Transient spectroscopic method and apparatus for in-process analysis of molten metal

• US 4,986,658 A
• Filed: 04/21/1989
• Issued: 01/22/1991
• Est. Priority Date: 04/21/1989
• Status: Expired due to Fees

• Current Assignee: Lehigh University
• Original Assignee: Lehigh University
• Inventors: Kim, Yong W.
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US07/341,748
• Time in Patent Office: 641 Days
• Field of Search: 356/313, 356/317, 356/318
• US Class Current: 356/318
• CPC Class Codes: G01J 2003/1828 with order sorter or prefilter
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0208 using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/0286 Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
• CPC Class Codes: G01J 3/04 Slit arrangements slit adjustment
• CPC Class Codes: G01J 3/1809 Echelle gratings
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/2889 Rapid scan spectrometers; Time resolved spectrometry
• CPC Class Codes: G01N 2021/695 Molten metals
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma

Abstract

A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

Claims

1. A method for spectroscopic analysis of a molten metal, comprising:

providing a probe including a casing having an open end adapted to be immersed in the molten metal, laser means disposed in said casing for irradiating the surface of the molten metal adjacent the open end with a laser beam of predetermined energy density and focal spot size, and spectroscopic detector means disposed in said casing for detecting spectral components of light emitted from a plasma produced by the laser means;

immersing the open end of the casing into the molten metal;

irradiating the molten metal with a laser beam from said laser means to produce a plasma representative of the composition of the molten metal, said irradiating being performed during immersion of the casing open end into the molten metal; and

detecting spectral components of radiation emitted by the plasma by means of the spectroscopic detector means in the casing and producing signals corresponding to the detected spectral components.

2. The method according to claim 1, wherein:

said irradiating step comprises irradiating said molten metal with a pulsed laser beam; and

said detecting step comprises detecting spectral line reversals in radiation emitted by said plasma during a predetermined first time window shortly after said pulsed laser beam reaches peak power and prior to said plasma reaching thermal equilibrium.

3. The method according to claim 1, wherein said detecting step comprises:

detecting spectral components in the radiation emitted by said plasma during a predetermined time window in an afterglow period during which said plasma is in thermal equilibrium.

4. The method according to claim 2, wherein said detecting step comprises:

detecting spectral components in the radiation emitted by said plasma during a predetermined second time window in an afterglow period during which said plasma is in thermal equilibrium.

5. The method according to claims 1, 2, 3 or 4, wherein said irradiating step comprises:

irradiating said molten metal with a pulsed laser beam having substantially triangular waveshape with a rise time of 50 ±

20 nsec, a time duration of 50-100 nsec at the halfwidth, a power density greater than 10⁹ W/cm², and a focal spot size of 1-4 mm² on the surface of the molten metal.

6. The method according to claim 2, wherein said first time window has a time duration of 5-50 nsec and begins 50-500 nsec after the pulsed laser beam reaches peak power.

7. The method according to claims 3, wherein said predetermined time window has a time duration of 20-500 nsec and begins between 250 nsec and 5 μ

sec after initiation of said irradiating step.

8. The method according to claim 4, wherein said first time window has a time duration of 5-50 nsec and begins 50-500 nsec after the pulsed laser beam reaches peak power.

9. The method according to claim 8, wherein said second time window has a time duration of 20-500 nsec and begins between 250 nsec and 5 μ

sec after initiation of said irradiating step.

10. The method according to claims 1, 2, 3 or 4, comprising:

said providing step comprising providing rangefinder means disposed in said casing for detecting the distance between the surface of the molten metal and a focusing lens of said laser means;

introducing an inert gas under pressure into a space between the focusing lens and the surface of the molten metal;

detecting the distance between the surface of the molten metal and the focusing lens using said rangefinding means; and

controlling the pressure of the inert gas introduced into said space based on the detected distance between the surface of the molten metal and the focusing lens so that said distance between the surface of the molten metal and the focusing lens is maintained at a predetermined distance.

11. The method according to claim 10, comprising:

performing said irradiating step only when the surface of said molten metal is detected to be at said predetermined distance from said focusing lens.

12. The method according to claim 9, comprising:

said providing step comprising providing rangefinder means disposed in said casing for detecting the distance between the surface of the molten metal and a focusing lens of said laser means;

introducing an inert gas under pressure into a space between the focusing lens and the surface of the molten metal;

detecting the distance between the surface of the molten metal and the focusing lens using said rangefinding means; and

controlling the pressure of the inert gas introduced into said space based on the detected distance between the surface of the molten metal and the focusing lens so that said distance between the surface of the molten metal and the focusing lens is maintained at a predetermined distance.

