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Timed dielectrometry surveillance method and apparatus

  • US 4,975,968 A
  • Filed: 10/27/1989
  • Issued: 12/04/1990
  • Est. Priority Date: 10/27/1989
  • Status: Expired due to Term
First Claim
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1. For detecting characteristics of material moving through an interrogation region, surveillance apparatus comprising:

  • a dielectrometry monitor that defines a generally planar interrogation region and in real time views said interrogation region and material moving therethrough generally normal to the plane of the interrogation region, andmeans synchronized with such movement of the material through the interrogation region and operatively connected with said monitor for producing a three-dimensional material profile in real time of changing dielectric conditions within said interrogation region.

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