Method of measuring resistivity, and apparatus therefor

• US 4,989,154 A
• Filed: 06/22/1988
• Issued: 01/29/1991
• Est. Priority Date: 07/13/1987
• Status: Expired due to Term

• Current Assignee: Mitsubishi Petrochemical Co., Ltd. (Mitsubishi Chemical Group Corp.)
• Original Assignee: Mitsubishi Petrochemical Co., Ltd. (Mitsubishi Chemical Group Corp.)
• Inventors: Yamaguchi, Shoji, Kurihara, Hiroshi, Yamashita, Masato, Mori, Yasusuke, Hashizume, Nichio, Enjyouji, Hideo, Shimizu, Hideto
• Primary Examiner(s): Teska, Kevin J.
• Application Number:
  US07/209,988
• Time in Patent Office: 951 Days
• Field of Search: 324/62, 324/64, 324/73 R, 324/73 AT, 324/158 F, 324/158 R, 324/158 D, 324/65 P, 364/480, 364/481, 364/482, 364/488, 364/550, 364/551.01
• US Class Current: 702/65
• CPC Class Codes: G01R 27/14 Measuring resistance by measuring current or voltage obtained from a reference source G01R27/16, G01R27/20, G01R27/22 take precedence

Abstract

A method and apparatus for measuring resistivity employ the four-point probe method to measure the surface resistivity or volume resistivity of a sample. The method includes inputting sample shape information and calculating a resistance correction coefficient for the sample based on the shape information and information relating to a measurement position on the sample. The sample surface resistivity or volume resistivity is calculated by multiplying a resistance value, which is measured in accordance with the four-point probe method, by the correction coefficient.

Claims

1. Apparatus for measuring surface resistivity of a sample with a four-point probe, comprising:

a four-point probe having four electrodes to contact with said sample, two outer electrodes of said four electrodes to be contacted on said sample for passing a predetermined current (I) and two inner electrodes of said four electrodes for detecting a potential difference (V) produced by said current;

input means for inputting (i) shape information specifying whether said sample is rectangular or circular, (ii) information specifying dimensions and thickness (t) of said sample, and (iii) information indicating a measurement position of said four-point probe on said sample;

a ROM arranged for memorizing calculation procedures of first and second correction coefficients using each of a first equation which is ##EQU29## wherein each of the coordinates (x_A,y_A), (x_B,y_B), (x_C,y_C), (x_D,y_D) represents a position of a corresponding one of the four electrodes respectively (a,b are dimensions of a rectangular sample), and

a second equation which is ##EQU30## wherein ("a" is a radius of a circular sample, each of the coordinates (x_A,y_A), (x_B,y_B), (x_C,y_C), (x_D,y_D) represents a position of a corresponding one of the four electrodes respectively;

resistance calculating means for calculating a resistance value (V/I) from a predetermined value of a current (I) and a potential difference (V);

a processor arranged for selecting one of said calculation procedures according to said shape information, and for calculating either said first or said second correction coefficient for said sample based on said dimensions, said thickness and said measurement position using the selected calculation procedure, and for calculating surface resistivity of said sample using an equation (F×

V/I), wherein said F is said first or said second correction coefficient and V/I is said resistance value; and

output means for outputting said surface resistivity and said first or second correction coefficient as calculated by said processor.

2. The apparatus according to claim 1, further comprising:

supporting means for fixedly retaining said sample and for movably supporting said four point probe over said sample at a fixed angle of said four-point probe relative to said sample;

driving means for driving said supporting means to move said four point probe to said measurement position designated by said input means; and

means for contacting four electrodes of said four point probe to said sample when said probe has been moved to said measurement position by said driving means.

3. The apparatus according to claim 1, wherein said processor means further comprises:

calculating means for calculating volume resistivity of said sample using an equation (F×

t×

V/I).

4. The apparatus according to claim 1, wherein said four-point measurement probe comprises:

a base comprising an electrical insulator, one side of said base being formed to include a recess for accommodating therein said sample to be measured;

a holder one side of which has a projection thereon so as to fit into said recess of said base; and

four contact electrodes provided on said holder for contacting a surface of said sample in a state where said holder and said base are united by fitting said projection and said recess together.

5. The apparatus according to claim 4, wherein said four contact electrodes are mounted so as to be contactable with said projection, and are biased away from a surface of said projection toward said sample by biasing members.

6. A resistivity measurement apparatus for measuring surface resistivity of a rectangular sample by bringing four electrodes into contact with the rectangular sample, comprising:

a measurement probe having two energizing electrodes for passing a current (I) through said rectangular sample, and two voltage measuring electrodes for measuring a surface potential difference (V) of said rectangular sample produced by said current (I), said energizing electrodes and said voltage measuring electrodes being arranged in a generally square pattern;

input means for inputting size information specifying dimensions and thickness (t) of said rectangular sample, and measurement position information of said measurement probe on said sample;

a ROM arranged for memorizing calculation procedures of a correction coefficient (F_p) using the equation ##EQU31## a processor for calculating said correction coefficient (F_p) of said sample based on said size information and said measurement position using said equation, and for calculating a resistance value (V/I) using said current value (I) and said surface potential difference (V), and for calculating surface resistivity of said sample using an equation (F_p ×

V/I) and volume resistivity of said sample using an equation (F_p ×

t×

V/I); and

output means for outputting said surface resistivity and said volume resistivity as calculated by said processor.

7. The apparatus according to claim 6, further comprising:

supporting means for fixedly retaining said sample and for movably supporting said measurement probe over said sample at a fixed angle of said four-point probe relative to said sample;

driving means for driving said supporting means to move said measurement probe to said measurement position designated by said input means; and

means for contacting four electrodes of said measurement probe to said sample when said measurement probe has been moved to said measurement position by said driving means.