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Materials inspection system using x-ray imaging

  • US 4,987,584 A
  • Filed: 04/03/1990
  • Issued: 01/22/1991
  • Est. Priority Date: 04/06/1989
  • Status: Expired due to Term
First Claim
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1. A materials inspection system comprising:

  • means for moving an article to be inspected through an x-ray beam;

    means for irradiating said article in said x-ray beam with x-ray radiation of two different energies;

    means for detecting x-rays attenuated by said article at said two different energies and for generating electrical signals corresponding thereto;

    first channel means for processing said electrical signals from said means for detecting for generating a luminance signal;

    second channel means for processing said electrical signals from said means for detecting for generating a materials information signal;

    means for generating and displaying an image of said article;

    means for controlling the color of said image based on said materials information signal; and

    means for controlling the image brightness, color saturation and white content of said image based on said luminance signal.

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