Method and apparatus for magnetic detection of flaws

• US 4,982,158 A
• Filed: 06/23/1988
• Issued: 01/01/1991
• Est. Priority Date: 06/23/1988
• Status: Expired due to Fees

• Current Assignee: Electric Power Research Institute Incorporated Palo Alto CA
• Original Assignee: Electric Power Research Institute Incorporated
• Inventors: Nakata, Roy, Rabinowitz, Mario, Nottingham, Lawrence D.
• Primary Examiner(s): Eisenzopf, Reinhard J.
• Assistant Examiner(s): EDMONDS, WARREN
• Application Number:
  US07/211,337
• Time in Patent Office: 922 Days
• Field of Search: 324/248, 324/263, 324/232-243, 505/845, 505/846, 505/843, 505/700, 505/702, 505/704, 505/705, 505/706, 505/1
• US Class Current: 505/162
• CPC Class Codes: G01N 27/82 for investigating the presence of flaws
• CPC Class Codes: G01R 33/10 Plotting field distribution ; Measuring field distribution

Abstract

An array of SQUID detectors to map the magnetic field associated with test currents flowing in the component to be tested. The SQUID is an ultrasensitive, miniature device that transduces a faint magnetic field to a measurable voltage. Perturbation occurs in the test currents and the associated magnetic field at physical defects or inhomogeneities. Multi-dimensional test currents are injected into the component being tested; the injection being made between specific electrodes by varying the direction of the current until it is normal to the direction of the defect to maximize and amplify the effect of the perturbation. The perturbation is detected by the SQUID grid which pinpoints the location, orientation, and size of the defect. The frequency of the injected current can be made to sweep the spectrum from DC to the highest response limit of the SQUID to scan for defects at various depths. As the frequency increases, "skin effect" decreases the depth of the test current permitting multi-dimensional profiles of the defect to be imaged. Computer processing permits high resolution images of inhomogeneities to be produced.

Claims

1. A system for detecting structural inhomogeneities in a component to be tested, comprising in combination:

(a) means for selectively establishing at least one multi-dimensional test current in said component to produce a magnetic field detectable adjacent to the surface of said component;

(b) means for selectively and sequentially changing at least one parameter of said multi-dimensional test current, said at least one parameter being selected from a list which includes,

(1) the frequency of said multi-dimensional test current;

(2) the amplitude of said multi-dimensional test current;

(3) the orientation of said multi-dimensional test current with respect to said component;

(c) means for detecting the magnitude of said magnetic field at a plurality of locations adjacent to said surface of said component to form a selected number of data arrays having a predetermined relationship to the electrical conductivity characteristics of said component; and

(d) means for analyzing said data arrays to determine if said component includes structural inhomogeneities.

2. A system for detecting structural inhomogeneities in a component in accordance with claim 1 wherein said means for establishing said at least one multi-dimensional test current includes a plurality of test current injection contacts which may be selected and used in pairs to selectively inject multi-dimensional test currents into said component with each multi-dimensional test current injected utilizing different pairs of said test current injection contacts and flowing along selected and different paths.

3. A system in accordance with claim 2 wherein the major current paths associated with at least first and second pairs of said test current injection contacts intersect at a selected angle.

4. A system in accordance with claim 3 wherein said selected angle is in the order of 90 degrees.

5. A system in accordance with claim 1 wherein selected ones of said multi-dimensional test currents have different characteristics permitting the magnetic fields associated therewith to be distinguished from each other.

6. A system in accordance with claim 5 wherein said different characteristics are selected to permit information related to the depth of said inhomogeneity to be obtained.

7. A system in accordance with claim 1 wherein said means for detecting said magnetic field includes a predetermined number of individual SQUID detectors.

8. A system in accordance with claim 7 wherein said predetermined number of SQUID detectors comprises a plurality of SQUID detectors arranged in an array of a predetermined pattern.

9. A system in accordance with claim 8 wherein said array of SQUID detectors are arranged and mounted in the form of a flexible blanket which may be shaped to substantially conform to a first surface of said component.

10. A system in accordance with claim 9 wherein said means for analyzing each of said plurality of data arrays includes means for forming a map of the intensity contour of the magnetic field resulting from said test currents along said at least one surface of said component.

11. A system in accordance with claim 10 wherein said means for analyzing each of said plurality of data bases includes means for analyzing said maps to identify portions having abnormal characteristics.

