Ambient light rejecting quad photodiode sensor

• US 4,982,081 A
• Filed: 09/01/1989
• Issued: 01/01/1991
• Est. Priority Date: 09/01/1989
• Status: Expired due to Fees

• Current Assignee: Christie Digital Systems Incorporated (Ushio Incorporated)
• Original Assignee: Electrohome Limited
• Inventors: Schmidt, Terrence C.
• Primary Examiner(s): Nelms, David C.
• Application Number:
  US07/401,961
• Time in Patent Office: 487 Days
• Field of Search: 250/208.2, 250/214 C, 250/210, 250/238, 250/349, 250/214 B, 358/213.16, 374/130, 374/124, 374/178
• US Class Current: 250/208.2
• CPC Class Codes: H04N 9/28 Arrangements for convergence or focusing

Abstract

An ambient light rejecting quad photodiode sensor having compensation diodes connected with reverse polarity to respective quadrant photodiodes within the sensor, the compensation diodes being located outside of the area of illumination. By direct connection of compensation diodes in reverse polarity to each quadrant of the quad photodiodes, a large boost in signal to noise ratio is achieved for eliminating the effects of ambient room light as well as sensor dark current.

Claims

1. A photodiode array for detecting a projected image in the presence of ambient light, comprising at least three image sensing photodiodes connected in parallel with like polarity and arranged at right angles, and at least three further photodiodes connected in parallel with and with reverse polarity to respective ones of said image sensing photodiodes for compensating the effects of said ambient light on said image sensing diodes.

2. A photodiode array as defined in claim 1, comprising four said image sensing photodiodes arranged in a quadrant and four said further photodiodes disposed at respective corners of said quadrant.

3. The photodiode array of claim 1, wherein said further photodiodes are substantially electrically matched with said image sensing photodiodes.

4. The photodiode array of claim 1, wherein under uniform illumination photocurrent within said image sensing photodiodes is equal to the photocurrent within said further photodiodes within +/-10%.

5. The photodiode array of claim 1, wherein each of said image sensing and further photodiodes has an active area of approximately 0.8×

0.8mm with a metalization separation of 0.1 mm.

6. The photodiode array of claim 2, wherein said respective ones of said further photodiodes are located within 0.15 mm of said respective corners.

7. A circuit for detecting mis-registration of a projected image in a video system, comprising:

(a) a photodiode sensor divided into four quadrants adapted to be illuminated by said projected image and in response generating four photovoltaic potentials corresponding to respective portions of said projected image incident on respective quadrants of said sensor;

(b) each said quadrant of said sensor having a compensation photodiode connected with reverse polarity thereto for cancelling the effects of ambient light on said quadrant;

(c) means for converting said four photovoltaic potentials to respective digital values; and

(d) means for detecting inequality of said digital values and in response indicating detection of mis-registration of said projected image.

8. The circuit of claim 7, wherein said photodiode sensor comprises four image sensing photodiodes connected in parallel with like polarity.

9. The circuit of claim 8, wherein each said compensation photodiode is connected at respective corner of said quadrant in parallel with and with reverse polarity to a respective one of said image sensing photodiodes.

10. The circuit of claim 8, wherein each said compensation photodiode is substantially electrically matched with a corresponding one of said image sensing photodiodes.

11. The circuit of claim 8, wherein under uniform illumination photocurrent within said image sensing photodiodes is equal to the photocurrent within said compensation photodiodes within +/-10%.

12. The circuit of claim 8, wherein each of said image sensing photodiodes and corresponding compensation photodiode has an active area of approximately 0.8×

0.8mm with a metalization separation of 0.1 mm.

13. The circuit of claim 8, wherein said each said compensation photodiode is located within 0.15 mm of said respective corner.