Priority Date: 09/05/1989
• Status: Expired due to Fees

• Current Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Gray, Randall C., Edwards, Arthur J.
• Primary Examiner(s): NOT, DEFINED
• Application Number:
  US07/402,279
• Time in Patent Office: 455 Days
• Field of Search: 361/56, 361/57, 361/86, 361/87, 361/91, 361/93, 361/101, 361/104, 361/111, 257/23.13
• US Class Current: 361/56
• CPC Class Codes: H02H 3/048 Checking overvoltage diverters

Abstract

An automobile alternator regulator integrated circuit having a voltage-supply or -sense node (6) for connection to an external voltage, and a voltage clamp comprising: a pnp bypass transistor (Q1) having a base electrode, an emitter electrode coupled to the node and a collector electrode coupled to ground; a resistor (R1) connected between the base electrode and the node; a Zener diode (Z1-Z4) connected between the base electrode and ground for enabling the bypass transistor when the voltage at the node exceeds a predetermined value, whereby the voltage at the node is clamped to a voltage no greater than the predetermined value; and a fuse (F1) connected between the node and the emitter electrode so as to provide a subsequently identifiable cause of failure if the fuse becomes blown due to excess voltage while allowing subsequent operation of the integrated circuit if the clamp means fails but another part of the integrated circuit remains functional.

Claims

1. An integrated circuit having a node for connection to an external voltage, and comprising:

voltage clamp means coupled to the node for conducting current from the node when the voltage at the node exceeds a predetermined value, whereby the voltage at the node is clamped to a voltage no greater than the predetermined value,

the improvement comprising fuse means connected in series with the voltage clamp means so as to provide a subsequently identifiable cause of failure if the fuse means becomes blown due to excess voltage.

2. An integrated circuit according to claim 1 wherein the clamp means is connected in parallel with another part of the integrated circuit, thereby allowing subsequent operation of the other part of the integrated circuit if the fuse becomes blown but the other part of the integrated circuit remains functional.

3. An integrated circuit according to claim 1 further comprising current control means coupled to the fuse means and to the voltage clamp means.

4. An integrated circuit according to claim 1 wherein the voltage clamp means comprises voltage breakdown means and a bypass transistor having a control electrode coupled to the voltage breakdown means, a first current electrode coupled to the fuse, and a second current electrode for connection to a datum potential.

5. An integrated circuit according to claim 4 further comprising a resistance coupled between the node and the control electrode.

6. An integrated circuit according to claim 4 wherein the bypass transistor comprises a pnp bipolar transistor having its emitter as its first current electrode.

7. An integrated circuit according to claim 4 wherein the bypass transistor has a plurality of second current electrodes.

8. An integrated circuit according to claim 3 wherein the current control means comprises diode means.

9. An integrated circuit according to claim 8 wherein the diode means comprises a diode-connected transistor having a control electrode, a first current electrode coupled to the fuse, and a second current electrode coupled to the voltage clamp means.

10. An integrated circuit according to claim 9 wherein the diode-connected transistor comprises a pnp bipolar transistor having its emitter as its first current electrode and having its control electrode connected to its collector.

11. An integrated circuit according to claim 1 wherein the voltage clamp means comprises at least one Zener diode.

12. An integrated circuit according to claim 11 wherein the voltage clamp means comprises a plurality of series-connected Zener diodes.

13. An integrated circuit according to claim 1 wherein the fuse means comprises a narrow cross-section conductor.

14. An integrated circuit according to claim 1 wherein the node is a voltage-supply connection node.

15. An integrated circuit according to claim 1 wherein the node is a voltage-sense connection node.

16. An integrated circuit according to claim 1 wherein the integrated circuit comprises an automobile alternator regulator.

17. An integrated circuit for use in an automotive environment, having a node for connection to an external vOltage, and comprising:

a pnp bypass transistor having a base electrode, an emitter electrode coupled to the external voltage node and a collector electrode for connection to a datum potential;

a resistor coupled between the external voltage node and the base electrode of the transistor;

at least one Zener diode coupled between the base electrode of the transistor and a node for connection to the datum potential for enabling the bypass transistor when the voltage at the node exceeds a predetermined value, whereby the voltage at the external voltage node is clamped to a voltage no greater than the predetermined value; and

a fuse connected between the external voltage node and the emitter electrode of the bypass transistor means so as to provide a subsequently identifiable cause of failure if the fuse becomes blown due to excess voltage while allowing subsequent operation of the integrated circuit if the clamp means fails but another part of the integrated circuit remains functional.

18. An integrated circuit for use in an automotive environment, having a node for connection to an external voltage, and comprising:

a pnp diode-connected transistor having an emitter electrode coupled to the external voltage node, and a base electrode and a collector electrode connected together;

at least one Zener diode coupled between a node for connection to a datum potential and the base and collector electrodes of the diode-connected transistor for conducting current from the external voltage node when the voltage at the external voltage node exceeds a predetermined value, whereby the voltage at the external voltage node is clamped to a voltage no greater than the predetermined value; and

a fuse connected between the external voltage node and the emitter electrode of the diode-connected transistor so as to provide a subsequently identifiable cause of failure if the fuse becomes blown due to excess voltage while allowing subsequent operation of the integrated circuit if the clamp means fails but another part of the integrated circuit remains functional.