12. A system in accordance with claim 11 further including micro-refrigeration means for cooling members of said SQUID array.

13. A system in accordance with claim 11 wherein means for analyzing each of said plurality of data bases includes means for analyzing said maps to identify abnormal flow patterns in said multi-dimensional test currents.

14. A system in accordance with claim 13 wherein inhomogeneities in said component are located by identifying changes in the flow pattern of said multi-dimensional test currents which are the result of said inhomogeneities.

15. A system for detecting inhomogeneities in a component, comprising in combination:

(a) means utilizing at least one multi-dimensional test current to establish a magnetic field having a selected magnitude and a selected orientation in said component;

(b) means for selectively changing said selected orientation;

(c) means for detecting the magnetic field in a plane having a predetermined relationship to a surface of said component to produce a data array; and

(d) means for analyzing each of said data arrays to determine the location and characteristics of said inhomogeneity.

16. A system for detecting inhomogeneities in a component comprising in combination;

(a) means for injecting at least one multi-dimensional test current into said component, said multi-dimensional test current having parameters including frequency, amplitude and orientation with respect to said component which may be selectively and sequentially varied;

(b) means for selectively and sequentially varying said parameters;

(c) means for detecting the magnetic field associated with said multi-dimensional test current comprising two or more arrays of SQUID detectors with members of said arrays off-set such that the responsive area of selected members of said arrays partially overlap to produce at least first and second data bases; and

(d) means for analyzing said data bases to produce a magnetic map having a resolution higher than similar maps produced using a reduced number of data bases.

17. A system for producing a multi-dimensional image of inhomogeneities in a component, comprising in combination:

(a) means for establishing a sequential plurality of multi-dimensional test currents in the component to be tested, each of said plurality of multi-dimensional test currents having parameters which may be selectively changed;

(b) means for selectively varying said parameters;

(c) means for producing a multi-dimensional map of the magnetic fields associated with said multi-dimensional test currents; and

(d) means for analyzing said multi-dimensional maps to produce a multi-dimensional image of said inhomogeneities.

18. A system for detecting inhomogeneities in a rotating component, comprising in combination:

(a) means for establishing a predetermined pattern of multi-dimensional test currents in said rotating component, said multi-dimensional test currents having parameters including frequency, orientation and amplitude which can be selectively and sequentially varied;

(b) means positioned at a fixed location relative to said rotating component to detect magnetic fields related to said multi-dimensional test currents to form a data array;

(c) means for analyzing said data array to detect any inhomogeneities in said rotating component.

19. A system in accordance with claim 18 wherein said means to detect magnetic fields includes an array of micro-refrigeration cooled SQUID detectors.

20. A system in accordance with claim 19 wherein said SQUID detectors are designed to operate at a temperature above 20K.

21. A system for detecting structural inhomogeneities in a component in accordance with claim 20 wherein said multi-dimensional test currents are injected utilizing a plurality of current injection contacts which are selected in at least pairs with selected ones of said multi-dimensional test currents flowing along different paths.

22. A system in accordance with claim 21 wherein the major test current paths associated with at least first and second pairs of said multi-dimensional test current injection contacts are selected to intersect at a selected angle.

23. A system in accordance with claim 22 wherein said selected angle is selected to be in the order of 90 degrees.

24. A system in accordance with claim 23 wherein the characteristics of selected ones of said multi-dimensional test currents are selected to permit the magnetic fields associated therewith to be distinguished from each other.

25. A system in accordance with claim 24 wherein said different characteristics are selected to permit information related to the depth of said inhomogeneities to be obtained.

26. A method for detecting inhomogeneities in a component, comprising the steps of:

(a) producing at least one multi-dimensional test current having selectively variable parameters in said component to establish a magnetic field having a selected magnitude and a selected orientation in said component;

(b) detecting said magnetic field in a plane having a predetermined relationship to a surface of said component to produce a data array; and

(c) analyzing each of said data array to determine the location, depth and characteristics of said inhomogeneities.

27. A method for detecting structural inhomogeneities in a component to be tested, comprising the steps of:

(a) selectively establishing at least one multi-dimensional test current having selectively variable parameters in said component to produce a magnetic field detectable adjacent to the surface of said component;

(b) detecting the magnitude of said magnetic field at a plurality of locations adjacent to a surface of said component to form a selected number of data arrays having a predetermined relationship to the electrical conductivity characteristics of said component; and

(c) analyzing said data arrays to determine if said component includes structural inhomogeneities.