13. The method according to claim 12, comprising:

performing said irradiating step only when the surface of said molten metal is detected to be at said predetermined distance from said focusing lens.

14. The method according to claim 11, wherein said step of detecting spectral components is performed in relation to a predetermined region of the plasma at a first predetermined distance of the surface of the molten metal and a second predetermined distance away from the optical axis of said laser means.

15. The method according to claim 14, wherein said first predetermined distance is 1.5 ±

0.5 mm and said second predetermined distance is 2.0 ±

0.5 mm.

16. The method according to claims 1, 2, 3 or 4 comprising:

detecting, based on the spectral components detected in said detecting step, peaks in the spectrum represented by the detected spectral components;

fitting a predetermined function to each detected peak;

forming a synthesized composite spectrum based on the fitted step;

comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween; and

determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the constituent emission lines of the elements in the molten metal, and if not, modifying the functional fit to each detected peak and iteratively repeating said fitting, comparing and determining steps until said error signal is within said predetermined limits.

17. The method according to claim 9, comprising:

detecting, based on the spectral components detected in said detecting step, peaks in the spectrum represented by the detected spectral components;

fitting a predetermined function to each detected peak;

forming a synthesized composite spectrum based on the fitted step;

comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween; and

determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the constituent emission lines of the elements in the molten metal, and if not, modifying the functional fit to each detected peak and iteratively repeating said fitting, comparing and determining steps until said error signal is within said predetermined limits.

18. The method according to claims 16, comprising:

detecting, based on the spectral components detected in said detecting step, peaks in the spectrum represented by the detected spectral components;

fitting a predetermined function to each detected peak;

forming a synthesized composite spectrum based on the fitted step;

comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween; and

determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the constituent emission lines of the elements in the molten metal, and if not, modifying the functional fit to each detected peak and iteratively repeating said fitting, comparing and determining steps until said error signal is within said predetermined limits.

19. The method according to claim 1, wherein said irradiating step comprises:

irradiating the surface of the molten metal with a pulsed laser beam having a waveshape, time duration, focal spot size and energy density selected such that the evaporation of said molten metal into said plasma substantially coincides with a thermal diffusion front produced by said laser beam in the molten metal.

20. The method according to claim 5, wherein said irradiating step comprises:

irradiating the surface of the molten metal with a pulsed laser beam having a waveshape, time duration, focal spot size and energy density selected such that the evaporation of said molten metal into said plasma substantially coincides with a thermal diffusion front produced by said laser beam in the molten metal.

21. The method according to claim 1, wherein said casing comprises a protective shell housing said laser means and said spectroscopic detector means, and a refractory sheath fitted to said protective shell and defining said open end of said casing, said method further comprising:

said immersing step comprising immersing only said refractory sheath into the molten metal; and

cooling said protective shell during immersing of said refractory sheath in the molten metal.

22. An apparatus for spectroscopic analysis of a molten metal, comprising:

a probe comprising a casing having an open end adapted to be immersed in the molten metal;

laser means disposed in said casing for irradiating the surface of the molten metal adjacent to the open end of the casing with a laser beam so as to produce a plasma having a composition representative of the composition of the molten metal; and

spectroscopic detecting means disposed in said casing and optically coupled to the plasma for detecting spectral components of radiation emitted by the plasma and producing signals corresponding to the detected spectral components.

23. The apparatus according to claim 22, wherein:

said laser means comprises a Q-switched laser which generates a pulsed laser beam; and

said spectroscopic detecting means comprises first means for detecting spectral line reversals in radiation emitted by said plasma during a predetermined first time window shortly after said pulsed laser beam reaches peak power and prior to said plasma reaching thermal equilibrium.

24. The apparatus according to claim 22, wherein said spectroscopic detector means comprises:

means for detecting spectral components in the radiation emitted by said plasma during a predetermined time window in an afterglow period during which said plasma is in thermal equilibrium.

25. The apparatus according to claim 23, wherein said spectroscopic detecting means comprises:

second means for detecting spectral components in the radiation emitted by said plasma during a predetermined second time window in an afterglow period during which said plasma means is in thermal equilibrium; and

said first and second means detecting spectral components in said first and second time windows, respectively, for each pulsed laser beam generated by said laser.

26. The apparatus according to claims 22 or 23, wherein said laser means comprises:

a Q-switched laser and a focusing lens which in combination produces at the surface of said molten metal a pulsed laser beam having substantially triangular waveshape with a rise time of 50 ±

20 nsec, a time duration of 50-100 nsec at the halfwidth, a power density greater than 10⁹ W/cm², and a focal spot size of 1-4 mm² on the surface of the molten metal.

