Method of measuring the period of surface defects

• US 4,982,600 A
• Filed: 09/11/1989
• Issued: 01/08/1991
• Est. Priority Date: 09/09/1988
• Status: Expired due to Term

• Current Assignee: Fujifilm Corporation (Fujifilm Holdings Corporation)
• Original Assignee: Fuji Photo Film Co Limited (Fujifilm Holdings Corporation)
• Inventors: Masuda, Takanori, Kiso, Takeshi
• Primary Examiner(s): Noland, Tom
• Application Number:
  US07/405,215
• Time in Patent Office: 484 Days
• Field of Search: 73/104, 73/105, 73/159
• US Class Current: 73/104
• CPC Class Codes: G01N 2021/8858 Flaw counting
• CPC Class Codes: G01N 2021/8912 Processing using lane subdivision
• CPC Class Codes: G01N 21/8922 Periodic flaws

Abstract

To measure the period with which a surface defect recurs in a surface of a web-like material moving in its lengthwise direction, surface defects distributed over the surface are detected in that lengthwise direction. Positional data and distance data as to the detected surface defects relative to one another are collected for a predetermined length of the web-like material. The web-like material is determined to have a periodic surface defect appearing with a period between predetermined maximum and minimum periods when the distance data include a distance equivalent to an elemental period that is a whole-number multiple of a fundamental period.

Claims

1. A method of measuring the period with which a defect in a surface of a web moving in a lengthwise direction thereof recurs, said method comprising the steps of:

moving a web relative to a scanning device to collect data on the positions of a plurality of said defects for a predetermined length of said web;

obtaining data on the distances of said plurality of defects from each other, and

indicating that said web has a periodic defect recurring with a period between predetermined maximum and minimum periods when said distance data include a distance equivalent to an elemental period which is a whole-number multiple of a fundamental period.

2. A method as defined in claim 1, wherein said collection of positional data is effected every time said web moves said predetermined length and said positional data as to each said defect are expressed as a whole-number multiple of said predetermined length.

3. A method as defined in claim 2, wherein said measuring of the period of recurrence of a defect is effected for a plurality of lengthwise lanes having a predetermined width into which a surface of said web is divided.