28. A method in accordance with claim 27 further including the step of positioning a plurality of SQUID detectors at predetermined locations adjacent said surface of said component to detect said magnetic field.

29. A method in accordance with claim 28 further including the step of arranging said SQUID detectors in an array having a predetermined pattern.

30. A method in accordance with claim 29 further including the step of mounting said SQUID detectors on a flexible blanket which may be shaped to substantially conform to a first surface of said component.

31. A method in accordance with claim 30 further including the step of further analyzing said data array to produce a map of the intensity contour of the magnetic field resulting from said multi-dimensional test currents along said at least one surface of said component.

32. A method in accordance with claim 31 further including the step of selectively analyzing said maps and identifying portions corresponding to said inhomogeneities.

33. A method in accordance with claim 32 further including the step of analyzing said magnetic maps to identify locations corresponding to abnormal multi-dimensional test currents flow patterns.

34. A method in accordance with claim 33 further including the step of identifying changes in the flow pattern of said multi-dimensional test currents which are the result of said inhomogeneities.

35. A method in accordance with claim 32 further including the step of utilizing micro-refrigeration means for cooling members of said SQUID array.

36. A method for detecting inhomogeneities in a component, comprising in combination:

(a) producing at least one multi-dimensional test current having selectively variable parameters in said component;

(b) detecting the magnetic field produced by said multi-dimensional test current utilizing two or more arrays of SQUID detectors with members of said arrays off-set such that the action response of selected members of said arrays partially overlap to produce first and second data basis; and

(c) analyzing said data bases to produce a magnetic map having a resolution higher than similar maps produced using a reduced number of data bases.

37. A method for producing a multi-dimensional image of inhomogeneities in a component, comprising in combination:

(a) producing at least one multi-dimensional test current having selectively and sequentially variable parameters in the component to be tested;

(b) detecting the magnetic fields associated with said at least one multi-dimensional test current to produce a multi-dimensional map of the magnetic fields; and

(c) analyzing said multi-dimensional maps to produce a multi-dimensional image of said inhomogeneities.

38. A method for detecting inhomogeneities in a rotating component, comprising the steps of:

(a) establishing a predetermined pattern of at least one multi-dimensional test current having selectively and sequentially variable parameters in said rotating component;

(b) detecting the magnetic fields produced by said one or more multi-dimensional test currents at a selected fixed location to produce a data array; and

(c) analyzing said data array to detect any inhomogeneities in said rotating component.

39. A method in accordance with claim 38 wherein said means to detect magnetic fields includes an array of micro-refrigeration cooled SQUID detectors.

40. A method in accordance with claim 38 including the further steps of:

(a) processing said at least first and second data bases to produce first and second magnetic maps;

(b) processing said first and second magnetic maps to identify regions of maximum and minimum magnetic field intensity; and

(c) correlating said signals of maximum and minimum magnetic field intensity to identify flaws in said component being tested.

41. A method in accordance with claim 38 wherein said component is a retaining ring.

42. A method in accordance with claim 41 wherein said surface is an interior surface of said retaining ring.

43. A method in accordance with claim 42 wherein said multi-dimensional test current is pulsed.

44. A method in accordance with claim 38 wherein said rotating electrical machine is an electric current generator.

45. A method in accordance with claim 38 wherein said rotating machine is an electric motor.

46. A method in accordance with claim 38 wherein said surface is an interior surface.

47. A method of testing at least one component forming a part of rotating electrical machines, comprising the steps of:

(a) establishing at least a plurality of multi-dimensional test current in said component, a first one of said multi-dimensional test currents having a first orientation with respect to the axis of rotation of said retaining ring, a second one of said multi-dimensional test currents having a second orientation with respect to the axis of rotation of said retaining ring, said first orientation differing from said second orientation;

(b) utilizing a plurality of sensors positioned adjacent a surface of said component to produce at least first and second data bases, said first and second data base respectively having first and second predetermined relationships to the flow pattern of said first and second positions of said multi-dimensional test currents;

(c) processing said first and second data bases to produce data having a predetermined relationship to the integrity of said retaining ring.