27. The apparatus according to claims 23 or 25, wherein said laser means comprises:

a focusing lens which in combination with said Q-switched laser produces at the surface of the molten metal said molten metal a pulsed laser beam having substantially triangular waveshape with a rise time of 50 ±

20 nsec, a time duration of 50-100 nsec at the halfwidth, a power density greater than 10⁹ W/cm², and a focal spot size of 1-3 mm on the surface of the molten metal.

28. The apparatus according to claim 23, wherein said first time window has a time duration of 5-50 nsec and begins 50-500 nsec after the pulsed laser beam reaches peak power.

29. The apparatus according to claim 24, wherein said predetermined time window has a time duration of 20-500 nsec and begins between 250 nsec and 5 μ

sec after initiation of said irradiating step.

30. The apparatus according to claim 25, wherein said first time window has a time duration of 5-50 nsec and begins 50-500 nsec after the pulsed laser beam reaches peak power.

31. The apparatus according to claim 30, wherein said second time window has a time duration of 20-500 nsec and begins between 250 nsec and 5 μ

sec after initiation of said irradiating step.

32. The apparatus according to claims 22 or 24, further comprising:

means introducing an inert gas under pressure into a space between a focusing lens of the laser means and the surface of the molten metal;

rangefinder means disposed in the casing for detecting the distance between the surface of the molten metal and the focusing lens; and

means for controlling the pressure of the inert gas introduced into said space based on the detected distance between the surface of the molten metal and the focusing lens so that said distance between the surface of the molten metal and the focusing lens is maintained at a predetermined distance.

33. The apparatus according to claim 32, comprising:

means for actuating said laser means only when the surface of said molten metal is detected by said rangefinder means to be at said predetermined distance from said focusing lens.

34. The apparatus according to claim 31, further comprising:

means for introducing an inert gas under pressure into a space between a focusing lens of the laser means and the surface of the molten metal;

rangefinder means disposed in the casing for detecting the distance between the surface of the molten metal and the focusing lens; and

means for controlling the pressure of the inert gas introduced into said space based on the detected distance between the surface of the molten metal and the focusing lens so that said distance between the surface of the molten metal and the focusing lens is maintained at a predetermined distance.

35. The method according to claim 34, comprising:

means for activating said laser means only when the surface of said molten metal is detected to be at said predetermined distance from said focusing lens.

36. The apparatus according to claim 34, wherein said spectroscopic detecting means comprises:

a spectrograph; and

focusing means for focusing light applied to said spectrograph and produced in a predetermined region of the plasma at a first predetermined distance from the surface of the molten metal and a second predetermined distance away from the optical axis of said laser means.

37. The apparatus according to claim 36, wherein said first predetermined distance is 1.5 ±

0.5 mm and said second predetermined distance is 2.0 ±

0.5 mm.

38. The apparatus according to claims 22 or 24, comprising:

processing means for processing the signals produced by said spectrograph detecting means by performing the following functions,

means for detecting, based on the spectral components detected by said spectroscopic detecting means, peaks in the spectrum represented by the detected spectral components,

means for fitting a predetermined function to each detected peak,

means for forming a synthesized composite spectrum based on the fitted function,

means for comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween, and

means for determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the emission lines of the constituent elements in the molten metal, and if not, modifying the functional fit to each detected peak and alternatively repeating said fitting, comparing and determining functions until said error signal is within said predetermined limits.

39. The apparatus according to claims 23 or 25, further comprising:

processing means for processing the signals produced by said spectrograph detecting means by performing the following functions,

means for detecting, based on the spectral components detected said spectroscopic detecting means, peaks in the spectrum represented by the detected spectral components,

means for fitting a predetermined function to each detected peak,

means for forming a synthesized composite spectrum based on the fitted function,

means for comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween, and

means for determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the emission lines of the constituent elements in the molten metal, and if not, modifying the functional fit to each detected peak and alternatively repeating said fitting, comparing and determining functions until said error signal is within said predetermined limits.

40. The apparatus according to claim 31, further comprising:

processing means for processing the signals produced by said spectrograph detecting means by performing the following functions,

means for detecting, based on the spectral components detected in said spectroscopic detecting means, peaks in the spectrum represented by the detected spectral components,

means for fitting a predetermined function to each detected peak,

means for forming a synthesized composite spectrum based on the fitted function,

means for comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween, and

means for determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the emission lines of the constituent elements in the molten metal, and if not, modifying the functional fit to each detected peak and alternatively repeating said fitting, comparing and determining functions until said error signal is within said predetermined limits.

41. The apparatus according to claim 34, further comprising:

processing means for processing the signals produced by said spectrograph detecting means by performing the following functions,

means for detecting, based on the spectral components detected in said spectroscopic detecting means, peaks in the spectrum represented by the detected spectral components,

means for fitting a predetermined function to each detected peak,

means for forming a synthesized composite spectrum based on the fitted function,

means for comparing the synthesized composite spectrum with the spectrum represented by the detected spectral components and producing an error signal based on the difference therebetween, and

means for determining whether the error signal is within predetermined limits, and if so, outputting the synthesized composite spectrum as representative of the emission lines of the constituent elements in of the molten metal, and if not, modifying the functional fit to each detected peak and alternatively repeating said fitting, comparing and determining functions until said error signal is within said predetermined limits.

42. The apparatus according to claim 22, wherein said laser means comprises:

a Q-switched laser and a focusing lens which in combination produce at the surface of the molten metal a pulsed laser beam having a waveshape, time duration, focal spot size and energy density selected such that the evaporation of said molten metal into said plasma substantially coincides with a thermal diffusion front produced by said laser beam in the molten metal.

43. The apparatus according to claim 41, wherein said laser means comprises:

a Q-switched laser and a focusing lens which in combination produce at the surface of the molten metal a pulsed laser beam having a waveshape, time duration, focal spot size and energy density selected such that the evaporation of said molten metal into said plasma substantially coincides with a thermal diffusion front produced by said laser beam in the molten metal.

44. The apparatus according to claims 22 or 24, wherein said spectroscopic detecting means comprises:

means for separating radiation emitted from said plasma into plural spectral components;

a gated array of photodetecting pixel elements optically coupled to said radiation separating means to detect the presence of predetermined spectral components; and

selection means, including plural segmented mirrors, for selectively reflecting selected of said spatially separated spectral components to selected of said pixel- elements.

45. The apparatus according to claims 23 or 25, wherein said spectroscopic detecting means comprises:

means for separating radiation emitted from said plasma into plural spectral components;

a gated array of photodetecting pixel elements optically coupled to said radiation separating means to detect the presence of predetermined spectral components; and

selection means, including plural segmented mirrors, for selectively reflecting selected of said spatially separated spectral components to selected of said pixel, elements.

46. The apparatus according to claim 31, wherein said spectroscopic detecting means comprises:

means for separating radiation emitted from said plasma into plural spectral components;

a gated array of photodetecting pixel elements optically coupled to said radiation separation means to detect the presence of predetermined spectral components; and

selection means, including plural segmented mirrors, for selectively reflecting selected of said spatially separated spectral components to selected of said pixel elements.

47. The apparatus according to claim 41, wherein said spectroscopic detecting means comprises:

means for separating radiation emitted from said plasma into plural spectral components;

a gated array of photodetecting pixel elements optically coupled to said radiation separation means to detect the presence of predetermined spectral components; and

selection means, including plural segmented mirrors, for selectively reflecting selected of said spatially separated spectral components to selected of said pixel elements.

48. The apparatus according to claim 44, further comprising:

folded optics means, provided between said radiation separating means and said selection means, including plural mirrors, for reflecting the spectral components separated by said separating means plural times thereby to increase the distance travelled by said spectral components and the spatial separation thereof.

49. The apparatus according to claim 45, further comprising:

folded optics means, provided between said radiation separating means and said selection means, including plural mirrors, for reflecting the spectral components separated by said separating means plural times thereby to increase the distance travelled by said spectral components and the spatial separation thereof.

50. The apparatus according to claim 47, further comprising:

folded optics means, provided between said radiation separating means and said selection means, including plural mirrors, for reflecting the spectral components separated by said separating means plural times thereby to increase the distance travelled by said spectral components and the spatial separation thereof.

51. The apparatus according to claim 47 further comprising:

folded optics means, provided between said radiation separating means and said selection means, including plural mirrors, for reflecting the spectral components separated by said separating means plural times thereby to increase the distance travelled by said spectral components and the spatial separation thereof.

52. The apparatus according to claim 22, further comprising:

said casing comprising a protective shell housing said laser means and said spectroscopic detecting means, and a refractory sheath fitted to said protective shell and defining said open end of said casing and adapted to be immersed in the molten metal; and

cooling means for cooling said protective shell during immersing of said refractory sheath in the molten metal.